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公开(公告)号：US20090172488A1
公开(公告)日：2009-07-02
申请号：US12340549
申请日：2008-12-19
IPC分类号： G01R31/3187
CPC分类号： G01R31/318533
摘要： A semiconductor device includes a test target circuit; scan chains that enable scanning of the test target circuit; a first random number generation circuit that forms test patterns supplied to the scan chains; a second random number generation circuit that is provided separately from the first random number generation circuit; and a random number control circuit that uses the random numbers generated by the second random number generation circuit to change the random numbers generated by the first random number generation circuit. In a test of the semiconductor device, since a period of a clock of a scan chain does not need to be longer than that of a clock of a pattern generator, the number of clocks of the pattern generator needed for a test can be prevented from increasing. Accordingly, a test time can be prevented from increasing.
摘要翻译： 半导体器件包括测试目标电路; 可扫描测试目标电路的扫描链; 形成提供给扫描链的测试图案的第一随机数生成电路; 与第一随机数生成电路分开设置的第二随机数生成电路; 以及使用由第二随机数生成电路产生的随机数来改变由第一随机数生成电路产生的随机数的随机数控制电路。 在半导体器件的测试中，由于扫描链的时钟周期不需要长于模式发生器的时钟周期，因此可以防止测试所需的模式发生器的时钟数 增加。 因此，可以防止测试时间增加。
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12.发明授权公开(公告)号：US06922803B2
公开(公告)日：2005-07-26
申请号：US09811435
申请日：2001-03-20
申请人： Michinobu Nakao , Kazumi Hatayama , Koichiro Natsume , Yoshikazu Kiyoshige , Masaki Kouno , Masato Hamamoto , Hidefumi Yoshida , Tomoji Nakamura
发明人： Michinobu Nakao , Kazumi Hatayama , Koichiro Natsume , Yoshikazu Kiyoshige , Masaki Kouno , Masato Hamamoto , Hidefumi Yoshida , Tomoji Nakamura
IPC分类号： G01R31/28 , G01R31/3183 , G06F11/22 , G11C29/10 , G06F11/00
CPC分类号： G01R31/3183 , G11C29/10
摘要： A semiconductor integrated circuit test method which reduces the required data volume for testing and efficiently detects faults in a circuit to be tested, the method comprising means 110 to generate identical pattern sequences repeatedly and means 120 to control flipped bits in pattern sequences, in order to generate neighborhood pattern sequences and use the neighborhood patterns to test the circuit under test 130. The neighborhood patterns include, in whole or in part, such pattern sequences as ones without flipped bits, ones with all or some flipped bits in one pattern and ones with all or some flipped bits in consecutive patterns or patterns at regular intervals, the interval being equivalent to a given number of patterns. Because a test pattern generator is provided independently of the circuit to be tested, the problem of a prolonged design period can be eliminated, a loss in the operating speed of the circuit under test is minimized and a high fault coverage can be achieved with less hardware overhead and a smaller volume of test data.
摘要翻译： 一种半导体集成电路测试方法，其减少测试所需的数据量并有效地检测要测试的电路中的故障，该方法包括重复生成相同模式序列的装置110，以及以模式序列控制翻转位的装置120，以便 生成邻域模式序列并使用邻域模式来测试被测电路130。 相邻图案全部或部分地包括没有翻转位的图案序列，一个具有一个图案中的全部或一些翻转位的图案序列，以及以规则间隔连续的图案或图案中的全部或一些翻转的位， 相当于给定数量的图案。 由于测试模式发生器独立于要测试的电路提供，可以消除延长设计周期的问题，使被测电路的工作速度损失最小化，并且可以通过较少的硬件实现高故障覆盖 开销和较小量的测试数据。
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公开(公告)号：US4932249A
公开(公告)日：1990-06-12
申请号：US423662
申请日：1989-10-18
申请人： Kazuhiro Nakamura , Ryoji Sawada , Tomoji Nakamura
发明人： Kazuhiro Nakamura , Ryoji Sawada , Tomoji Nakamura
摘要： A speedometer form watercraft wherein a speed signal is derived from a water pressure signal which is transmitted to the indicator through a conduit so that long electrical lines are not required.
