GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM

    公开(公告)号:US20220277802A1

    公开(公告)日:2022-09-01

    申请号:US17747598

    申请日:2022-05-18

    Abstract: A replacement block pool for a memory device is established. The replacement block pool comprises one or more valid blocks from a set of valid blocks in the memory device determined based on a constraint defining a minimum number of valid blocks for the memory device. A grown bad block is detected in the memory device. The grown bad block is replaced with a replacement block from the replacement block pool in response to detecting the grown bad block.

    REDUCED PARITY DATA MANAGEMENT
    12.
    发明申请

    公开(公告)号:US20220229728A1

    公开(公告)日:2022-07-21

    申请号:US17712978

    申请日:2022-04-04

    Inventor: Chun Sum Yeung

    Abstract: A method includes receiving, by a memory sub-system, host data to be written to a plurality of blocks of a memory device associated with a memory sub-system, where each of the plurality of blocks are coupled to one of a plurality of word lines of the memory device. The method can further include generating parity data for each word line of the block; dividing the parity data into one of either a first word line parity set or a second word line parity set; generating a reduced parity data set with exclusive or parity values for the first word line parity set and for the second word line parity set; and writing the reduced parity data set in the memory sub-system.

    GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM

    公开(公告)号:US20210391029A1

    公开(公告)日:2021-12-16

    申请号:US16903066

    申请日:2020-06-16

    Abstract: A replacement block pool for a memory device is established. The replacement block pool comprises one or more valid blocks from a set of valid blocks in the memory device determined based on a constraint defining a minimum number of valid blocks for the memory device. A grown bad block is detected in the memory device. The grown bad block is replaced with a replacement block from the replacement block pool in response to detecting the grown bad block.

    Parity protection
    14.
    发明授权

    公开(公告)号:US11106530B2

    公开(公告)日:2021-08-31

    申请号:US16723836

    申请日:2019-12-20

    Abstract: A variety of applications can include apparatus and/or methods that provide parity data protection to data in a memory system for a limited period of time and not stored as permanent parity data in a non-volatile memory. Parity data can be accumulated in a volatile memory for data programmed via a group of access lies having a specified number of access lines in the group. A read verify can be issued to selected pages after programming finishes at the end of programming via the access lines of the group. With the programming of the data determined to be acceptable at the end of programming via the last of the access lines of the group, the parity data in the volatile memory can be discarded and accumulation can begin for a next group having a specified number of access lines. Additional apparatus, systems, and methods are disclosed.

    HYBRID DYNAMIC WORD LINE START VOLTAGE
    16.
    发明公开

    公开(公告)号:US20240282381A1

    公开(公告)日:2024-08-22

    申请号:US18426117

    申请日:2024-01-29

    CPC classification number: G11C16/102 G11C16/08

    Abstract: Methods, systems, and devices for hybrid DWLSV are described. One or more controllers may communicate one or more program commands to a NAND memory device. The memory device may perform program operations that correspond to the program commands communicated by the controller. The memory device may perform the program operations using a word line start voltage. Once the programming operations are complete, the memory device may communicate the lowest word line starting voltage offset associated with performing the program operations to the one or more controllers.

    MANAGING PARTIALLY PROGRAMMED BLOCKS
    17.
    发明公开

    公开(公告)号:US20240256142A1

    公开(公告)日:2024-08-01

    申请号:US18420491

    申请日:2024-01-23

    CPC classification number: G06F3/0613 G06F3/064 G06F3/0679

    Abstract: Methods, systems, and devices for managing partially programmed blocks are described. Based on writing data stored in a first block to a second block, a determination of whether to program the first block into a fully programmed state may be made based on whether the first block is storing the data in the partially programmed state. Based on determining whether to program the first block, the first block may be maintained in the fully programmed state until an erase operation is performed for the first block.

    Reduced parity data management
    18.
    发明授权

    公开(公告)号:US11704196B2

    公开(公告)日:2023-07-18

    申请号:US17712978

    申请日:2022-04-04

    Inventor: Chun Sum Yeung

    Abstract: A method includes receiving, by a memory sub-system, host data to be written to a plurality of blocks of a memory device associated with a memory sub-system, where each of the plurality of blocks are coupled to one of a plurality of word lines of the memory device. The method can further include generating parity data for each word line of the block; dividing the parity data into one of either a first word line parity set or a second word line parity set; generating a reduced parity data set with exclusive or parity values for the first word line parity set and for the second word line parity set; and writing the reduced parity data set in the memory sub-system.

    VOLTAGE THRESHOLD PREDICTION-BASED MEMORY MANAGEMENT

    公开(公告)号:US20230205450A1

    公开(公告)日:2023-06-29

    申请号:US18111213

    申请日:2023-02-17

    CPC classification number: G06F3/0655 G06F3/0604 G06F3/0679

    Abstract: A method includes performing a first read operation involving a set of memory cells using a first voltage, determining a quantity of bits associated with the set of memory cells based on the first read operation, performing a second read operation involving the set of memory cells using a second voltage that is greater than the first voltage when the quantity of bits is above a threshold quantity of bits for the set of memory cells, and performing the second read operation involving the set of memory cells using a third voltage that is less than the first voltage when the quantity of bits is below the threshold quantity of bits for the set of memory cells.

    POWER BEHAVIOR DETECTION IN A MEMORY DEVICE

    公开(公告)号:US20230024177A1

    公开(公告)日:2023-01-26

    申请号:US17959844

    申请日:2022-10-04

    Abstract: A method includes receiving, by a processing device, signaling indicative of a power cycle (PC) to a memory device (MD) having a first signal indicative of a Power On Operation and a second signal indicative of a Power Off Operation, and determining an Average Power On Time (APOT) of the MD based, at least in part, on a quantity of power cycles (n) to the MD over a predetermined time interval (PTI), and for each PC over the PTI, an amount of time between receipt of the first signal and the second signal. A sum of each of the amount of time between receipt of the first signal and the second signal in the PTI provides a total power on time (T) to the MD, and the APOT is equal to T/n. When the APOT is less than (

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