公开(公告)号：US06491000B1

公开(公告)日：2002-12-10

申请号：US09979615

申请日：2001-11-06

Applicant: David J. Walker ,  Donald L. Wietzke ,  Gary L. Anderson ,  Richard F. Romansky, Jr.

Inventor： David J. Walker ,  Donald L. Wietzke ,  Gary L. Anderson ,  Richard F. Romansky, Jr.

IPC: F22B3710

CPC classification number: F22B31/003 ,  F22B31/0084 ,  F22B37/108 ,  F23C2206/10 ,  F23M5/02 ,  F23M5/08 ,  F23M2900/05001 ,  Y10S122/13 ,  Y10S122/15

Abstract: A tube wall, division wall, or wing wall section (10) for a circulating fluidized bed boiler with improved erosion resistant characteristics has a reduced diameter tube section (40) adjacent the refractory covered by an abrasion resistant refractory tile (60). The refractory tile (60) is mounted to the reduced diameter tube section (40) with the upper edge of the refractory tile outside of or not extending beyond a solids fall line of solids in the fluidized bed to eliminate exposed discontinuities.

Abstract translation: 用于具有改善的抗侵蚀特性的循环流化床锅炉的管壁，分隔壁或翼壁部分（10）具有与由耐磨耐火砖（60）覆盖的耐火材料相邻的直径减小的管部分（40）。 将耐火砖（60）安装到直径减小的管部分（40）上，其中耐火砖的上边缘在流化床内部固定的固体落下线之外或不延伸超过暴露的不连续点。

公开(公告)号：US6058858A

公开(公告)日：2000-05-09

申请号：US77483

申请日：1998-05-29

Applicant: Felix Belin ,  David E. James ,  David J. Walker ,  Kiplin C. Alexander

Inventor： Felix Belin ,  David E. James ,  David J. Walker ,  Kiplin C. Alexander

IPC: F22B31/00 ,  F23C10/02 ,  F23C10/08 ,  F23G5/00 ,  F23G7/00 ,  F23J3/00

CPC classification number: F23C10/02 ,  F22B31/0084 ,  F23C10/08

Abstract: A circulating fluidized bed (CFB) reactor or combustor having an internal impact type primary particle separator which provides for internal return of all primary collected solids to a bottom portion of the reactor or combustor for subsequent recirculation without external and internal recycle conduits. The CFB reactor enclosure or furnace is provided with plural furnace outlets. This construction permits increased furnace depths and reduced furnace widths, resulting in a compact design.

Abstract translation: PCT No.PCT / US96 / 19039 Sec。 371日期1998年6月29日第 102（e）1998年6月29日PCT PCT 1996年11月29日PCT公布。 公开号WO97 / 20172 日期1997年6月5日具有内部冲击型一次粒子分离器的循环流化床（CFB）反应器或燃烧器，其提供所有初级收集的固体内部返回到反应器或燃烧器的底部，用于随后的再循环，而不需要外部和内部循环 导管。 CFB反应器外壳或炉具有多个炉出口。 这种结构允许增加炉深度和减小炉宽，从而实现紧凑的设计。

公开(公告)号：US4860694A

公开(公告)日：1989-08-29

申请号：US242656

申请日：1988-09-12

Applicant: David J. Walker

Inventor： David J. Walker

IPC: B01J8/00 ,  B01J8/36 ,  F23C10/18

CPC classification number: B01J8/0025 ,  B01J8/36 ,  F23C10/18

Abstract: A system for the control and conveyance of particulate material from a standpipe to the furnace of a circulating fluidized bed boiler. Aeration means positioned in a first area of a conduit transports particulate material deposited by a standpipe to a second area of the conduit. Upon such relocation, additional material from the standpipe enters the first area of the conduit as a replacement for the previously removed material. Fluidizing means in the second area of the conduit fluidizes this removed material causing it to achieve a generally uniform level within this second area. As the height of this level exceeds that of the lower edge of a discharge opening, the fluidized material passes through this opening and into the furnace of a circulating fluidized bed boiler.

