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公开(公告)号：US20210166422A1
公开(公告)日：2021-06-03
申请号：US17102778
申请日：2020-11-24
Applicant: HITACHI, LTD.
Inventor： Hiroaki ITSUJI , Takumi UEZONO , Tadanobu TOBA , Kenichi SHIMBO , Yutaka UEMATSU
Abstract: To detect a discrimination error in a type of an object. A calculation system includes a first device and a second device. The first device includes: a first object map generation unit configured to calculate, using first image information that is image information acquired by the first device, a first object map indicating a type of an object and a position of the object; and a first communication unit configured to transmit the first object map to the second device. The second device includes: a second object map generation unit configured to calculate, using second image information that is image information acquired by the second device, a second object map indicating a type of an object and a position of the object; and a comparison unit configured to compare the first object map and the second object map.
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公开(公告)号：US20170350933A1
公开(公告)日：2017-12-07
申请号：US15535219
申请日：2015-04-24
Applicant: HITACHI, LTD.
Inventor： Yutaka UEMATSU , Hideki OSAKA , Tadanobu TOBA , Kenichi SHIMBO
IPC: G01R31/04 , G01R31/28 , H01L23/00 , H01L25/065 , H01L23/498
CPC classification number: G01R31/041 , G01R31/026 , G01R31/2851 , G01R31/2853 , H01L23/49838 , H01L24/16 , H01L25/0655 , H01L25/0657 , H01L2224/13025 , H01L2224/16146 , H01L2224/16227 , H01L2224/1623 , H01L2224/17181 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2924/15192 , H01L2924/15311
Abstract: Provided is a semiconductor inspection circuit which is capable of inspecting connection states of power supply, ground, and signal bumps in a semiconductor package or a printed circuit board equipped with a semiconductor LSI mounted in a product operation state. As a means to solve the problem, a circuit capable of switching a path is provided at an input portion of a driver/receiver, a mechanism capable of transferring an output of a path switching circuit near a receiver circuit to a voltage waveform circuit with an internal variable terminal is provided, and a breakage state of a bump can be observed in the product operation state by observing a DC level at a terminal having a certain DC resistance when a signal bump connection state is observed and receiving a step wave and observing a response waveform thereof when an IO power supply bump connection state is observed.
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13.发明公开公开(公告)号：US20240338286A1
公开(公告)日：2024-10-10
申请号：US18293901
申请日：2022-09-26
Applicant: HITACHI, LTD.
Inventor： Takumi UEZONO , Hiroaki ITSUJI , Kenichi SHIMBO , Masayoshi TAKAHASHI , Yutaka UEMATSU
IPC: G06F11/20
CPC classification number: G06F11/2028
Abstract: An arithmetic operation target is input to an information processing apparatus which causes an accelerator apparatus to perform an arithmetic operation using the arithmetic operation target. The information processing apparatus performs, regarding each of a plurality of arithmetic operation elements of the arithmetic operation target, whether to allocate one or more diagnostic circuits, which are available processing circuits for an accuracy diagnosis of the arithmetic operation from a plurality of processing circuits in the accelerator apparatus to the arithmetic operation element on the basis of a failure influence degree. The reliability of the information processing apparatus that is used to judge whether or not to continue an action(s) of the information processing apparatus is calculated on the basis of the number of arithmetic operation elements of the arithmetic operation target, the number of arithmetic operation elements to which at least one diagnostic circuit is allocated, and the failure influence degree.
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公开(公告)号：US20220300362A1
公开(公告)日：2022-09-22
申请号：US17539279
申请日：2021-12-01
Applicant: Hitachi, Ltd.
Inventor： Tadanobu TOBA , Kenichi SHIMBO , Yutaka UEMATSU , Takumi UEZONO , Hidetoshi TERAOKA
Abstract: A distributed system includes an edge system as an automatically operable moving body or equipment and a diagnostic data computer capable of communicating with the edge system. The edge system has a mechanism unit for operation, an in-edge controller controlling the mechanism unit, and a diagnostic controller capable of communicating with the in-edge controller via an in-vehicle network. The diagnostic controller acquires diagnostic data in accordance with a first diagnostic sequence set and transmits the diagnostic data to the diagnostic data computer. The diagnostic data computer transmits a diagnostic update notification of update to a second diagnostic sequence set to the diagnostic controller based on the diagnostic data. The diagnostic controller performs update from the first diagnostic sequence set to the second diagnostic sequence set.
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Patent Agency Ranking
公开(公告)号：US20210390795A1
公开(公告)日：2021-12-16
申请号：US17342018
申请日：2021-06-08
Applicant: Hitachi, Ltd.
Inventor： Tadanobu TOBA , Takumi UEZONO , Yutaka UEMATSU , Kenichi SHIMBO
Abstract: A distributed system includes an edge device, which is a moving body or equipment capable of automatic operation, and a diagnostic data computer. The edge device includes a moving mechanism or an operating mechanism for automatic operation, and an in-edge controller that controls the moving mechanism or the operating mechanism. Here, the diagnostic data computer: receives diagnostic data indicating an internal state in the in-edge controller.
