Spring activated energy transducer generating A/C electricity from reciprocating natural forces
    11.
    发明授权
    Spring activated energy transducer generating A/C electricity from reciprocating natural forces 失效
    弹簧激活能量传感器从往复自然力产生A / C电力

    公开(公告)号:US07476984B2

    公开(公告)日:2009-01-13

    申请号:US11441288

    申请日:2006-05-26

    IPC分类号: F03B13/10

    CPC分类号: H02K7/1876 F03G7/08

    摘要: The energy transducer includes an upper part and a lower part. The upper part having a housing, a helix metal spring, a first circular board, a second circular board with a short metal shaft, a ball bearing engaged to the short metal shaft, a third circular board with a groove to receive metal bearing balls, an upper metal shaft welded to the bottom of the third circular board, four arc-shaped springs welded to the bottom of the third circular board, and four sets of wheels rotatably attached to one end of the spring. The lower part includes: a housing, a lower metal shaft, a fourth circular board placed on the upper end of the lower part, bundles of electric wire, pluralities of permanent magnets, and a fifth circular board placed at the lower end of the lower part. As the helix metal spring is compressed by an external force, the bundle of electric wire turns between permanent magnets to produce electricity. Direction of the electricity alternates as the helix metal spring oscillates.

    摘要翻译: 能量换能器包括上部和下部。 上部具有壳体,螺旋金属弹簧,第一圆形板,具有短金属轴的第二圆形板,与短金属轴接合的滚珠轴承,具有用于接收金属轴承滚珠的凹槽的第三圆形板, 焊接在第三圆板的底部的上金属轴,焊接在第三圆板的底部的四个弧形弹簧,以及可旋转地安装在弹簧的一端的四组轮。 下部包括:壳体,下部金属轴,放置在下部的上端的第四圆形板,电线束,多个永磁体,以及放置在下部的下端的第五圆形板 部分。 当螺旋金属弹簧被外力压缩时,电线束在永磁体之间转动以产生电力。 随着螺旋金属弹簧振荡,电的方向交替。

    Backlight assembly and an assembling method thereof
    13.
    发明授权
    Backlight assembly and an assembling method thereof 有权
    背光组件及其组装方法

    公开(公告)号:US06814458B2

    公开(公告)日:2004-11-09

    申请号:US10280936

    申请日:2002-10-25

    IPC分类号: F21V704

    摘要: A backlight assembly, an LCD assembly having the same and an assembly method thereof are disclosed to reduce the assembly time and to improve the efficiency. The backlight assembly comprises: a mold frame having an inner lower surface and side walls normal to the inner lower surface; a reflector plate mounted on the inner lower surface of the mold frame; a light guiding plate disposed on the reflecting plate; a lamp assembly accommodated between one side portion of the light guiding plate and the side wall of the mold frame facing the one side portion of the light guiding plate; a series of diffusion sheets disposed on the light guiding plate; and a pair of fixing frames facing each other, covering an edge of the light guiding plate corresponding to a portion where the lamp assembly is accommodated and the side walls of the mold frame, pressing and fixing the light guiding plate, and being detachably coupled to the mold frame.

    摘要翻译: 公开了一种背光组件,具有该背光组件的LCD组件及其组装方法,以减少组装时间并提高效率。 背光组件包括:模具框架,其具有内下表面和与内下表面垂直的侧壁; 安装在模架的内下表面上的反射板; 设置在反射板上的导光板; 容纳在所述导光板的一个侧部与所述模具框架的与所述导光板的一个侧面相对的侧壁之间的灯组件; 布置在导光板上的一系列漫射片; 以及一对固定框架,其彼此面对,覆盖与所述灯组件容纳的部分对应的导光板的边缘和所述模架的侧壁,按压并固定所述导光板,并且可拆卸地联接到 模架。

    Chemical vapor deposition method for manufacturing semiconductor devices
    14.
    发明授权
    Chemical vapor deposition method for manufacturing semiconductor devices 有权
    用于制造半导体器件的化学气相沉积设备,其驱动方法和优化处理室清洗过程配方的方法

