公开(公告)号：US20100182030A1

公开(公告)日：2010-07-22

申请号：US12699257

申请日：2010-02-03

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/06

CPC classification number: G01R1/06733 ,  G01R1/07357

Abstract: An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to deflect the probe vertically when contact is made. This increased ease of vertical deflection tends to reduce the horizontal contact force component responsible for the scrub motion, thereby decreasing scrub length. Here “thickness” is the probe thickness in the deflection plane of the probe (i.e., the plane in which the probe knee lies). The reduced thickness probe section provides increased design flexibility for controlling scrub motion, especially in combination with other probe parameters affecting the scrub motion.

Abstract translation: 提供了一种用于探测电气设备和电路的改进的膝部探针。 改进的膝关节探针具有减小的厚度部分，以在接触时改变探针的机械性能。 探头的厚度减小部分使接触时更容易使探针垂直偏转。 这种增加的垂直偏转的容易性倾向于减少负责擦洗运动的水平接触力分量，从而减少擦洗长度。 这里，“厚度”是探针的偏转平面中的探针厚度（即探针膝盖所在的平面）。 减小厚度的探针部分提供增加的设计灵活性，用于控制擦洗运动，特别是与影响擦洗运动的其它探头参数组合。

公开(公告)号：US20070132466A1

公开(公告)日：2007-06-14

申请号：US11302650

申请日：2005-12-14

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07357 ,  G01R1/07371

Abstract: Method and apparatus using a retention arrangement with a potting enclosure for holding a plurality of probes by their retention portions, the probes being of the type having contacting tips for establishing electrical contact with pads or bumps of a device under test (DUT) to perform an electrical test. The retention arrangement has a top plate with top openings for the probes, a bottom plate with bottom openings for the probes, the plates being preferably made of ceramic with laser-machined openings, and a potting enclosure between the plates for admitting a potting agent that upon curing pots the retaining portions of the probes. In some embodiments a spacer is positioned between the top and bottom plates for defining the potting enclosure. Alternatively, the retention arrangement has intermediate plates located in the potting enclosure and having probe guiding openings to guide the probes.

Abstract translation: 使用具有用于通过其保持部分保持多个探针的封装外壳的保持装置的方法和装置，所述探针具有用于与被测器件（DUT）的焊盘或凸块建立电接触的接触尖端，以执行 电气测试。 保持装置具有顶板，其具有用于探针的顶部开口，具有用于探针的底部开口的底板，该板优选地由具有激光加工孔的陶瓷制成，并且在该板之间的灌封封套用于容纳灌封剂， 在固化罐时，探针的保持部分。 在一些实施例中，间隔件定位在顶板和底板之间，用于限定灌封罩。 或者，保持装置具有位于灌封封壳中的中间板，并且具有用于引导探针的探针引导开口。

公开(公告)号：US08723546B2

公开(公告)日：2014-05-13

申请号：US12715896

申请日：2010-03-02

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/00 ,  G01R31/20 ,  G01R1/073 ,  G01R1/067

CPC classification number: G01R1/07314 ,  G01R1/0675 ,  G01R1/06755 ,  G01R1/07357

Abstract: The present invention is a set of layered probes that make electrical contact to a device under test. The layered probes are disposed within openings of at least one guide plate. The guide plate surrounds the probes via the openings. The layered probes have a base end, an opposing tip end and a shaft connecting the base end to the tip end. The base end can have a positioning device that extends away from the base end.

Abstract translation: 本发明是一组分层探针，其与待测器件电接触。 分层探针设置在至少一个引导板的开口内。 引导板通过开口围绕探针。 分层探针具有基端，相对的末端和将基端连接到尖端的轴。 基端可以具有远离基端延伸的定位装置。

公开(公告)号：US08324923B2

公开(公告)日：2012-12-04

申请号：US13118952

申请日：2011-05-31

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/26

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US20120286816A1

公开(公告)日：2012-11-15

申请号：US13424031

申请日：2012-03-19

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067 ,  B23K26/00

CPC classification number: G01R1/06716 ,  G01R1/06733 ,  G01R1/06738 ,  G01R1/06761 ,  G01R1/07357 ,  G01R3/00

Abstract: The present invention is a probe having a distal end made of one material, a tip and a portion disposed between the distal end and the tip that is a different second material. The probe is laser machined manufactured using a nanosecond or picosecond laser.

