SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS
    14.
    发明申请
    SURFACE FORCE APPARATUS BASED ON A SPHERICAL LENS 有权
    基于球面镜的表面力装置

    公开(公告)号:US20170074733A1

    公开(公告)日:2017-03-16

    申请号:US14850146

    申请日:2015-09-10

    CPC classification number: G01L1/24 G01B11/161

    Abstract: A force detector and method for using the same includes a movable lens having a spherical surface; a cantilever below the movable lens; a laser above the movable lens configured to emit a beam of light through the movable lens, such that light reflects from the spherical surface and the cantilever; a camera configured to capture images of interference rings produced by the light reflected from the spherical surface and the light reflected from the cantilever; and a processor configured to determine a force between the movable lens and the cantilever based on a change in phase of the interference rings.

    Abstract translation: 力检测器及其使用方法包括:具有球面的可动透镜; 可移动镜片下方的悬臂; 可动透镜上方的激光被配置为通过可移动透镜发射光束,使得光从球面和悬臂反射; 配置为捕获由从球形表面反射的光和从悬臂反射的光产生的干涉环的图像的照相机; 以及处理器,其被配置为基于所述干扰环的相位变化来确定所述可移动透镜和所述悬臂之间的力。

    SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND POST-DETECTION IMAGE CORRECTION
    15.
    发明申请
    SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND POST-DETECTION IMAGE CORRECTION 有权
    扫描传输具有多个像素的电子显微镜和后检测图像校正

    公开(公告)号:US20160300689A1

    公开(公告)日:2016-10-13

    申请号:US14683679

    申请日:2015-04-10

    Inventor: Rudolf M. Tromp

    Abstract: Embodiments are directed to an information processing system for generating a corrected image of a sample. The system includes a detector, a memory communicatively coupled to the detector, and a post-detection image processor communicatively coupled to the memory and the detector. The detector is configured to detect data of a plurality of moving particles, wherein the data of the plurality of moving particles correspond to an uncorrected image of the sample, and wherein the uncorrected image includes defocus, astigmatism and spherical aberration. The post-detection image processor is configured to generate a corrected image of the sample based at least in part on processing the detected data of the plurality of moving particles.

    Abstract translation: 实施例涉及用于产生样本的校正图像的信息处理系统。 该系统包括检测器,通信地耦合到检测器的存储器,以及通信地耦合到存储器和检测器的后检测图像处理器。 检测器被配置为检测多个移动粒子的数据,其中多个移动粒子的数据对应于样本的未校正图像,并且其中未校正的图像包括散焦,散光和球面像差。 后检测图像处理器被配置为至少部分地基于处理多个移动粒子的检测数据来生成样本的校正图像。

    Measuring spherical and chromatic aberrations in cathode lens electrode microscopes

    公开(公告)号:US10593510B2

    公开(公告)日:2020-03-17

    申请号:US16294017

    申请日:2019-03-06

    Inventor: Rudolf M. Tromp

    Abstract: An electron microscope system and a method of measuring an aberration of the electron microscope system are disclosed. A method of controlling an aberration of an electron microscope includes obtaining a dispersed energy distribution for electrons at a diffraction plane of the electron microscope and placing an aperture at a selected location of the dispersed energy distribution in the diffraction plane. The method measures displacement of an image of the aperture in an image plane of the electron microscope for the selected location of the aperture. The method determines an aberration coefficient of the electron microscope from the measured displacement and the selected location of the aperture and alters a parameter of an element of the electron microscope to control the aberration of the electron microscope based at least in part on the determined aberration coefficient.

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