    公开(公告)号:US06664119B2

    公开(公告)日:2003-12-16

    申请号:US09804635

    申请日:2001-03-09

    IPC分类号: H01L2166

    CPC分类号: C23C16/4405

    摘要: There is provided a method of optimizing recipe of in-situ cleaning process for process chamber after a specific process on semiconductor wafers by using Residual Gas Analyzer Quadrupole Mass Spectrometer (RGA-QMS) According to the present invention, a Chemical Vapor Deposition (CVD) apparatus for manufacturing semiconductor devices comprises: a process chamber; process gas supply line for supplying process gas into the process chamber; a waste-gas exhaust line for removing the waste-gas from the process chamber after process; a supply line for supplying a ClF3 gas into the process chamber; a sampling manifold for sampling the gas inside process chamber by using pressure difference; and RGA-QMS for analyzing the sampling gas, and the optimization of the end points according to gas flow, pressure, and temperature of the cleaning process for the process chamber is achieved through the analysis by above RGA-QMS.

    摘要翻译: 提供了一种通过使用残留气体分析仪四极质谱仪(RGA-QMS)对半导体晶片进行特定处理后的处理室的现场清洁处理的优化方法。根据本发明,化学气相沉积(CVD) 用于制造半导体器件的设备包括:处理室; 工艺气体供应管线,用于将处理气体供应到处理室中; 用于从处理室中除去废气的废气排放管线; 用于将ClF 3气体供应到处理室中的供应管线; 采样歧管,用于通过使用压力差来对处理室内的气体进行采样; 和用于分析取样气体的RGA-QMS,并通过上述RGA-QMS的分析实现了根据工艺室清洁过程的气体流量,压力和温度对端点进行优化。

    Method of stripping a wafer of its film with gas injected into a CVD
apparatus in which the wafer is disposed
    16.
    发明授权
    Method of stripping a wafer of its film with gas injected into a CVD apparatus in which the wafer is disposed 有权
    用注入到其中设置晶片的CVD装置中的气体剥离其膜的晶片的方法

    公开(公告)号:US6015758A

    公开(公告)日:2000-01-18

    申请号:US140332

    申请日:1998-08-26

    CPC分类号: H01L21/67017 Y10S156/912

    摘要: A method for stripping a film from a wafer substrate includes the steps of inserting a boat holding the wafer into a processing chamber of a CVD apparatus, and injecting gas into the chamber, to thereby strip the wafer of its film. A typical film requiring stripping is a polysilicon film grown on an underlying oxide layer of the substrate. In this case, CIF.sub.3 is used to strip the polysilicon film without damaging the oxide layer. Accordingly, this method is applicable to the quality testing of semiconductor wafer films using a test wafer. In such quality testing a film is formed on a test wafer substrate at the same time the semiconductor wafer film is formed. The film of the test wafer is tested to evaluate the quality of the formation of the semiconductor wafer film. The test wafer can then be stripped within the chemical vapor deposition apparatus and thus can be reused soon thereafter.

    摘要翻译: 从晶片基板剥离膜的方法包括将保持晶片的舟状物插入CVD装置的处理室中并将气体注入到室中从而剥离其膜的晶片的步骤。 需要剥离的典型膜是在基底的下面的氧化物层上生长的多晶硅膜。 在这种情况下,CIF3用于剥离多晶硅膜而不损坏氧化物层。 因此,该方法适用于使用测试晶片的半导体晶片膜的质量测试。 在这种质量测试中,在形成半导体晶片膜的同时,在测试晶片衬底上形成膜。 测试测试晶片的膜以评估半导体晶片膜的形成质量。 然后可以在化学气相沉积设备内剥离测试晶片,因此可以在此之后重新使用。

