公开(公告)号：US20140286824A1

公开(公告)日：2014-09-25

申请号：US14352192

申请日：2012-10-12

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Akihiro Yasui ,  Yoshihiro Suzuki ,  Hitoshi Tokieda

IPC: G01N35/10

CPC classification number: G01N35/0092 ,  G01N35/025 ,  G01N35/04 ,  G01N35/1002 ,  G01N35/1009 ,  G01N2035/0094 ,  G01N2035/0413 ,  G01N2035/0444 ,  G01N2035/1032

Abstract: An automated analyzer maintains high processing capacity and dispensation accuracy even when items requiring dilution/pretreatment and general reaction measurement are mixed. A plurality of sample dispensing mechanisms are independently driven and each include a sample collection position, a sample nozzle for collecting the sample, and a washing tank for washing the sample nozzle. The sample dispensing mechanisms are configured to collect the sample from a plurality of sample collection positions and are operated independently to perform sample dispensation into reaction containers on a reaction disc. At least one of the sample dispensing mechanisms is provided for each of a sample requiring dilution/pretreatment and a sample that does not require dilution/pretreatment. The automated analyzer is provided with a control means for causing the respective mechanisms to be operated in a dedicated manner. The sample is dispensed such that no vacancy is created in the reaction containers.

Abstract translation: 即使在需要稀释/预处理和一般反应测量的物品混合的情况下，自动分析仪也能保持高处理能力和分配精度。 多个样品分送机构被独立地驱动，并且各自包括样品收集位置，用于收集样品的样品喷嘴和用于清洗样品喷嘴的洗涤槽。 样品分配机构被配置为从多个样品收集位置收集样品，并且独立地操作以将样品分配进行到反应盘上的反应容器中。 为需要稀释/预处理的样品和不需要稀释/预处理的样品中的每一个提供至少一个样品分配机构。 自动分析装置设置有用于使各机构以专用方式操作的控制装置。 分配样品使得在反应容器中不产生空位。

公开(公告)号：US11268971B2

公开(公告)日：2022-03-08

申请号：US16476884

申请日：2018-01-31

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Akihisa Makino ,  Masashi Akutsu ,  Hiroyuki Mishima ,  Akihiro Yasui

IPC: G01N35/00 ,  G01N35/02 ,  A61B5/00 ,  G01F23/00 ,  G01N1/22 ,  G01N21/00 ,  G01N33/48 ,  G01N35/04 ,  G01N35/10

Abstract: An automated analyzer is provided with one or more dispensing lines 109, 209 that are each for loading and unloading, at one end thereof, a sample rack 101 having placed therein one or more sample containers accommodating a sample for analysis and for conveying the sample rack back and forth from a dispensing position for dispensing the sample from the sample containers and sample rack removal parts 111, 211 that are provided adjacent to the other ends of the dispensing lines 109, 209 and provide and receive sample racks to and from the dispensing lines 109, 209. According to this configuration, it is possible to convey an urgent sample while suppressing device complexity, preventing cost from increasing, and also maintaining speed.

公开(公告)号：US11041874B2

公开(公告)日：2021-06-22

申请号：US16086085

申请日：2017-01-31

Applicant: Hitachi High-Technologies Corporation

Inventor： Saori Chida ,  Yoichi Aruga ,  Akihiro Yasui ,  Yoshiki Muramatsu ,  Yoko Inoue ,  Hideto Tamezane

IPC: G01N35/10 ,  G01N21/59 ,  G01N35/04 ,  G01N35/00

Abstract: The automatic analyzer includes: a member to be washed, such as a probe or a stirrer for contacting and stirring a liquid; a wash station in which the member to be washed is washed with a washing liquid; and a measuring part that measures an optical characteristic of an evaluation reagent contained in a reaction cell. A control unit brings the member to be washed that has been washed in the wash station into contact with the evaluation reagent, causes the measuring part to measure the optical characteristic after contact with the evaluation reagent, and calculates the amount of the washing liquid carried into the reaction cell by the member to be washed, based on the measured optical characteristic.

公开(公告)号：US10302668B2

公开(公告)日：2019-05-28

申请号：US15109475

申请日：2015-01-05

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Akihiro Yasui ,  Yoshihiro Suzuki ,  Kazuhiro Nakamura ,  Hitoshi Tokieda

IPC: G01N35/10 ,  G01N35/04

Abstract: In a case where a sample container 15 has a rubber-made lid 35, if a sample nozzle descends and comes into contact with the lid, the sample nozzle is relatively moved inside an arm as far as a lid detection distance, and a detector detects a detection plate. A fact that the sample nozzle comes into contact with the lid is stored together with position information of the sample nozzle, into an operation commanding unit. The sample nozzle further continues to descend, and a suction operation of a sample is performed at a predetermined position. In a case where the sample nozzle collides with a frame portion of the lid and external force is applied thereto, the detector detects that the detection plate is relatively moved as far as the detection distance.

公开(公告)号：US20150204895A1

公开(公告)日：2015-07-23

申请号：US14418614

申请日：2013-07-25

Applicant: Hitachi High-Technologies Corporation

Inventor： Akihiro Yasui ,  Hitoshi Tokieda ,  Toshihide Orihashi ,  Yoshiaki Saito ,  Naoto Suzuki

IPC: G01N35/02 ,  G01N35/00

CPC classification number: G01N35/025 ,  G01N35/00584 ,  G01N35/1004

Abstract: An automatic analyzer is capable of ensuring sufficient nozzle cleaning and suppressing of deterioration in the accuracy of analysis. When it is judged that there remains no analysis item of the sample, a judgment is made on whether the sample dispensation quantity of the n-th sample dispensation is less than a dispensation quantity threshold value or not, and if less, a cleaning pattern is selected by making a judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value. If the sample dispensation quantity of the n-th sample dispensation is the dispensation quantity threshold value or more, another cleaning pattern selected by making the judgment on whether or not all the sample dispensation quantities of the first through (n−1)-th sample dispensations are less than the dispensation quantity threshold value.

Abstract translation: 自动分析仪能够确保足够的喷嘴清洁和抑制分析精度的劣化。 当判断不存在样品的分析项目时，判断第n个样品分配的样品分配量是否小于分注量阈值，如果更少，则清洁图案是 通过判断第一至第（n-1）个样品分配的所有样品分配量是否小于分配量阈值来选择。 如果第n个样品分配的样品分配量是分配量阈值以上，则通过对第1〜第（n-1）个样品的全部样品分注量进行判断而选择的另一清洗图案 分配量小于分配量阈值。