摘要:
An imaging device includes a lens array including multiple lenses facing a subject; an image sensor obtaining a compound-eye image including single-eye images of the subject formed by the lenses; and a computing unit processing the compound-eye image obtained by the image sensor. The lenses have different radii of curvature and substantially the same back focal length, and the computing unit extracts an in-focus image from the compound-eye image.
摘要:
An imaging device includes an imaging element that takes an image of a target object and output an image signal corresponding to the image; a storage unit that stores therein a zero-point adjustment reference value; a brightness detecting unit that detects a brightness of the target object; and a reference-value changing unit that changes the zero-point adjustment reference value when the brightness detected by the brightness detecting unit is equal to or lower than a threshold. A zero point in a level of the image signal output from the imaging element is adjusted by using the zero-point adjustment reference value stored in the storage unit.
摘要:
A technology for recognizing one or more quadrangles from an input image is disclosed. Edge areas are detected from the input image, lines corresponding to the edge areas are extracted, a line pair selected from the extracted lines is categorized according to a positional relationship between two lines included in the line pair, a line pair evaluation value is calculated for the line pair, a combination of two line pairs is selected, a quadrangle is generated from four lines included in the two line pairs selected, a quadrangle evaluation value is calculated for the quadrangle based on the categories and the line pair evaluation values of the two line pairs forming the quadrangle, and a quadrangle is selected based on the calculated quadrangle evaluation value.
摘要:
A specimen measuring device includes: a light source device that irradiates a specimen surface of a specimen with illumination light from multiple illumination units at a plurality of illumination angles; a spectral camera device that is arranged above the specimen surface, spectrally separates reflected light from the specimen surface, and acquires 2D spectral information through a single image capturing operation; and a calculating unit that calculates deflection angle spectral information of the specimen surface used to measure a measurement value of a certain evaluation item of the specimen using a change in an optical geometrical condition of an illumination direction and an image capturing direction between pixels in an X axis direction and a Y axis direction of the spectral information.
摘要:
The image processing method converts an input image to a transformed image. The method includes segmenting the transformed image into multiple blocks each having multiple pixels including multiple vertex pixels; providing a memory storing at least one coordinate in the transformed image for each vertex pixel, wherein plural coordinates are stored for at least one of the vertex pixels of at least one of the blocks; determining a coordinate in the input image corresponding to a vertex pixel of a focused block by reference to the memory, wherein when plural coordinates are stored for the vertex pixel, one of the coordinates is selected; repeating the determining step for all the blocks to determine coordinates in the input image corresponding to the vertex pixels; and determining coordinates in the input image for all the pixels of the multiple blocks by performing an interpolation processing using the coordinate values determined.
摘要:
A defect inspection apparatus includes an imaging apparatus configured to include a lens array configure to include plural lenses arranged in a form of an array, and an imaging device configured to image a compound-eye image that is a collection of ommatidium images of an object approximately formed by the respective plural lenses of the lens array; and a processing apparatus configured to process the compound-eye image obtained from imaging the object by the imaging apparatus, and determine whether there is a defect of the object.
摘要:
A medium processing method is provided that includes the steps of inputting images of a first medium and a second medium, recognizing first area information of the first medium and second area information of the second medium, determining a correspondence between the first area information and the second area information based on the recognition result, adjusting one of the first area information or the second area information based on the determined correspondence between the first area information and the second area information, and compositing the adjusted one of the area information within a predetermined area defined by the other one of the area information.
摘要:
A system includes: an illumination device; and an imaging device configured to capture an image of a target which is irradiated with light by the illumination device. The illumination device includes: a light emitting unit configured to emit first polarized light; a condensing unit configured to focus light emitted from the light emitting unit; a diffusion unit configured to diffuse the light focused by the condensing unit; and a uniformization optical system configured to receive the light diffused by the diffusion unit, uniformize an illuminance distribution of the light, and emit the light. The system further comprising including a selective transmission unit provided on an optical path from the target to an imaging element of the imaging device and configured to block the first polarized light at a predetermined blocking ratio.
摘要:
A specimen measuring device includes: a light source device that irradiates a specimen surface of a specimen with illumination light from multiple illumination units at a plurality of illumination angles; a spectral camera device that is arranged above the specimen surface, spectrally separates reflected light from the specimen surface, and acquires 2D spectral information through a single image capturing operation; and a calculating unit that calculates deflection angle spectral information of the specimen surface used to measure a measurement value of a certain evaluation item of the specimen using a change in an optical geometrical condition of an illumination direction and an image capturing direction between pixels in an X axis direction and a Y axis direction of the spectral information.
摘要:
An imaging device includes a filter unit including filter areas having different wavelength selectivities; a light receiving element array configured to receive light transmitted through the filter unit; a storage unit configured to store, for each filter area, positional information indicating a position at which light transmitted is received on the light receiving element array; an area detector configured to detect, based on the positional information, an image area corresponding to the light transmitted from an image output by the light receiving element array when light from an object enters the filter unit; and a color detector configured to detect a color of the object based on an output value of the image area. The positional information indicates a position on the light receiving element array identified by using a spectral-response-coincidence-degree indicating a degree of coincidence between a spectral responsivity of each pixel and a desired wavelength selectivity.