    IMPROVEMENT APPARATUS OF SURFACE ROUGHNESS DEFECT OF HOT/COLD ROLLED STAINLESS STEEL COILS AND THE METHOD THEREOF
    19.
    发明申请
    IMPROVEMENT APPARATUS OF SURFACE ROUGHNESS DEFECT OF HOT/COLD ROLLED STAINLESS STEEL COILS AND THE METHOD THEREOF 审中-公开
    热/冷轧不锈钢线圈的表面粗糙度缺陷的改进设备及其方法

    公开(公告)号:US20100101064A1

    公开(公告)日:2010-04-29

    申请号:US12516156

    申请日:2007-09-12

    IPC分类号: B21B45/00 B21B45/08 B21B45/04

    摘要: Disclosed is to an improvement apparatus of surface roughness of hot/cold rolled stainless steel coils and the method thereof. The present invention provides an improvement apparatus of surface roughness of hot/cold rolled stainless steel coils including a water spray unit for spraying water on a surface of a cast stainless steel slab; a cutting unit for cutting the stainless steel slab; and a high-pressure water spray having at least one nozzle in a region where the stainless steel slab is cut by the cutting unit and discharged and installed to be symmetric in upper and lower parts of the stainless steel slab; and a roller brush installed to be in contact with and symmetric in the upper and lower parts of the stainless steel slab passed through the water spray so as to rotate at a high speed. Accordingly, the improvement apparatus according to the present invention may be useful to produce a stainless steel slab having an excellent surface quality since it is possible to easily remove the scale and mold slag from the stainless steel slab.

    摘要翻译: 本发明公开了一种热轧不锈钢卷材表面粗糙度的改进装置及其制造方法。 本发明提供了一种包括用于在铸造不锈钢板的表面上喷水的喷水单元的热/冷轧不锈钢卷材表面粗糙度的改进装置, 用于切割不锈钢板的切割单元; 以及在不锈钢板被切割单元切割的区域中具有至少一个喷嘴的高压喷水器,并且在不锈钢板的上部和下部排出并安装成对称的区域; 以及安装成与穿过喷水头的不锈钢板的上部和下部接触并对称的辊刷,以便高速旋转。 因此,根据本发明的改进装置可以用于生产具有优异表面质量的不锈钢板,因为可以容易地从不锈钢板上去除垢和模具渣。

    LIQUID CRYSTAL DISPLAY AND METHOD OF ASSEMBLING THE SAME
    20.
    发明申请
    LIQUID CRYSTAL DISPLAY AND METHOD OF ASSEMBLING THE SAME 有权
    液晶显示器及其组装方法

    公开(公告)号:US20090135329A1

    公开(公告)日:2009-05-28

    申请号:US12143890

    申请日:2008-06-23

    申请人: Jung-Ki Kim

    发明人: Jung-Ki Kim

    IPC分类号: G02F1/1335

    摘要: A liquid crystal display (LCD) which can prevent electronic elements from being short-circuited due to a detachment of a printed circuit board (PCB). The LCD includes a liquid crystal panel which displays an image, a first container which is disposed below the liquid crystal panel and includes one or more first protrusions that are formed on an outer surface of a sidewall of the first container, a printed circuit board (PCB) which is electrically connected to the liquid crystal panel via a plurality of connection elements, wherein the PCB is held to the sidewall of the first container, and includes one or more coupling holes that respectively correspond to and receive the first protrusions. The LCD includes a second container which covers the periphery of the liquid crystal panel, the first container and the PCB and the second container includes one or more second protrusions that are formed on a sidewall of the second container and respectively correspond to the first protrusions.

    摘要翻译: 一种液晶显示器(LCD),其可以防止电子元件由于印刷电路板(PCB)的分离而短路。 LCD包括显示图像的液晶面板,设置在液晶面板下方的第一容器,并且包括形成在第一容器的侧壁的外表面上的一个或多个第一突起,印刷电路板( PCB),其经由多个连接元件电连接到液晶面板,其中PCB被保持到第一容器的侧壁,并且包括分别对应于并接收第一突起的一个或多个耦合孔。 LCD包括覆盖液晶面板周边的第二容器,第一容器和PCB,第二容器包括形成在第二容器的侧壁上并分别对应于第一突起的一个或多个第二突起。