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11.发明授权公开(公告)号：US07692790B2
公开(公告)日：2010-04-06
申请号：US11382584
申请日：2006-05-10
Applicant: Felix Kerstan , Nico Correns
Inventor： Felix Kerstan , Nico Correns
IPC: G01J3/42
Abstract: The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monochromator spectrometer arrangements. The field of application is determined by the spectral sensitivity of the detector that is employed. By using a plurality of diffraction orders, the resolution can be increased with the detector size remaining the same, or the detector surface can be reduced while retaining the same imaging quality.
Abstract translation: 本发明涉及一种用于多色光谱仪布置和单色仪光谱仪布置的光栅光谱仪系统。 根据本发明的光栅光谱仪系统包括用于照射待分析样品的光源，衍射光栅，成像光学元件，布置在图像平面中的检测器以及控制和调节单元。 各个光源，优选具有不同光谱特性的LED，其光谱范围覆盖图像平面中的多个衍射级，被用作光源。 只有那些不以任何衍射级布置在图像平面中的各个检测器的相同位置照明的那些LED由控制和调节单元单独或分组地接通。 所提出的解决方案适用于多色光谱仪布置和单色仪光谱仪布置。 应用领域由采用的检测器的光谱灵敏度决定。 通过使用多个衍射级，可以在检测器尺寸保持相同的情况下提高分辨率，或者可以减小检测器表面，同时保持相同的成像质量。
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12.发明申请公开(公告)号：US20070195323A1
公开(公告)日：2007-08-23
申请号：US10559175
申请日：2004-05-21
Applicant: Manfred Fritsch , Nico Correns , Felix Kerstan
Inventor： Manfred Fritsch , Nico Correns , Felix Kerstan
IPC: G01J3/28
CPC classification number: G01B11/306 , G01J3/02 , G01J3/0208 , G01J3/024 , G01J3/0262 , G01J3/04 , G01J3/2803
Abstract: The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the structural component part and means for imaging the light source on an entrance slit over the surface of the coating to be analyzed. The entrance slit is imaged in a wavelength-dependent manner on a two-dimensional detector unit by a grating. An evaluating unit which is electrically connected to the detector unit serves to evaluate and process the signals supplied by the exposed detector elements of the detector unit.
Abstract translation: 本发明涉及一种用于检测涂层的布置，其布置在结构部件或物体的表面上并用于确定这些涂层的化学特性和表面性质。 它包括用于照亮在结构部件表面上待分析的涂层的光源，以及用于将光源成像在待分析涂层的表面上的入口狭缝上的装置。 入射狭缝通过光栅以波长依赖的方式成像在二维检测器单元上。 电连接到检测器单元的评估单元用于评估和处理由检测器单元的暴露的检测器元件提供的信号。
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13.发明申请公开(公告)号：US20120105847A1
公开(公告)日：2012-05-03
申请号：US13342317
申请日：2012-01-03
Applicant: Felix KERSTAN , Nico Correns , Joerg Margraf
Inventor： Felix KERSTAN , Nico Correns , Joerg Margraf
IPC: G01J3/28
CPC classification number: G01J3/2803 , G01J3/0262 , G01J3/36 , G01J3/51
Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.
Abstract translation: 本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。 光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。 检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。 虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。 此外，可以在制造过程中省略或修改像素上的滤色器。 也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。
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14.发明申请公开(公告)号：US20100321686A1
公开(公告)日：2010-12-23
申请号：US12795235
申请日：2010-06-07
Applicant: Nico Correns , Felix Kerstan , Doris Jochmann , Werner Hoyme , Hans-Juergen Dobschal , Marcel Seeber , Lutz Freytag
Inventor： Nico Correns , Felix Kerstan , Doris Jochmann , Werner Hoyme , Hans-Juergen Dobschal , Marcel Seeber , Lutz Freytag
CPC classification number: G01J3/08 , G01J3/021 , G01J3/0262 , G01J3/28 , G01J2003/2866 , G01N21/4738
Abstract: The disclosure provides a device for optical spectrometry, wherein the reference beam and the measuring beam between the deflector and the detector input, in particular between the deflector output and the detector or between a device connecting the optical paths and the detector exhibit the same (the identical) etendue and the same (the identical) optical axis.
Abstract translation: 本公开提供了一种用于光谱分析的装置，其中参考光束和偏转器与检测器输入之间的测量光束，特别是在偏转器输出和检测器之间，或者连接光路和检测器的装置之间呈现相同的（ 相同）光密度和相同（相同）光轴。
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15.发明申请公开(公告)号：US20090103089A1
公开(公告)日：2009-04-23
申请号：US12236889
申请日：2008-09-24
Applicant: Jens Hofmann , Nico Correns , Lutz Freytag , Felix Kerstan , Doris Jochmann , Carsten Ziener , Gerhard Foerschler
Inventor： Jens Hofmann , Nico Correns , Lutz Freytag , Felix Kerstan , Doris Jochmann , Carsten Ziener , Gerhard Foerschler
IPC: G01J3/28
CPC classification number: G01J3/02 , G01J3/0202 , G01J3/0256 , G01J3/0291 , G01J3/18
Abstract: A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.
