Signal Detector with Calibration Circuit Arrangement
    11.
    发明申请
    Signal Detector with Calibration Circuit Arrangement 有权
    具有校准电路布置的信号检测器

    公开(公告)号:US20070271054A1

    公开(公告)日:2007-11-22

    申请号:US11383821

    申请日:2006-05-17

    IPC分类号: G06F19/00

    CPC分类号: H04L25/0274 H04L25/0296

    摘要: A signal detector and method detect the presence or absence of an incoming differential signal. The method nullifies the DC off-set of the signal detector so that it can detect a signal within a very narrow window. The common mode levels of the signal and reference paths are used for calibration which is done automatically by use of an embedded algorithm residing in a digital block. The calibration range and resolution are predetermined to cope with the technology, modeling, design methodology and human error.

    摘要翻译: 信号检测器和方法检测输入差分信号的存在或不存在。 该方法使信号检测器的DC偏移无效,使得其可以在非常窄的窗口内检测信号。 信号和参考路径的共模电平用于通过使用位于数字块中的嵌入式算法自动完成的校准。 预定校准范围和分辨率,以应对技术,建模,设计方法和人为错误。

    Dynamic threshold for VCO calibration
    12.
    发明授权
    Dynamic threshold for VCO calibration 有权
    VCO校准的动态阈值

    公开(公告)号:US06949981B2

    公开(公告)日:2005-09-27

    申请号:US10708233

    申请日:2004-02-18

    CPC分类号: H03L7/099 H03L7/10 H03L7/18

    摘要: A voltage controlled oscillator (VCO) is provided which includes a threshold level setting circuit operable to set a lower variable threshold level and to set an upper variable threshold level. The VCO includes a frequency band selection unit operable to adjust a frequency band setting of the VCO to one of a plurality of frequency band settings. The VCO further includes a comparator operable to determine whether a control voltage of the VCO falls between the lower threshold level and the upper threshold level. The VCO further includes a threshold adjustment and calibration circuit operable to maintain the frequency band setting when the control voltage falls between the lower and upper threshold levels. Otherwise, when the control voltage lies below the lower threshold level, the lower threshold level is adjusted downward and the upper threshold level is adjusted upward, and when the control voltage lies above the upper threshold level, the frequency band selection is increased to a next higher frequency band.

    摘要翻译: 提供了一种压控振荡器(VCO),其包括阈值电平设置电路,其可操作以设置较低的可变阈值电平并设置较高的可变阈值电平。 VCO包括频带选择单元,其可操作以将VCO的频带设置调整为多个频带设置中的一个。 VCO还包括比较器,其可操作以确定VCO的控制电压是否落在下阈值电平和上阈值电平之间。 VCO还包括阈值调整和校准电路,其可操作以在控制电压落在下限和上限阈值水平之间时维持频带设置。 否则,当控制电压低于下阈值电平时,下阈值电平向下调整,上阈值电平向上调整,当控制电压高于上阈值电平时,频段选择增加到下一阈值 较高频段。

    DYNAMIC THRESHOLD FOR VCO CALIBRATION
    13.
    发明申请
    DYNAMIC THRESHOLD FOR VCO CALIBRATION 有权
    用于VCO校准的动态阈值

    公开(公告)号:US20050179501A1

    公开(公告)日:2005-08-18

    申请号:US10708233

    申请日:2004-02-18

    CPC分类号: H03L7/099 H03L7/10 H03L7/18

    摘要: A voltage controlled oscillator (VCO) is provided which includes a threshold level setting circuit operable to set a lower variable threshold level and to set an upper variable threshold level. The VCO includes a frequency band selection unit operable to adjust a frequency band setting of the VCO to one of a plurality of frequency band settings. The VCO further includes a comparator operable to determine whether a control voltage of the VCO falls between the lower threshold level and the upper threshold level. The VCO further includes a threshold adjustment and calibration circuit operable to maintain the frequency band setting when the control voltage falls between the lower and upper threshold levels. Otherwise, when the control voltage lies below the lower threshold level, the lower threshold level is adjusted downward and the upper threshold level is adjusted upward, and when the control voltage lies above the upper threshold level, the frequency band selection is increased to a next higher frequency band.