Abstract translation: 一种用于将颗粒材料从竖管控制和输送到循环流化床锅炉的炉中的系统。 定位在管道的第一区域中的曝气装置将由立管沉积的颗粒材料输送到导管的第二区域。 在这种重新定位时，来自立管的附加材料进入导管的第一区域作为先前去除的材料的替代物。 在管道的第二区域中的流化装置将该去除的材料流化，使其在该第二区域内达到一般均匀的水平。 当该高度超过排出口的下边缘的高度时，流化材料通过该开口进入循环流化床锅炉的炉中。

公开(公告)号：US08047162B2

公开(公告)日：2011-11-01

申请号：US12175102

申请日：2008-07-17

Applicant: Mikhail Maryamchik ,  Michael J. Szmania ,  David J. Walker ,  Donald L. Wietzke

Inventor： Mikhail Maryamchik ,  Michael J. Szmania ,  David J. Walker ,  Donald L. Wietzke

IPC: B01D45/00

CPC classification number: F22B37/42 ,  F23C10/10 ,  F23J2219/10

Abstract: A system and method for quickly cooling and de-pressurizing a boiler arrangement in the event of a plant power loss, a.k.a. a black plant condition. A steam discharge system injects steam from the steam/water circuit into the furnace, thereby both cooling components of the boiler arrangement and reducing pressure in the steam/water circuit. This reduces or eliminates the additional cost associated with providing extra capacity in a steam drum and/or an independently powered boiler water pump. The system and method is particularly useful for quickly cooling the U-beams of a circulating fluidized bed (CFB) boiler during a black plant condition. In application to boiler arrangements with a selective non-catalytic reduction (SNCR) system employing steam as a carrier for a NOx reducing agent, the steam discharge system advantageously uses the discharge nozzles of the SNCR system to inject the steam into the furnace.

Abstract translation: 一种在工厂电力损失的情况下快速冷却和减压锅炉装置的系统和方法，例如黑色植物条件。 蒸汽排放系统将来自蒸汽/水回路的蒸汽注入炉中，从而将锅炉装置的冷却部件和蒸汽/水回路中的压力降低。 这减少或消除了在蒸汽鼓和/或独立供电的锅炉水泵中提供额外容量的附加成本。 该系统和方法特别适用于在黑色植物条件下快速冷却循环流化床（CFB）锅炉的U型梁。 在应用具有使用蒸汽作为NOx还原剂的载体的选择性非催化还原（SNCR）系统的锅炉装置时，蒸汽排放系统有利地使用SNCR系统的排放喷嘴将蒸汽注入炉中。

公开(公告)号：US20090021010A1

公开(公告)日：2009-01-22

申请号：US11780130

申请日：2007-07-19

Applicant: David J. Walker

Inventor： David J. Walker

IPC: F01K15/00 ,  H02K44/08 ,  F01K17/04

CPC classification number: H02K44/08

Abstract: A closed-cycle system and method of electrical power generation uses steam to transport charge carriers through an MHD generator. Water droplets, fine particles or mixtures thereof are used as the charge carriers. The fine particles are sufficiently small to allow the particles to pass through pumps and other equipment in the flow path with little or no damage, thereby eliminating the need to remove and re-inject a seed material, or treat it prior to discharge to the environment. The high operating temperatures of prior art MHD generators are avoided, thereby allowing more economical and readily available materials to be used. The system and method also allows the MHD generator to be used as the bottoming cycle in a single-loop power generation system, with a conventional steam turbine-generator used as the topping cycle, resulting in an increased heat rate with reduced emissions of greenhouse gases and other pollutants, and with reduced heat rejection to the environment per unit of electricity produced.

Abstract translation: 封闭循环系统和发电方法使用蒸汽将电荷载体传送通过MHD发生器。 使用水滴，细粒或其混合物作为电荷载体。 细颗粒足够小以允许颗粒在流动路径中通过泵和其他设备，几乎没有或没有损坏，从而不需要去除和重新注入种子材料，或者在排放到环境之前对其进行处理 。 避免了现有技术的MHD发生器的高操作温度，从而允许使用更经济和容易获得的材料。 该系统和方法还允许将MHD发电机用作单回路发电系统的底循环，其中传统的蒸汽轮机发电机用作顶部循环，导致增加的热速率，减少温室气体的排放 和其他污染物，并且每单位产生的电力对环境的排放降低。

公开(公告)号：US07021389B2

公开(公告)日：2006-04-04

申请号：US10373319

申请日：2003-02-24

Applicant: Floyd Romaine Bishop ,  Marvin Bryce Traweek ,  Richard J. Ross ,  David J. Walker ,  DeWayne M. Turner

Inventor： Floyd Romaine Bishop ,  Marvin Bryce Traweek ,  Richard J. Ross ,  David J. Walker ,  DeWayne M. Turner

IPC: E21B34/14

CPC classification number: E21B34/06 ,  E21B34/14

Abstract: The present invention provides a bi-directional ball seat and method of use. In at least one embodiment, the present invention provides a fluid control system that includes a radial protrusion that can be selectively engaged and disengaged upstream and/or from a ball seat. For example, a ball can be placed in a passageway, engaged with a downstream ball seat, and the radial protrusion radially extended into the passageway distally from the seat relative to the ball. A reverse movement of the ball is restricted by the active radial movement of the radial protrusion into the passageway. The control system can be used to control a variety of tools associated with the well. Without limitation, the tools can include crossover tools, sleeves, packers, safety valves, separators, gravel packers, perforating guns, decoupling tools, valves, and other tools know to those with ordinary skills in the art.