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16.发明申请公开(公告)号：US20180149695A1
公开(公告)日：2018-05-31
申请号：US15576144
申请日：2016-04-06
Applicant: HITACHI, LTD.
Inventor： Takumi UEZONO , Tadanobu TOBA , Kenichi SHIMBO , Fumihiko NAGASAKI
IPC: G01R31/28 , G01R31/26 , G01R31/265 , G01R31/303
CPC classification number: G01R31/2881 , G01R31/2601 , G01R31/265 , G01R31/303 , G01R31/31816
Abstract: Neutron soft error rate derivation is calculated from data at the low energy neutron radiation. An outline value of an SEU cross-section function corresponding to a given neutron energy value is outputted. This outline value and the low energy neutron spectrum data are used to calculate an error count basic value of errors to occur over time. An error count actual measurement value over time is calculated from an error count during radiation of low energy neutrons and low energy neutron radiation time. The error count basic value and the error count actual measurement are used to calculate a proportionality coefficient of the SEU cross-section function. While holding a natural neutron spectrum, an error rate calculator outputs a neutron flux corresponding to a neutron energy value. The neutron soft error rate is calculated by an integration operation of multiplying the SEU cross-section function with the natural neuron spectrum.
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公开(公告)号：US20160085605A1
公开(公告)日：2016-03-24
申请号：US14787559
申请日：2013-05-24
Applicant: HITACHI, LTD.
Inventor： Kenichi SHIMBO , Tadanobu TOBA , Takumi UEZONO
IPC: G06F11/07
CPC classification number: G06F11/076 , G06F11/008 , G06F11/0736 , G06F17/5045 , G06F2217/70
Abstract: For a soft error of an electronic device, a technique capable of ensuring high reliability because of a low soft error rate (SER) is provided. By using building data including information of a structural object of a building and facility data including information of a plurality of facilities including an electronic device arranged in the building, a SER calculating device calculates a model including an attenuation index value representing a degree of attenuation of radiation entering the building attenuated by the structural object of the building until the radiation reaches a position of the facility arranged in the building, calculates a SER at each position of the facility arranged in the building by using the model including the attenuation index value, and outputs information including the SER at each position of the facility.
Abstract translation: 对于电子设备的软错误，提供了由于软错误率（SER）而能够确保高可靠性的技术。 通过使用建筑物数据，包括建筑物的结构对象的信息和包括包括布置在建筑物中的电子设备的多个设施的信息的设施数据，SER计算装置计算包括表示衰减程度的衰减指数值的模型 进入建筑物的辐射被建筑物的结构物体衰减，直到辐射到达布置在建筑物内的设施的位置，通过使用包括衰减指数值的模型计算在建筑物中布置的设施的每个位置处的SER，以及 在设施的每个位置输出包括SER的信息。
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公开(公告)号：US20250103036A1
公开(公告)日：2025-03-27
申请号：US18728289
申请日：2022-11-10
Applicant: Hitachi, Ltd.
Inventor： Shuichi NISHINO , Kenichi SHIMBO , Yutaka UEMATSU
IPC: G05B23/02
Abstract: In an abnormality diagnosis device which estimates an abnormality degree, an abnormality factor, and the like of a target from data, a description of a diagnosis reason is presented in association with diagnosis knowledge of an operator, so that the operator can easily understand the description presentation. Therefore, the abnormality diagnosis device includes an abnormality diagnosis unit which diagnoses an abnormality of a diagnosis target using data related to the diagnosis target as an input, a description presentation unit which presents a description corresponding to the abnormality of the diagnosis target based on a result of diagnosis by the abnormality diagnosis unit, and a display unit which displays the description corresponding to the abnormality of the diagnosis target presented by the description presentation unit on a screen.
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公开(公告)号：US20240004747A1
公开(公告)日：2024-01-04
申请号：US18201915
申请日：2023-05-25
Applicant: Hitachi, Ltd.
Inventor： Shuichi NISHINO , Yutaka UEMATSU , Tadanobu TOBA , Kenichi SHIMBO , Takumi UEZONO
CPC classification number: G06F11/079 , G06F11/0721 , G06N5/02
Abstract: It is possible to achieve a more accurate failure diagnosis by obtaining explicit knowledge having high comprehensiveness that can be applied to a failure diagnosis based on knowledge across a plurality of areas. A processor system includes: one or more processors; and one or more memory resources. The memory resource is configured to store a diagnostic program configured to diagnose an electronic system including a mobile body or equipment, and a plurality of knowledge graphs for use in the diagnostic program and including at least a first knowledge graph and a second knowledge graph created based on domain knowledge different from that of the first knowledge graph, and the processor is configured to execute the diagnostic program to (1) evaluate a semantic similarity between a first knowledge item included in the first knowledge graph and a second knowledge item included in the second knowledge graph, and (2) generate, when the similarity satisfies a predetermined condition, an integrated graph in which the first knowledge graph and the second knowledge graph are integrated.
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