Abstract:
A semiconductor integrated circuit has a digital signal generator that generates a binary signal whose logic transitions at a timing according to a discharge amount of a second wiring which is discharged when multiplication data of first data stored in a memory cell and second data on a first wiring is a first logic; and a transition timing detector that detects a timing at which the logic of the binary signal transitions.
Abstract:
An SAR analog-to-digital conversion circuit includes: first and second CDACs; first to third comparators respectively comparing outputs of the first and second CDACs, output levels of the first and third CDACs with a reference level; an arithmetic operation circuit; and an SAR control circuit, wherein the SAR control circuit: at each step, determines in which of four ranges output levels of the sampled and held signals of the first and second CDACs are included, the four ranges corresponding to the conversion range being quartered, determines two bits of the digital data and adjusts the output levels of the first and second CDACs so that a level at ¼ or ¾ of the voltage range agrees with the intermediate level, and controls first and second switches so that the voltage range is set to be a conversion range at a next step.
Abstract:
An analog-to-digital converter includes: a first latch row corresponding to a first stage; a second latch row corresponding to a second stage; and a digital processor for encoding output signals of the second latch row and generating a digital signal. The first latch row includes a plurality of first latches that receive an analog input signal and reference voltages and operate in synchronization with a first clock signal, and the second latch row includes: a plurality of second latches that receive outputs signals of the plurality of first latches and operate in synchronization with a second clock signal delayed from the first reference clock; and a plurality of third latches that receive output signals of two neighboring latches of the plurality of first latches and operate in synchronization with the second clock signal by means of an interpolation technique.
Abstract:
An exemplary continuous-time delta-sigma analog-to-digital converter includes a loop filter, a quantizer, a dynamic element matching circuit, a latch, and a digital-to-analog converter (DAC). The loop filter contains a plurality of integrators coupled in series, including a first integrator and a second integrator; a first positive feedback resistive element, placed in a first positive feedback path between a first output node of the second integrator and a first input node of the first integrator; and a first negative feedback resistive element, placed in a first negative feedback path between a second output node of the second integrator and a second input node of the first integrator. The quantizer is implemented using a domino quantizer. The DAC contains a plurality of DAC units each having a capacitive device, a resistive device, and a switch device coupled between the capacitive device and the resistive device.
Abstract:
A semiconductor device is described which includes a first comparator judging the level of an input signal based on a first judgment value, a second comparator judging the level of the input signal based on a second judgment value, and a calibrator outputting a control signal for starting the calibration of the second judgment value in the case that the calibration of the first judgment value is ended.
Abstract:
A semiconductor device is described which includes a first comparator judging the level of an input signal based on a first judgment value, a second comparator judging the level of the input signal based on a second judgment value, and a calibrator outputting a control signal for starting the calibration of the second judgment value in the case that the calibration of the first judgment value is ended.
Abstract:
ADC accuracy is increased by 1 bit by interpolation of comparator outputs in a comparator array, thereby increasing accuracy without significantly increasing power consumption and size. Specifically, an analog-to-digital converter includes a binary converter and a comparator array, which comprises a plurality of comparator blocks, each block having a primary comparator and an interpolating comparator. The interpolating comparator compares an output signal from the primary comparator with a negative output signal from a primary comparator of another block of the plurality of blocks to generate a least significant bit. The binary converter, which is coupled to the array, converts array output to binary code.
Abstract:
An input signal is compared to 2N−1 reference voltages to generate 2N−1 corresponding binary valued comparison signals, delaying at least one of the comparison signals by a variable delay and detecting a difference in arrival time between the delayed signal and another comparison signal. A time interpolation signal encoding a plurality of bins within a least significant bit quantization level is generated, based on the detected difference in arrival time. An M-bit output data is generated based on the comparison signals and the time interpolation signal. A non-uniformity of a code density of the M-bit output data is detected, and based on the detecting the delaying is varied.
Abstract:
The invention provides an interpolation apparatus for improving the resolution of an optical encoder. The optical encoder outputs an encoding signal, and the encoding signal corresponds to a first resolution. The interpolation apparatus comprises a comparing circuit and a lookup table circuit. The comparator receives the encoding signal and produces a plurality of comparison signals. The lookup table circuit receives a plurality of comparison signals and produces an outputted signal, wherein the outputted signal corresponds to second resolution. The second resolution is greater than the first resolution.
Abstract:
A method for detecting an absolute rotational position of an electromechanical device or the at least one component thereof comprising determining a first absolute position of the electromechanical device or the at least one component thereof based on a commutation index signal, obtaining a Z-index signal, and determining a second absolute position of the electromechanical device or the at least one component thereof based on the Z-index signal. The method initially determines a coarse rotational position of the electromechanical device such as a rotor or steering wheel based on the commutation index signal. When a device's position is first initialized by a commutation index signal before the Z-index pulse is detected, the device's position is re-initialized upon detection of the Z-Index pulse to provide a more accurate absolute device rotational position.