Abstract translation: 光谱仪包括入口狭缝和入口狭缝的产生。 光谱仪包括壳体，入口狭缝和壳体内的成像衍射光栅，用于将光分解和成像到光电检测器上。 检测器布置在壳体内。 壳体和基板通过相互配合的定位构件相互连接。 入口狭缝，基板的定位构件和用于接收和安装检测装置的保持构件是基板的一体部分，并且以适当的形式和相互定义的相互位置以精确的方式从基板制造 通过例如激光切割或液体射流切割。 基板的定位构件和/或检测装置的保持构件可以设置为弹性元件。
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Patent Agency Ranking
16.发明授权公开(公告)号：US07502108B2
公开(公告)日：2009-03-10
申请号：US10559175
申请日：2004-05-21
Applicant: Manfred Fritsch , Nico Correns , Felix Kerstan
Inventor： Manfred Fritsch , Nico Correns , Felix Kerstan
IPC: G01J3/36
CPC classification number: G01B11/306 , G01J3/02 , G01J3/0208 , G01J3/024 , G01J3/0262 , G01J3/04 , G01J3/2803
Abstract: The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the structural component part and means for imaging the light source on an entrance slit over the surface of the coating to be analyzed. The entrance slit is imaged in a wavelength-dependent manner on a two-dimensional detector unit by a grating. An evaluating unit which is electrically connected to the detector unit serves to evaluate and process the signals supplied by the exposed detector elements of the detector unit.
Abstract translation: 本发明涉及一种用于检测涂层的布置，其布置在结构部件或物体的表面上并用于确定这些涂层的化学特性和表面性质。 它包括用于照亮在结构部件表面上待分析的涂层的光源，以及用于将光源成像在待分析涂层的表面上的入口狭缝上的装置。 入射狭缝通过光栅以波长依赖的方式成像在二维检测器单元上。 电连接到检测器单元的评估单元用于评估和处理由检测器单元的暴露的检测器元件提供的信号。
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17.发明申请公开(公告)号：US20060268270A1
公开(公告)日：2006-11-30
申请号：US11382584
申请日：2006-05-10
Applicant: Felix Kerstan , Nico Correns
Inventor： Felix Kerstan , Nico Correns
IPC: G01J3/28
Abstract: The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monocluomator spectrometer arrangements. The field of application is determined by the spectral sensitivity of the detector that is employed. By using a plurality of diffraction orders, the resolution can be increased with the detector size remaining the same, or the detector surface can be reduced while retaining the same imaging quality.
Abstract translation: 本发明涉及一种用于多色光谱仪布置和单色仪光谱仪布置的光栅光谱仪系统。 根据本发明的光栅光谱仪系统包括用于照射待分析样品的光源，衍射光栅，成像光学元件，布置在图像平面中的检测器以及控制和调节单元。 各个光源，优选具有不同光谱特性的LED，其光谱范围覆盖图像平面中的多个衍射级，被用作光源。 只有那些不以任何衍射级布置在图像平面中的各个检测器的相同位置照明的那些LED由控制和调节单元单独或分组地接通。 所提出的解决方案适用于多色谱仪布置和用于单色器光谱仪布置。 应用领域由采用的检测器的光谱灵敏度决定。 通过使用多个衍射级，可以在检测器尺寸保持相同的情况下提高分辨率，或者可以减小检测器表面，同时保持相同的成像质量。
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公开(公告)号：US06888637B2
公开(公告)日：2005-05-03
申请号：US10302180
申请日：2002-11-22
Applicant: Felix Kerstan , Werner Hoyme , Nico Correns , Ullrich Klarner
Inventor： Felix Kerstan , Werner Hoyme , Nico Correns , Ullrich Klarner
CPC classification number: G01N21/05 , G01N21/031
Abstract: A gas sample vessel for a gas analyzer comprising a housing enclosing a cylindrical resonator cavity. Two mirrors which limit the resonator cavity are fastened to the housing for coupling in and feeding back the measurement light proceeding from an illumination source. The mirrors are curved concavely at their surfaces facing the housing and the housing is curved convexly at its surfaces facing the mirrors with approximately the same radius of curvature. The centers of curvature lie in the center axis of the resonator cavity and the mirror surfaces of the mirrors are portions of the concavely curved surfaces facing the housing.
Abstract translation: 一种用于气体分析器的气体样品容器，其包括封闭圆柱形谐振腔的壳体。 限制谐振腔的两个镜子被固定到壳体上，用于耦合入射和照射源自照明源的测量光。 反射镜在其面向壳体的表面处是凹入的弯曲的，并且壳体在其面向镜子的表面上以大致相同的曲率半径凸出地弯曲。 曲率中心位于谐振腔的中心轴线上，反射镜的镜面是面向壳体的凹曲面的部分。
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公开(公告)号：US4979823A
公开(公告)日：1990-12-25
申请号：US267050
申请日：1988-11-04
Applicant: Joachim Mohr , Felix Kerstan
Inventor： Joachim Mohr , Felix Kerstan
CPC classification number: G01N21/3103
Abstract: In a background compensation in material analysis, the value of the background signal is separated from the value of a gross analyte signal generated by athermal radiation excitation after thermal excitation. The thermal atomization takes place in a stepwise manner by stepwise heating and each step is divided into a first part for the measurement of the gross analyte signal and a second part for the measurement of the background signal.
Abstract translation: 在物质分析的背景补偿中，背景信号的值与热激发后由无热辐射激发产生的总分析物信号的值分开。 热雾化通过逐步加热以逐步方式进行，并且每个步骤被分成用于测量总分析物信号的第一部分和用于测量背景信号的第二部分。
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20.发明申请公开(公告)号：US20090168060A1
公开(公告)日：2009-07-02
申请号：US12225904
申请日：2007-03-12
Applicant: Felix Kerstan , Nico Correns , Joerg Margraf
Inventor： Felix Kerstan , Nico Correns , Joerg Margraf
IPC: G01J3/40
CPC classification number: G01J3/2803 , G01J3/0262 , G01J3/36 , G01J3/51
Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.
Abstract translation: 本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。 光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。 检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。 虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。 此外，可以在制造过程中省略或修改像素上的滤色器。 也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。
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