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    Process-Insensitive Sensor Circuit
    3.
    发明申请
    Process-Insensitive Sensor Circuit 有权

    公开(公告)号：US20220357212A1

    公开(公告)日：2022-11-10

    申请号：US17313844

    申请日：2021-05-06

    Applicant: Apple Inc.

    Inventor： Ali Mesgarani ,  Farzan Farbiz ,  Ke Yun ,  Dusan Stepanovic ,  Seyedeh Sedigheh Hashemi ,  Mansour Keramat

    IPC: G01K7/16 ,  H01L21/66

    Abstract: A sensor system included in an integrated circuit includes multiple sensor circuits and a control circuit. Using characterization data, a model may be generated that defines a relationship between measurable parameters of the integrated circuit and an operating characteristic of the integrated circuit. The control circuit can combine, using a function included in the model, data from the multiple sensor circuits to determine a value of the operating characteristic that is more accurate than a sensor circuit configured to measure a single parameter of the integrated circuit that varies with the operating characteristic.

    Non-invasive on-chip power measurement technique
    4.
    发明授权
    Non-invasive on-chip power measurement technique 有权

    公开(公告)号：US11215664B1

    公开(公告)日：2022-01-04

    申请号：US16906715

    申请日：2020-06-19

    Applicant: Apple Inc.

    Inventor： Ke Yun ,  Weibiao Zhang ,  Bruno W. Garlepp ,  Gin S. Yee

    IPC: G01R31/28 ,  G01R31/30

    Abstract: An apparatus includes an integrated circuit that includes an in-circuit power switch coupled to a power supply node, a functional circuit coupled between the in-circuit power switch and a ground node, a test circuit, and a test power switch coupled to the test circuit, wherein the test power switch is a replica of the in-circuit power switch. The test circuit is configured to determine characteristics of the test power switch, and to measure a voltage difference across the in-circuit power switch. The test circuit is also configured to use the characteristics of the test power switch and the voltage difference to determine a power consumption of the functional circuit.

    Controller for Multiple Sensor Types in an SoC
    6.
    发明申请
    Controller for Multiple Sensor Types in an SoC 有权

    公开(公告)号：US20230076507A1

    公开(公告)日：2023-03-09

    申请号：US17466320

    申请日：2021-09-03

    Applicant: Apple Inc.

    Inventor： Robert S. Brandt, II ,  Bruno W. Garlepp ,  Ke Yun ,  Navin Kumar ,  Jafar Savoj

    IPC: G05B19/042

    Abstract: A universally-designed control circuit for communicating with multiple types of sensors is disclosed. For example, a control circuit may communicate with either ring oscillator-based sensors or BJT-based sensors based on programming implemented in the control circuit. The control circuit may include programmable communication protocol circuits for communicating with the sensors and conversion circuits that convert a particular type of sensor data packet into a generic format. The generic format sensor data may then be utilized by a power management unit or other device to control operation of an integrated circuit.

    Micro Analog Sensor Circuit and System
    7.
    发明申请
    Micro Analog Sensor Circuit and System 有权

    公开(公告)号：US20220100220A1

    公开(公告)日：2022-03-31

    申请号：US17033528

    申请日：2020-09-25

    Applicant: Apple Inc.

    Inventor： Ali Mesgarani ,  Ke Yun ,  Seyedeh Sedigheh Hashemi ,  Jasdeep S. Dhaliwal ,  Mansour Keramat ,  Jafar Savoj ,  Bruno W. Garlepp ,  Vahid Majidzadeh Bafar ,  Emerson S. Fang

    IPC: G05F3/26 ,  H03M1/34 ,  H03M3/00 ,  G01K7/01

    Abstract: The present disclosure is directed to a system implementing a sensor. A sensing system is implemented in a functional circuit block that is coupled to a global supply voltage node. The sensing system includes a power converter circuit configured to generate a regulated voltage level on a local supply node using the voltage present on the global supply voltage node. The system also includes a sensor circuit coupled to receive the regulated voltage node, wherein the sensor is configured to compare corresponding parameters of different ones of a number of subset of device at a plurality of different time points and generate a plurality of comparison results. The comparisons generate an analog signal that is proportional to the operating parameter. An analog-to-digital converter (ADC) is coupled to receive the analog signal and generate a plurality of bits corresponding thereto.

    Non-Invasive On-Chip Power Measurement Technique
    8.
    发明申请
    Non-Invasive On-Chip Power Measurement Technique 有权

    公开(公告)号：US20210396805A1

    公开(公告)日：2021-12-23

    申请号：US16906715

    申请日：2020-06-19

    Applicant: Apple Inc.

    Inventor： Ke Yun ,  Weibiao Zhang ,  Bruno W. Garlepp ,  Gin S. Yee

    IPC: G01R31/30 ,  G01R31/28

    Abstract: An apparatus includes an integrated circuit that includes an in-circuit power switch coupled to a power supply node, a functional circuit coupled between the in-circuit power switch and a ground node, a test circuit, and a test power switch coupled to the test circuit, wherein the test power switch is a replica of the in-circuit power switch. The test circuit is configured to determine characteristics of the test power switch, and to measure a voltage difference across the in-circuit power switch. The test circuit is also configured to use the characteristics of the test power switch and the voltage difference to determine a power consumption of the functional circuit.

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