    摘要翻译: 提供了一种压控振荡器(VCO),其包括阈值电平设置电路,其可操作以设置较低的可变阈值电平并设置较高的可变阈值电平。 VCO包括频带选择单元,其可操作以将VCO的频带设置调整为多个频带设置中的一个。 VCO还包括比较器,其可操作以确定VCO的控制电压是否落在下阈值电平和上阈值电平之间。 VCO还包括阈值调整和校准电路,其可操作以在控制电压落在下限和上限阈值水平之间时维持频带设置。 否则,当控制电压低于下阈值电平时,下阈值电平向下调整,上阈值电平向上调整,当控制电压高于上阈值电平时,频段选择增加到下一阈值 较高频段。

    Design structure for CMOS differential rail-to-rail latch circuits
    14.
    发明申请
    Design structure for CMOS differential rail-to-rail latch circuits 审中-公开
    CMOS差分轨到轨锁存电路的设计结构

    公开(公告)号:US20090108885A1

    公开(公告)日:2009-04-30

    申请号:US11982206

    申请日:2007-10-31

    IPC分类号: H03K3/3562 H03K21/00 H03K3/00

    CPC分类号: H03K3/35625

    摘要: A design structure including a CMOS rail-to-rail differential latch is provided in which a plurality of cross-coupled devices pull first and second nodes of the latch to opposite rail-to-rail voltages. Desirably, first and second output isolating elements have inputs coupled to the first and second nodes, the output isolating elements being operable to output versions of the opposite rail-to-rail voltages as a true and a complementary output of the latch. In this way, the true output has a rising edge occurring simultaneously with a falling edge of the complementary output. The complementary output has a rising edge occurring simultaneously with a falling edge of the true output. First and second input isolating elements of the latch have outputs coupled to the first and second nodes, the first and second input isolating elements being operable to apply versions of input signals to the first and second nodes.

    摘要翻译: 提供了包括CMOS轨到轨差分锁存器的设计结构,其中多个交叉耦合器件将闩锁的第一和第二节点拉到相对的轨至轨电压。 期望地,第一和第二输出隔离元件具有耦合到第一和第二节点的输入,输出隔离元件可操作以将相对的轨至轨电压的版本输出为锁存器的真实和互补输出。 以这种方式,真正的输出具有与互补输出的下降沿同时出现的上升沿。 互补输出具有与真实输出的下降沿同时发生的上升沿。 锁存器的第一和第二输入隔离元件具有耦合到第一和第二节点的输出,第一和第二输入隔离元件可操作以将输入信号的版本应用于第一和第二节点。

    Method of testing connectivity using dual operational mode CML latch
    15.
    发明申请
    Method of testing connectivity using dual operational mode CML latch 失效
    使用双操作模式CML锁定测试连接的方法

    公开(公告)号:US20080129329A1

    公开(公告)日:2008-06-05

    申请号:US12002878

    申请日:2007-12-19

    IPC分类号: H03K19/003

    CPC分类号: H03K3/356043

    摘要: A method of testing connectivity through a plurality of dual purpose current mode logic (“CML”) latch circuits connected in a series is provided. Each of the CML latch circuits are operable to latch at least one output signal at a timing in accordance with at least one clock signal and having a mode control device for operating the CML latch circuit as a buffer amplifier when the at least one clock signal is inactive. The method comprises the steps of activating the mode control devices of each of the CML latches to operate each of the CML latches as a buffer; inputting a first signal to a first CML latch of the series; latching an output signal of a second CML latch of the series, the second CML latch being connected at a point in the series downstream from the first CML latch; and determining whether the output signal changes in accordance with a change in the first signal.

