Abstract:
A serial-parallel type analog-to-digital converter includes a reference voltage generator, a higher bit comparing portion and a lower bit comparing portion, and a reference voltage selecting portion, wherein the lower bit comparing portion includes the plurality of comparison stages.
Abstract:
A subranging analog-to-digital converter is disclosed. The converter includes: a divided voltage generation circuit that equally divides a range of a predetermined voltage, and generates 2m+1 divided voltages; a higher-order conversion circuit that generates a signal for higher-order m bits of the digital signal by comparing the analog signal with the 2m−1 or less of the 2m+1 divided voltages; a switch circuit that selects at least two of the 2m+1 divided voltages based on information provided by the higher-order conversion circuit; a lower-order conversion circuit that generates a signal for lower-order n bits (n=N−m) of the digital signal by comparing the analog signal with the divided voltages being a selection result of the switch circuit; and an encoder that generates the digital signal based on the signal provided by the higher-order conversion circuit and the signal provided by the lower-order conversion circuit.
Abstract:
A subranging analog-to-digital converter is disclosed. The converter includes: a divided voltage generation circuit that equally divides a range of a predetermined voltage, and generates 2m+1 divided voltages; a higher-order conversion circuit that generates a signal for higher-order m bits of the digital signal by comparing the analog signal with the 2m−1 or less of the 2m+1 divided voltages; a switch circuit that selects at least two of the 2m+1 divided voltages based on information provided by the higher-order conversion circuit; a lower-order conversion circuit that generates a signal for lower-order n bits (n=N−m) of the digital signal by comparing the analog signal with the divided voltages being a selection result of the switch circuit; and an encoder that generates the digital signal based on the signal provided by the higher-order conversion circuit and the signal provided by the lower-order conversion circuit.
Abstract:
A serial-parallel type analog-to-digital converter includes a reference voltage generator, a higher bit comparing portion and a lower bit comparing portion, and a reference voltage selecting portion, wherein the lower bit comparing portion includes the plurality of comparison stages.
Abstract:
A comparator includes a sampling capacitor, a first switching unit which is connected to an input end of the sampling capacitor and which applies an input signal to the input end of the sampling capacitor, a second switching unit which is connected to the input end of the sampling capacitor and which applies a reference signal to the input end of the sampling capacitor, an output transistor connected to an output end of the sampling capacitor in a source follower connection manner or an emitter follower connection manner, and a third switching unit which is connected to an output end of the sampling capacitor and which maintains maintaining a voltage at the output end of the sampling capacitor to be constant. The input signal is compared with the reference signal.
Abstract:
A comparator includes a sampling capacitor, a first switching unit which is connected to an input end of the sampling capacitor and which applies an input signal to the input end of the sampling capacitor, a second switching unit which is connected to the input end of the sampling capacitor and which applies a reference signal to the input end of the sampling capacitor, an output transistor connected to an output end of the sampling capacitor in a source follower connection manner or an emitter follower connection manner, and a third switching unit which is connected to an output end of the sampling capacitor and which maintains maintaining a voltage at the output end of the sampling capacitor to be constant. The input signal is compared with the reference signal.
Abstract:
A semiconductor device includes a semiconductor substrate and a ladder resistor formed on the semiconductor substrate. The ladder resistor includes a plurality of elongated resistor portions arranged in parallel with each other, a plurality of connection portions that connect the resistor portions at predetermined intervals in a longitudinal direction of the resistor portions, and a plurality of voltage extraction portions provided in order to extract voltages at the individual connection portions.