Abstract translation: 本发明提供一种双向球座及其使用方法。 在至少一个实施例中，本发明提供了一种流体控制系统，其包括可以选择性地在球座上游和/或从球座接合和脱离的径向突起。 例如，球可以放置在与下游球座接合的通道中，并且径向突出部径向延伸到通道中远离座位相对于球。 球的反向运动受到径向突起进入通道的主动径向运动的限制。 控制系统可用于控制与井相关的各种工具。 不限于此，工具可以包括交叉工具，套筒，封隔器，安全阀，分离器，砾石封隔器，穿孔枪，去耦工具，阀门以及本领域普通技术人员所熟知的其它工具。

公开(公告)号：US06863703B2

公开(公告)日：2005-03-08

申请号：US10135432

申请日：2002-04-30

Applicant: Mikhail Maryamchik ,  Felix Belin ,  David J. Walker ,  Donald L. Wietzke

Inventor： Mikhail Maryamchik ,  Felix Belin ,  David J. Walker ,  Donald L. Wietzke

IPC: B01D45/12 ,  B01J8/00 ,  B01J8/38 ,  F23C10/10 ,  F23J15/02 ,  F27B15/08

CPC classification number: F23J15/027 ,  B01D45/12 ,  B01J8/005 ,  B01J8/0065 ,  B01J8/388 ,  B01J2208/00141 ,  F23C10/10

Abstract: A circulating fluidized bed (CFB) unit utilizing a mechanical dust collector located in a vertical flue above at least one heat exchange surface, and at least partially underneath the floor of a non-vertical flue, includes a plurality of individual collection elements each having a downward bottom outlet for a flow of cleaned gas conveyed through the collection elements.

Abstract translation: 循环流化床（CFB）单元利用位于至少一个热交换表面上方并且至少部分地位于非垂直烟道底部的垂直烟道中的机械除尘器，包括多个单独收集元件，每个收集元件具有 向下的底部出口，用于通过收集元件输送的净化气体流。

公开(公告)号：US06771806B1

公开(公告)日：2004-08-03

申请号：US09648381

申请日：2000-08-25

Applicant: Akella V. S. Satya ,  David L. Adler ,  Bin-Ming Benjamin Tsai ,  David J. Walker

Inventor： Akella V. S. Satya ,  David L. Adler ,  Bin-Ming Benjamin Tsai ,  David J. Walker

IPC: G06K900

CPC classification number: H01L22/34 ,  G01N21/66 ,  G01N21/9501 ,  G01N21/956 ,  G01R31/2884 ,  G01R31/307

Abstract: Disclosed is a method for detecting electrical defects on test structures of a semiconductor die. The test structures includes a plurality of electrically-isolated test structures and a plurality of non-electrically-isolated test structures. The test structures each has a portion located partially within a scan area. The portion of the test structures located within the scan area is scanned to obtain voltage contrast images of the test structures' portions. In a multi-pixel processor, the obtained voltage contrast images are analyzed to determine whether there are defects present within the test structures. In a preferred embodiment, the multi-pixel processor operates with pixel resolution sizes in a range of about 25 nm to 200 nm. In another aspect, the processor operates with a pixel size nominally equivalent to two times a width of the test structure's line width to maximize throughput at optimal signal to noise sensitivity. A computer readable medium having programming instructions for performing the above described methods is also disclosed.

Abstract translation: 公开了一种用于检测半导体管芯的测试结构上的电缺陷的方法。 测试结构包括多个电隔离测试结构和多个非电隔离测试结构。 测试结构各自具有部分位于扫描区域内的部分。 扫描区域内的测试结构部分被扫描，以获得测试结构部分的电压对比度图像。 在多像素处理器中，分析获得的电压对比图像，以确定测试结构内是否存在缺陷。 在优选实施例中，多像素处理器以约25nm至200nm的范围内的像素分辨率尺寸进行操作。 在另一方面，处理器以标称等于测试结构线宽度的两倍的像素大小进行操作，以在最佳信噪比灵敏度下最大化吞吐量。 还公开了一种具有用于执行上述方法的编程指令的计算机可读介质。