    摘要翻译: 提供了通过串联连接的多个双用途电流模式逻辑(“CML”)锁存电路来测试连接性的方法。 每个CML锁存电路可操作以根据至少一个时钟信号在定时锁存至少一个输出信号,并具有一个模式控制装置,用于当至少一个时钟信号为 不活跃 该方法包括以下步骤:激活每个CML锁存器的模式控制装置,以操作每个CML锁存器作为缓冲器; 向所述系列的第一CML锁存器输入第一信号; 锁存串联的第二CML锁存器的输出信号,第二CML锁存器在第一CML锁存器下游的串联点连接; 以及确定所述输出信号是否根据所述第一信号的改变而改变。

    Fast method of I/O circuit placement and electrical rule checking
    16.
    发明授权
    Fast method of I/O circuit placement and electrical rule checking 失效
    快速的I / O电路放置方法和电气规则检查

    公开(公告)号:US06584606B1

    公开(公告)日:2003-06-24

    申请号:US09584416

    申请日:2000-06-01

    IPC分类号: G06F1750

    CPC分类号: G06F17/5036

    摘要: A method of analyzing I/O cell layouts for integrated circuits, such as ASICs, includes defining a proposed I/O cell layout on a selected chip image, providing a set of limit rules for electromigration, IR voltage drop and di/dt noise for the selected chip image, providing characteristics for each I/O cell type used in the proposed I/O cell layout, checking the proposed I/O cell layout by applying the limit rules to the proposed I/O cell layout and reporting all I/O cells used in the proposed I/O cell layout that do not meet the limit rules for the selected chip image.

    摘要翻译: 分析集成电路(例如ASIC)的I / O单元布局的方法包括在所选择的芯片图像上定义所提出的I / O单元布局,为电迁移,IR电压降和di / dt噪声提供一组限制规则 所选择的芯片图像,为所提出的I / O单元布局中使用的每个I / O单元类型提供特征,通过对所提出的I / O单元布局应用限制规则来检查所提出的I / O单元布局,并报告所有I / 在所提出的I / O单元布局中使用的O单元不符合所选芯片图像的限制规则。

    Method of assigning integrated circuit I/O signals in an integrated circuit package
    17.
    发明授权
    Method of assigning integrated circuit I/O signals in an integrated circuit package 有权
    在集成电路封装中分配集成电路I / O信号的方法

    公开(公告)号:US06499134B1

    公开(公告)日:2002-12-24

    申请号:US09615149

    申请日:2000-07-13

    IPC分类号: G06F1750

    CPC分类号: G06F17/5077

    摘要: A method for improving the crosstalk and time-of-flight performance for signals in an integrated circuit with respect to the package-related wiring. I/O pads in the package-related wiring of a logic design meeting specified crosstalk and time-of-flight constraints are identified using a software tool. The tool produces a graphical display in which the identified I/O pads are highlighted. The tool enables a user to graphically manipulate the display to assign, i.e., establish an electrical connection, between I/O circuits corresponding to the signals and the highlighted I/O pads.

    摘要翻译: 一种用于改善集成电路中针对封装相关布线的信号的串扰和飞行时间性能的方法。 使用软件工具识别逻辑设计会议规定的串扰和飞行时间限制的封装相关布线中的I / O焊盘。 该工具产生图形显示,其中识别的I / O焊盘被突出显示。 该工具使得用户能够以图形方式操纵显示器,以分配对应于信号的I / O电路和突出显示的I / O焊盘之间的电连接。

    Testing of digital to analog converters in serial interfaces
    18.
    发明授权
    Testing of digital to analog converters in serial interfaces 失效
    在串行接口中测试数模转换器

    公开(公告)号:US08686884B2

    公开(公告)日:2014-04-01

    申请号:US13586176

    申请日:2012-08-15

    IPC分类号: H03M1/10

    CPC分类号: H03M1/109 H03M1/66

    摘要: A system and method for testing digital to analog converters (DAC) in a serial interface having a comparator to receive an input signal and a local offset signal is disclosed. A first DAC selectably provides one of a global offset to the input signal during a normal mode of operation and a first test signal to the comparator during a test mode of operation. A second DAC selectably provides one of the local offset signals to the comparator during the normal mode of operation and a second test signal to the comparator during the test mode of operation. A test module may cause the first DAC to determine a first test signal to provide to the local offset input of the comparator and may cause the second DAC to incrementally change a test signal provided to the comparator.