Abstract translation: 本发明是一种探头，其具有由一种材料制成的远端，尖端和设置在远端和尖端之间的不同第二材料的部分。 探头采用纳秒或皮秒激光器激光加工。

公开(公告)号：US08203353B2

公开(公告)日：2012-06-19

申请号：US12777827

申请日：2010-05-11

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067 ,  G01R31/20

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。

公开(公告)号：US20110273198A1

公开(公告)日：2011-11-10

申请号：US13108368

申请日：2011-05-16

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/20

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US20080252325A1

公开(公告)日：2008-10-16

申请号：US11786107

申请日：2007-04-10

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US07312617B2

公开(公告)日：2007-12-25

申请号：US11385289

申请日：2006-03-20

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07378 ,  G01R1/07357

Abstract: Method and apparatus for electrical testing of a device under test (DUT) that employs a connection board with signal contacts for applying test signals and a space transformer that has low pitch contacts arranged on one or more circumferential shelves that define an enclosure in the space transformer. The apparatus has a substrate with fine pitch contacts positioned such that these are within the enclosure. A set of wire bonds is used for pitch reduction by interconnecting the fine pitch contacts with the low pitch contacts arranged on the shelves. The probes are connected to the fine pitch contacts and are used to apply the test signals to a DUT by contacting its pads. In some embodiments, the fine pitch contacts may be embodied by plugs or by blind metal vias.

Abstract translation: 一种用于对被测设备（DUT）进行电气测试的方法和装置，该设备采用具有用于施加测试信号的信号触点的连接板和具有低间距触点的空间变压器，所述空间变压器布置在定义空间变压器中的外壳的一个或多个周向架上 。 该装置具有定位为使得它们在外壳内的细间距触点的基板。 通过将细间距触点与布置在搁架上的低音调触点相互连接，一组引线键被用于降低音调。 探头连接到细间距触点，并用于通过接触其焊盘将测试信号施加到DUT。 在一些实施例中，细间距触点可以由插头或盲金属通孔来实现。

公开(公告)号：USRE46221E1

公开(公告)日：2016-11-29

申请号：US13545571

申请日：2012-07-10

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/00 ,  G01R31/20 ,  G01R3/00 ,  G01R1/067

CPC classification number: G01R3/00 ,  G01R1/06733

Abstract: A probe for engaging a conductive pad is provided. The probe includes a probe contact end for receiving a test current, a probe retention portion below the contact end, a block for holding the probe retention portion, a probe arm below the retention portion, a probe contact tip below the arm, and a generally planar self-cleaning skate disposed perpendicular below the contact tip. The self-cleaning skate has a square front, a round back and a flat middle section. The conductive pad is of generally convex shape having a granular non-conductive surface of debris and moves to engage the skate, whereby an overdrive motion is applied to the pad causing the skate to move across and scrub non-conductive debris from the pad displacing the debris along the skate and around the skate round back end to a position on the skate that is away from the pad.

Abstract translation: 提供用于接合导电焊盘的探针。 探头包括用于接收测试电流的探针接触端，接触端下方的探针保持部分，用于保持探针保持部分的块，在保持部分下方的探针臂，臂下方的探针接触尖端，以及通常 平面自清洁溜冰板垂直设置在接触尖端下方。 自洁滑冰鞋有一个正方形的前面，一个圆形的背部和一个平的中间部分。 导电垫具有大致凸形的形状，具有颗粒状非导电表面的碎屑并且移动以接合滑冰板，由此将过载驱动运动施加到垫上，从而使滑冰板移动并且擦去来自垫的非导电碎片， 沿着溜冰鞋和溜冰鞋周围的碎屑回到位于远离垫子的溜冰鞋上的位置。