公开(公告)号：US06636064B1

公开(公告)日：2003-10-21

申请号：US09648092

申请日：2000-08-25

Applicant: Akella V. S. Satya ,  David L. Adler ,  Neil Richardson ,  Kurt H. Weiner ,  David J. Walker

Inventor： Akella V. S. Satya ,  David L. Adler ,  Neil Richardson ,  Kurt H. Weiner ,  David J. Walker

IPC: G01R3128

CPC classification number: H01L22/34 ,  G01N21/66 ,  G01N21/9501 ,  G01N21/956 ,  G01R31/2884 ,  G01R31/307 ,  H01J2237/2817

Abstract: Disclosed is a semiconductor die having an upper layer and a lower layer. The die includes a lower test structure formed in the lower metal layer of the semiconductor die. The lower conductive test structure has a first end and a second end, wherein the first end is coupled to a predetermined voltage level. The die also has an insulating layer formed over the lower metal layer and an upper test structure formed in the upper metal layer of the semiconductor die. The upper conductive test structure is coupled with the second end of the lower conductive test structure, and the upper metal layer being formed over the insulating layer. The die further includes at least one probe pad coupled with the upper test structure. Preferably, the first end of the lower test structure is coupled to a nominal ground potential. In another implementation, the upper test structure is a voltage contrast element. In another embodiment, a semiconductor die having a scanning area is disclosed. The semiconductor die includes a first plurality of test structures wherein each of the test structures in the first plurality of test structures is located entirely within the scanning area. The die includes a second plurality of test structures wherein each of the test structures in the first plurality of test structures is located only partially within the scanning area. The first plurality of test structures or the second plurality of test structures has a probe pad coupled to at least one test structure.

Abstract translation: 公开了具有上层和下层的半导体管芯。 模具包括形成在半导体管芯的下金属层中的下部测试结构。 下导电测试结构具有第一端和第二端，其中第一端耦合到预定的电压电平。 模具还具有形成在下金属层上的绝缘层和形成在半导体管芯的上金属层中的上测试结构。 上导电测试结构与下导电测试结构的第二端耦合，并且上金属层形成在绝缘层上。 芯片还包括与上测试结构耦合的至少一个探针焊盘。 优选地，下测试结构的第一端耦合到标称接地电位。 在另一实施方案中，上测试结构是电压对比元件。 在另一实施例中，公开了具有扫描区域的半导体管芯。 半导体管芯包括第一多个测试结构，其中第一多个测试结构中的每个测试结构完全位于扫描区域内。 模具包括第二多个测试结构，其中第一多个测试结构中的每个测试结构仅部分地位于扫描区域内。 第一多个测试结构或第二多个测试结构具有耦合到至少一个测试结构的探针焊盘。

公开(公告)号：US06566885B1

公开(公告)日：2003-05-20

申请号：US09648109

申请日：2000-08-25

Applicant: Gustavo A. Pinto ,  Brian C. Leslie ,  David L. Adler ,  Akella V. S. Satya ,  Robert Thomas Long ,  David J. Walker

Inventor： Gustavo A. Pinto ,  Brian C. Leslie ,  David L. Adler ,  Akella V. S. Satya ,  Robert Thomas Long ,  David J. Walker

IPC: G01R3100

CPC classification number: H01L22/34 ,  G01N21/66 ,  G01N21/956 ,  G01N23/04 ,  G01R31/2884 ,  G01R31/307 ,  H01J2237/2817 ,  Y10S977/849

Abstract: A sample is inspected. The sample is scanned in a first direction with at least one particle beam. The sample is scanned in a second direction with at least one particle beam. The second direction is at an angle to the first direction. The number of defects per an area of the sample are found as a result of the first scan, and the position of one or more of the found defects is determined from the second scan. In a specific embodiment, the sample includes a test structure having a plurality of test elements thereon. A first portion of the test elements is exposed to the beam during the first scan to identify test elements having defects, and a second portion of the test elements is exposed during the second scan to isolate and characterize the defect.

Abstract translation: 检查样品。 用至少一个粒子束沿第一方向扫描样品。 用至少一个粒子束在第二个方向上扫描样品。 第二方向与第一方向成一个角度。 作为第一扫描的结果，发现样品的每个区域的缺陷数，并且从第二次扫描确定发现的一个或多个缺陷的位置。 在具体实施例中，样本包括其上具有多个测试元件的测试结构。 测试元件的第一部分在第一次扫描期间暴露于光束以识别具有缺陷的测试元件，并且第二部分测试元件在第二次扫描期间暴露以分离和表征缺陷。