    摘要翻译: 公开了一种用于在具有用于接收输入信号和本地偏移信号的比较器的串行接口中测试数模转换器(DAC)的系统和方法。 在操作的正常模式期间,第一DAC可选地提供输入信号的全局偏移中的一个,以及在测试操作模式期间向比较器提供第一测试信号。 第二DAC在正常操作模式期间可选地将一个局部偏置信号提供给比较器,并且在测试操作模式期间将第二测试信号提供给比较器。 测试模块可以使得第一DAC确定第一测试信号以提供给比较器的本地偏移输入,并且可以使得第二DAC递增地改变提供给比较器的测试信号。

    CMOS DIFFERENTIAL RAIL-TO-RAIL LATCH CIRCUITS
    19.
    发明申请
    CMOS DIFFERENTIAL RAIL-TO-RAIL LATCH CIRCUITS 审中-公开
    CMOS差分轨至轨电路

    公开(公告)号:US20080180139A1

    公开(公告)日:2008-07-31

    申请号:US11668137

    申请日:2007-01-29

    IPC分类号: H03K3/356 H03B19/00

    CPC分类号: H03K3/356121 H03K3/35625

    摘要: A CMOS rail-to-rail differential latch is provided in which a plurality of cross-coupled devices pull first and second nodes of the latch to opposite rail-to-rail voltages. Desirably, first and second output isolating elements have inputs coupled to the first and second nodes, the output isolating elements being operable to output versions of the opposite rail-to-rail voltages as a true and a complementary output of the latch. In this way, the true output has a rising edge occurring simultaneously with a falling edge of the complementary output. The complementary output has a rising edge occurring simultaneously with a falling edge of the true output. First and second input isolating elements of the latch have outputs coupled to the first and second nodes, the first and second input isolating elements being operable to apply versions of input signals to the first and second nodes.

    摘要翻译: 提供了CMOS轨对轨差分锁存器,其中多个交叉耦合器件将锁存器的第一和第二节点拉到相对的轨到轨电压。 期望地,第一和第二输出隔离元件具有耦合到第一和第二节点的输入,输出隔离元件可操作以将相对的轨至轨电压的版本输出为锁存器的真实和互补输出。 以这种方式,真正的输出具有与互补输出的下降沿同时出现的上升沿。 互补输出具有与真实输出的下降沿同时发生的上升沿。 锁存器的第一和第二输入隔离元件具有耦合到第一和第二节点的输出,第一和第二输入隔离元件可操作以将输入信号的版本应用于第一和第二节点。

    Dual operational mode CML latch
    20.
    发明授权
    Dual operational mode CML latch 失效
    双操作模式CML锁存器

    公开(公告)号:US07358787B2

    公开(公告)日:2008-04-15

    申请号:US11307923

    申请日:2006-02-28

    IPC分类号: H03K3/289

    CPC分类号: H03K3/356043

    摘要: A dual purpose current mode logic (“CML”) latch circuit is provided which includes a CML latch operable to receive at least a pair of differential input data signals and at least one clock signal. The CML latch is operable to generate at least one output signal in accordance with the states of the pair of input differential data signals. A mode control device is operable to receive a mode control signal to operate the CML latch as a buffer or as a latch. In such way, when the mode control signal is inactive, the CML latch generates and latches the output signal at a timing determined by the at least one clock signal, and when the mode control signal is active the CML latch generates the output signal such that the output signal changes whenever the states of the pair of differential input data signals change.

    摘要翻译: 提供了一种双用途电流模式逻辑(“CML”)锁存电路,其包括可操作以接收至少一对差分输入数据信号和至少一个时钟信号的CML锁存器。 CML锁存器可操作以根据输入差分数据信号对的状态产生至少一个输出信号。 模式控制装置可操作以接收模式控制信号以将CML锁存器作为缓冲器或锁存器操作。 以这种方式,当模式控制信号无效时,CML锁存器产生并以由至少一个时钟信号确定的定时锁存输出信号,并且当模式控制信号有效时,CML锁存器产生输出信号,使得 每当差分输入数据信号对的状态改变时,输出信号就会改变。