Abstract:
A device for automatically controlling the edges of a web of sheeting has a first deflecting roller and a second deflecting roller, which are arranged parallel to each other, and also a drive for shifting the deflecting rollers in opposite axial directions. A sensor detects the position of the sheeting. The drive shifts the deflecting rollers in opposite axial directions and the ratio between the friction of the sheeting on the first deflecting roller and the friction of the sheeting on the second deflecting roller is changed on the basis of the position of the sheeting detected by the sensor.
Abstract:
A device and method for drawing off and recirculating cooling streams, specifically for drawing off and recirculating a cooling stream of fuel for cooling at least one aircraft engine accessory, is disclosed. The device having a tubular jacket part defining a flow cross-section through which a primary stream, specifically a fuel stream, flows by way of an extraction pipe which is positioned approximately in the center of the flow cross-section, or jacket part, in order to draw off a cooling stream from the primary stream, by way of a hollow strut extending in the radial direction to divert this cooling stream from the device with the aid of the extraction pipe and to supply it to at least one accessory to be cooled, and by way of a return opening to recirculate the cooling stream directed through the accessory for cooling purposes to the primary stream.
Abstract:
A semiconductor device is provided having n-type device layers of III-V nitride having donor dopants such as germanium (Ge), silicon (Si), tin (Sn), and/or oxygen (O) and/or p-type device layers of III-V nitride having acceptor dopants such as magnesium (Mg), beryllium (Be), zinc (Zn), and/or cadmium (Cd), either simultaneously or in a doping superlattice, to engineer strain, improve conductivity, and provide longer wavelength light emission.
Abstract:
In the present invention, an interfacial layer is added to a light-emitting diode or laser diode structure to perform the role of strain engineering and impurity gettering. A layer of GaN or AlxInyGa1−x−yN (0≦x≦1, 0≦y≦1) doped with Mg, Zn, Cd can be used for this layer. Alternatively, when using AlxInyGa1−x−yN (x>0), the layer may be undoped. The interfacial layer is deposited directly on top of the buffer layer prior to the growth of the n-type (GaN:Si) layer and the remainder of the device structure. The thickness of the interface layer varies from 0.01-10.0 &mgr;m.
Abstract translation:在本发明中,将界面层添加到发光二极管或激光二极管结构中以起到应变工程和杂质吸杂的作用。 可以使用掺杂有Mg,Zn,Cd的GaN或Al x In y Ga 1-x-y N(0 <= x <= 1,0 <= y <= 1)层。 或者,当使用Al x In y Ga 1-x-y N(x> 0)时,该层可以是未掺杂的。 在n型(GaN:Si)层和器件结构的其余部分生长之前,界面层直接沉积在缓冲层的顶部上。 界面层的厚度从0.01-10.0μm变化。
Abstract:
In the present invention, an interfacial layer is added to a light-emitting diode or laser diode structure to perform the role of strain engineering and impurity gettering. A layer of GaN or AlxInyGal1-x-yN (0≦x≦1, 0≦y≦1) doped with Mg, Zn, Cd can be used for this layer. Alternatively, when using AlxInyGa1-x-yN (x>0), the layer may be undoped. The interfacial layer is deposited directly on top of the buffer layer prior to the growth of the n-type (GaN:Si) layer and the remainder of the device structure. The thickness of the interfacial layer varies from 0.01-10.0 &mgr;m.
Abstract translation:在本发明中,将界面层添加到发光二极管或激光二极管结构中以起到应变工程和杂质吸杂的作用。 可以使用掺杂有Mg,Zn,Cd的GaN或Al x In y Ga 1-x-y N(0 <= x <= 1,0 <= y <= 1)的层。 或者,当使用Al x In y Ga 1-x-y N(x> 0)时,该层可以是未掺杂的。 在n型(GaN:Si)层和器件结构的其余部分生长之前,界面层直接沉积在缓冲层的顶部上。 界面层的厚度从0.01-10.0μm变化。
Abstract:
A process for etching III-V nitride and III-V nitride alloy materials first implants selected regions of the materials with ions and then selectively etches the implanted regions in an etching liquid, such as an aqueous base. The etch depth is controlled by the energy, mass and dose of the implanted ions.
Abstract:
Apparatus for mounting a computer terminal or word processor so that it can be vertically adjusted and/or angularly adjusted comprising an upper cap piece into which the terminal is received and which has a threaded stud mounted therein and a lower base member with a second threaded stud mounted therein and with a central adjustment member mounted between the upper cap piece and the lower base piece and threadedly connected to the upper cap piece and the lower base piece such that when the adjustment member is rotated a first threaded portion engages the threaded stud of the upper cap member and a second thread on the adjustment member engages the second threaded stud of the lower base member and wherein the threads on the adjustment member are of opposite direction to each other such that when the adjustment member is manually rotated a telescope vertical displacement of the cap member relative to the base member occurs due to turning of the central adjustment member with an external gripping surface. An antitwist means is provided between the cap member and the base member to prevent twisting and the terminal is pivoted and twisted by means of a carrier plate which is shaped like a spherical cap which forms the lower portion of the computer terminal housing and which rests on a collar portion of the cap member and can be releasably moved with the terminal with a guiding member.
Abstract:
A device for automatically controlling the edges of a web of sheeting has a first deflecting roller and a second deflecting roller, which are arranged parallel to each other, and also a drive for shifting the deflecting rollers in opposite axial directions. A sensor detects the position of the sheeting. The drive shifts the deflecting rollers in opposite axial directions and the ratio between the friction of the sheeting on the first deflecting roller and the friction of the sheeting on the second deflecting roller is changed on the basis of the position of the sheeting detected by the sensor.
Abstract:
A semiconductor structure includes a light emitting region, a p-type region disposed on a first side of the light emitting region, and an n-type region disposed on a second side of the light emitting region. At least 10% of a thickness of the semiconductor structure on the first side of the light emitting region comprises indium. Some examples of such a semiconductor light emitting device may be formed by growing an n-type region, growing a p-type region, and growing a light emitting layer disposed between the n-type region and the p-type region. The difference in temperature between the growth temperature of a part of the n-type region and the growth temperature of a part of the p-type region is at least 140° C.