摘要翻译： 一种速度计形式的船舶，其中速度信号是从水压信号导出的，该水压信号通过导管传递到指示器，使得不需要长的电线。
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公开(公告)号：US08037384B2
公开(公告)日：2011-10-11
申请号：US12340549
申请日：2008-12-19
IPC分类号： G01R31/28
CPC分类号： G01R31/318533
摘要： A semiconductor device includes a test target circuit; scan chains that enable scanning of the test target circuit; a first random number generation circuit that forms test patterns supplied to the scan chains; a second random number generation circuit that is provided separately from the first random number generation circuit; and a random number control circuit that uses the random numbers generated by the second random number generation circuit to change the random numbers generated by the first random number generation circuit. In a test of the semiconductor device, since a period of a clock of a scan chain does not need to be longer than that of a clock of a pattern generator, the number of clocks of the pattern generator needed for a test can be prevented from increasing. Accordingly, a test time can be prevented from increasing.
摘要翻译： 半导体器件包括测试目标电路; 可扫描测试目标电路的扫描链; 形成提供给扫描链的测试图案的第一随机数生成电路; 与第一随机数生成电路分开设置的第二随机数生成电路; 以及使用由第二随机数生成电路产生的随机数来改变由第一随机数生成电路产生的随机数的随机数控制电路。 在半导体器件的测试中，由于扫描链的时钟周期不需要长于模式发生器的时钟周期，因此可以防止测试所需的模式发生器的时钟数 增加。 因此，可以防止测试时间增加。
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15.发明申请公开(公告)号：US20070267735A1
公开(公告)日：2007-11-22
申请号：US11706347
申请日：2007-02-15
申请人： Yuji Awano , Masataka Mizukoshi , Taisuke Iwai , Tomoji Nakamura
发明人： Yuji Awano , Masataka Mizukoshi , Taisuke Iwai , Tomoji Nakamura
IPC分类号： H01L23/48
CPC分类号： H01L23/49811 , H01L21/6835 , H01L23/49877 , H01L24/03 , H01L24/11 , H01L24/12 , H01L24/16 , H01L24/72 , H01L24/73 , H01L24/90 , H01L24/91 , H01L2224/03505 , H01L2224/0401 , H01L2224/11003 , H01L2224/13078 , H01L2224/13099 , H01L2224/16225 , H01L2224/32225 , H01L2224/73204 , H01L2224/81901 , H01L2224/81904 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01022 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/0105 , H01L2924/01079 , H01L2924/014 , Y10S977/72 , Y10S977/721 , Y10S977/722 , Y10S977/762 , Y10S977/763 , Y10S977/766 , Y10S977/784 , Y10S977/932 , Y10S977/936 , Y10S977/937 , Y10S977/938 , Y10S977/963 , H01L2924/00 , H01L2224/72
摘要： A plurality of conductive pads (2) are formed on a mounting surface of a mounting board. Conductive pads (11) are formed on a principal surface of a semiconductor chip (10) at positions corresponding to the conductive pads of the mounting board, when the principal surface faces toward the mounting board. A plurality of conductive nanotubes (12) extend from the conductive pads of one of the mounting board and the semiconductor chip. A press mechanism (3) presses the semiconductor chip against the mounting board and restricts a position of the semiconductor chip on the mounting surface to mount the semiconductor chip on the mounting board, in a state that tips of the conductive nanotubes are in contact with the corresponding conductive pads not formed with the conductive nanotubes.
摘要翻译： 多个导电焊盘（2）形成在安装板的安装表面上。 当主表面朝向安装板时，导电焊盘（11）在与安装板的导电焊盘相对应的位置处形成在半导体芯片（10）的主表面上。 多个导电纳米管（12）从安装板和半导体芯片之一的导电焊盘延伸。 按压机构（3）将半导体芯片压靠在安装基板上，并将半导体芯片的位置限制在安装面上，以将半导体芯片安装在安装基板上，导电性纳米管的尖端与 不形成导电纳米管的相应的导电焊盘。
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公开(公告)号：US06830038B2
公开(公告)日：2004-12-14
申请号：US10477239
申请日：2004-04-30
IPC分类号： F02M5100
CPC分类号： F02D41/126 , F01N3/225 , F02D41/061 , F02D41/068 , F02D41/123 , F02D41/187 , F02D41/34 , F02D2200/0406 , Y02T10/44
摘要： To provide a fuel cutoff control method for an engine including a secondary air introducing system, capable of preventing afterburning in an exhaust pipe at the time of fuel being cut off in a decelerating state of the engine. A fuel cutoff control method during deceleration of an engine including a secondary air introducing pipe connected to an exhaust pipe, and an air cut valve provided on the secondary air introducing pipe, the method comprising a determination step of determining under predetermined condition's whether or not the engine is in a decelerating state, wherein in the decelerating state, a greater amount of fuel than a normally required amount of fuel flow is supplied during a predetermined period of time after the start of deceleration, and then fuel is cut off after the predetermined period of time has elapsed.
