Distributed gain stage for high speed high resolution pipeline analog to digital converters
    15.
    发明授权
    Distributed gain stage for high speed high resolution pipeline analog to digital converters 有权
    分布式增益级用于高速高分辨率管道模数转换器

    公开(公告)号:US09191019B2

    公开(公告)日:2015-11-17

    申请号:US14658333

    申请日:2015-03-16

    Applicant: Apple Inc.

    Abstract: In an embodiment, multiple MDAC stages are coupled in parallel to form an MDAC having the desired gain and capacitor size. Each stage may include capacitors and an OTA that are much smaller than the corresponding capacitors and OTA would be for a large single stage. Interconnect for each stage may be shorter than the single stage case, and thus the parasitic resistance and capacitance may be lower. Power consumption may be reduced, and performance of the amplifier may be increased, due to the reduced parasitic resistance and capacitance. The area occupied by the circuitry may be lower as well. Process variation within a given stage may be lower. The process variation between stages may induce noise in the output, but the parallel connection of the stages may serve to reduce the noise, in some embodiments.

    Abstract translation: 在一个实施例中,多个MDAC级并联耦合以形成具有所需增益和电容器大小的MDAC。 每个阶段可以包括电容器和比对应的电容器小得多的OTA,并且OTA将用于大的单级。 每个级的互连可能比单级情况短,因此寄生电阻和电容可能较低。 由于降低的寄生电阻和电容,功耗可能会降低,放大器的性能可能会增加。 电路占用的面积也可能较低。 给定阶段内的工艺变化可能较低。 在一些实施例中,级之间的过程变化可能导致输出中的噪声,但是级的并联可以用于减少噪声。

    Distributed Gain Stage for High Speed High Resolution Pipeline Analog to Digital Converters
    16.
    发明申请
    Distributed Gain Stage for High Speed High Resolution Pipeline Analog to Digital Converters 有权
    用于高速高分辨率管道模数转换器的分布式增益级

    公开(公告)号:US20150263745A1

    公开(公告)日:2015-09-17

    申请号:US14658333

    申请日:2015-03-16

    Applicant: Apple Inc.

    Abstract: In an embodiment, multiple MDAC stages are coupled in parallel to form an MDAC having the desired gain and capacitor size. Each stage may include capacitors and an OTA that are much smaller than the corresponding capacitors and OTA would be for a large single stage. Interconnect for each stage may be shorter than the single stage case, and thus the parasitic resistance and capacitance may be lower. Power consumption may be reduced, and performance of the amplifier may be increased, due to the reduced parasitic resistance and capacitance. The area occupied by the circuitry may be lower as well. Process variation within a given stage may be lower. The process variation between stages may induce noise in the output, but the parallel connection of the stages may serve to reduce the noise, in some embodiments.

    Abstract translation: 在一个实施例中,多个MDAC级并联耦合以形成具有所需增益和电容器大小的MDAC。 每个阶段可以包括电容器和比对应的电容器小得多的OTA,并且OTA将用于大的单级。 每个级的互连可能比单级情况短,因此寄生电阻和电容可能较低。 由于降低的寄生电阻和电容,功耗可能会降低,放大器的性能可能会增加。 电路占用的面积也可能较低。 给定阶段内的工艺变化可能较低。 在一些实施例中,级之间的过程变化可能导致输出中的噪声,但是级的并联可以用于减少噪声。

    Voltage reference circuit
    17.
    发明授权

    公开(公告)号:US12216484B2

    公开(公告)日:2025-02-04

    申请号:US18340759

    申请日:2023-06-23

    Applicant: Apple Inc.

    Abstract: A voltage reference circuit included in a computer system includes an asymmetric amplifier circuit that includes two metal-oxide semiconductor field-effect transistors with different threshold voltages. The voltage reference circuit also includes an output circuit that generates, using a control signal, a bias signal and an output current that is used by a divider circuit to generate a reference voltage and a feedback voltage. The reference voltage and bias signal are used by the amplifier circuit to generate the control signal, which is based on a difference between the transistors' threshold voltages.

    Process-Insensitive Sensor Circuit
    19.
    发明申请

    公开(公告)号:US20220357212A1

    公开(公告)日:2022-11-10

    申请号:US17313844

    申请日:2021-05-06

    Applicant: Apple Inc.

    Abstract: A sensor system included in an integrated circuit includes multiple sensor circuits and a control circuit. Using characterization data, a model may be generated that defines a relationship between measurable parameters of the integrated circuit and an operating characteristic of the integrated circuit. The control circuit can combine, using a function included in the model, data from the multiple sensor circuits to determine a value of the operating characteristic that is more accurate than a sensor circuit configured to measure a single parameter of the integrated circuit that varies with the operating characteristic.

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