RESIST COMPOSITION AND PATTERNING PROCESS
    5.
    发明申请
    RESIST COMPOSITION AND PATTERNING PROCESS 有权
    耐腐蚀组合物和方法

    公开(公告)号:US20100136482A1

    公开(公告)日:2010-06-03

    申请号:US12628794

    申请日:2009-12-01

    IPC分类号: G03F7/20 G03F7/004

    摘要: A resist composition is provided comprising (A) an additive polymer of acyl-protected hexafluoroalcohol structure, (B) a base polymer having a structure derived from lactone ring, hydroxyl group and/or maleic anhydride, the base polymer becoming soluble in alkaline developer under the action of acid, (C) a photoacid generator, and (D) an organic solvent. The additive polymer is transparent to radiation of wavelength up to 200 nm, and its properties can be tailored by a choice of the polymer structure.

    摘要翻译: 提供了抗蚀剂组合物,其包含(A)酰基保护的六氟醇结构的添加剂聚合物,(B)具有衍生自内酯环,羟基和/或马来酸酐的结构的基础聚合物,所述基础聚合物在碱性显影剂中变得可溶 酸的作用,(C)光致酸发生剂,和(D)有机溶剂。 添加剂聚合物对波长高达200nm的辐射是透明的,并且其性质可以通过选择聚合物结构来定制。