摘要翻译： 提供一种用于包括二次空气引入系统的发动机的燃料切断控制方法，其能够防止在发动机的减速状态下燃料被切断时在排气管中的后燃烧。一种减速期间的燃料切断控制方法 发动机，其包括连接到排气管的二次空气引入管和设置在二次空气导入管上的空气切断阀，该方法包括确定步骤，在预定条件下确定发动机是否处于减速状态，其中， 减速状态下，在减速开始后的规定时间内供给比通常要求的燃料流量大的燃料量，然后经过规定时间后燃料被切断。
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公开(公告)号：US4956997A
公开(公告)日：1990-09-18
申请号：US257707
申请日：1988-10-14
CPC分类号： G01P5/14
摘要： A vessel speed detecting device that incorporates an arrangement for providing a more accurate speed indication from a pressure transducer under the condition of abrupt vessel speed changes. The output signal from the pressure transducer is modified under these conditions to provide the more accurate speed indication signal. The abrupt vessel speed change is determined by comparing the output of the speed indicator with a previously memorized speed indication signal. The modified speed indication is obtained from a memory.
摘要翻译： 一种容器速度检测装置，其包括用于在突然容器速度变化的条件下从压力传感器提供更准确的速度指示的装置。 在这些条件下，来自压力传感器的输出信号被修改，以提供更准确的速度指示信号。 通过将速度指示器的输出与先前存储的速度指示信号进行比较来确定突然的容器速度变化。 从存储器获得修改的速度指示。
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公开(公告)号：US4943777A
公开(公告)日：1990-07-24
申请号：US445895
申请日：1989-12-02
IPC分类号： G08B21/00 , G01R19/165 , G08B21/08 , G01N27/46
CPC分类号： G01R19/16542
摘要： A battery voltage condition indicator in which the battery voltage is periodically sampled and a warning indication is given if the battery voltage falls below a predetermined relatively high value for relatively short periods of time or a predetermined higher voltage value for longer periods of times. In addition, a warning signal is also given in the event an open circuit occurs.
摘要翻译： 电池电压状态指示器，其中电池电压被周期性地取样，并且如果电池电压在相对较短的时间段内低于预定的相对较高的值或较长时间段的预定的较高电压值，则给出警告指示。 此外，在发生开路的情况下也给出警告信号。
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公开(公告)号：US4916644A
公开(公告)日：1990-04-10
申请号：US164513
申请日：1988-03-07
CPC分类号： G01P5/14
摘要： A watercraft speed sensor that drives a speed signal from water pressure generated by the movement of the watercraft through the water. Several embodiments of arrangements are disclosed for obtaining an ambient reference signal which is subtracted from the measured pressure signal in order to obtain a greater degree of accuracy for changes in atmospheric conditions.
摘要翻译： 一种船只速度传感器，可以通过水船运动产生的水压驱动速度信号。 公开了几种实施例的装置，用于获得从测量的压力信号中减去的环境参考信号，以获得更大程度的大气条件变化的准确度。
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公开(公告)号：US4821567A
公开(公告)日：1989-04-18
申请号：US162734
申请日：1988-03-01
申请人： Tomoji Nakamura , Ryoji Sawada , Kazuhiro Nakamura
发明人： Tomoji Nakamura , Ryoji Sawada , Kazuhiro Nakamura
CPC分类号： G01P5/14
摘要： An improved running speed detecting device for a watercraft wherein the speed signal is derived from a water pressure signal. The water pressure signal is transmitted to a voltage signal at different amplification factors at different running speeds so as to provide a greater degree of accuracy throughput the watercraft speed ranges.
摘要翻译： 一种用于船舶的改进的运行速度检测装置，其中速度信号是从水压信号得到的。 水压信号以不同的运行速度以不同的放大系数传输到电压信号，以便提供船舶速度范围的更高程度的精度吞吐量。
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