Polymers, resist compositions and patterning process
    16.
    发明授权
    Polymers, resist compositions and patterning process 有权
    聚合物,抗蚀剂组合物和图案化工艺

    公开(公告)号:US06436606B1

    公开(公告)日:2002-08-20

    申请号:US09650408

    申请日:2000-08-29

    IPC分类号: C08F22202

    摘要: Polymers comprising recurring units of formula (1) and recurring units having acid labile groups are novel. At least one of R1 and R2 is fluorine or a trifluoromethyl group, and the remainder is hydrogen or a C1-20 alkyl, R3 and R4 each are hydrogen or an unsubstituted or fluorine-substituted C1-20 alkyl, or R3 and R4 may form a ring. Using such polymers, resist compositions featuring transparency to excimer laser light and alkali solubility are obtained.

    摘要翻译: 包含式(1)的重复单元的聚合物和具有酸不稳定基团的重复单元是新的.R 1和R 2中的至少一个是氟或三氟甲基,其余是氢或C 1-20烷基,R 3和R 4各自是 氢或未取代或氟取代的C 1-20烷基,或者R 3和R 4可以形成环。 使用这种聚合物,获得具有对准分子激光的透明度和碱溶性的抗蚀剂组合物。

    Resist top coat composition and patterning process
    19.
    发明授权
    Resist top coat composition and patterning process 有权
    抵抗面漆组合和图案化工艺

    公开(公告)号:US08088537B2

    公开(公告)日:2012-01-03

    申请号:US12320183

    申请日:2009-01-21

    IPC分类号: G03F7/26 G03F7/11 C08L33/02

    CPC分类号: G03F7/11 G03F7/2041

    摘要: The present invention relates to a resist top coat composition and a patterning process adopting such a material, which resist top coat composition is provided for forming a top coat on a photoresist film so as to protect the photoresist film, in liguid immersion photolithography. The present invention provides a resist top coat composition for forming a top coat on a photoresist film, wherein the resist top coat composition comprises, at least: a polymer I including a repeating unit a represented by the following general formula (1); and a polymer II including repeating unit having a sulfonic acid or an amine salt of a sulfonic acid:

    摘要翻译: 本发明涉及一种抗蚀剂面漆组合物和采用这种材料的图案化方法,其抗蚀面漆组合物用于在光致抗蚀剂膜上形成顶涂层以保护光致抗蚀剂膜,在液体浸渍光刻中。 本发明提供了一种用于在光致抗蚀剂膜上形成顶涂层的抗蚀剂面漆组合物,其中抗蚀剂面漆组合物至少包含:包含由以下通式(1)表示的重复单元的聚合物I; 和包含具有磺酸或磺酸胺盐的重复单元的聚合物II:

    RESIST COMPOSITION AND PATTERNING PROCESS
    20.
    发明申请
    RESIST COMPOSITION AND PATTERNING PROCESS 有权
    耐腐蚀组合物和方法

    公开(公告)号:US20100136482A1

    公开(公告)日:2010-06-03

    申请号:US12628794

    申请日:2009-12-01

    IPC分类号: G03F7/20 G03F7/004

    摘要: A resist composition is provided comprising (A) an additive polymer of acyl-protected hexafluoroalcohol structure, (B) a base polymer having a structure derived from lactone ring, hydroxyl group and/or maleic anhydride, the base polymer becoming soluble in alkaline developer under the action of acid, (C) a photoacid generator, and (D) an organic solvent. The additive polymer is transparent to radiation of wavelength up to 200 nm, and its properties can be tailored by a choice of the polymer structure.

    摘要翻译: 提供了抗蚀剂组合物,其包含(A)酰基保护的六氟醇结构的添加剂聚合物,(B)具有衍生自内酯环,羟基和/或马来酸酐的结构的基础聚合物,所述基础聚合物在碱性显影剂中变得可溶 酸的作用,(C)光致酸发生剂,和(D)有机溶剂。 添加剂聚合物对波长高达200nm的辐射是透明的,并且其性质可以通过选择聚合物结构来定制。