摘要:
Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that are connected in a cascading manner and that each sequentially delay a supplied reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.
摘要:
A jitter measurement apparatus that measures timing jitter of a signal under measurement having a prescribed repeating pattern includes a sampling section that coherently samples the signal under measurement within a prescribed measurement duration; a waveform reconfiguring section that rearranges ordinal ranks of data values sampled by the sampling section to generate a reconfigured waveform that is a reproduction of a waveform of the signal under measurement; an analytic signal generating section that converts the reconfigured waveform into a complex analytic signal; and a jitter measuring section that measures jitter of the signal under measurement based on the analytic signal.
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement having a first pulse generator for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge, a second pulse generator for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance corresponding to timing of the detected boundaries of the data sections, a filter for removing carrier frequency components of said data-signal-under-measurement from first and second pulse signals and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
摘要:
Provided is an evaluation apparatus that evaluates a characteristic of a propagation apparatus propagating a signal, comprising an output signal measuring section that measures a probability density function expressing a probability density distribution of jitter of an output signal passed by the propagation apparatus; an isolating section that isolates at least one of a random component of a jitter component and a deterministic component of the jitter component in the jitter of the output signal, from the probability density function of the jitter of the output signal; and an evaluating section that evaluates the characteristic of the propagation apparatus based on the jitter component isolated by the isolating section.
摘要:
Provided is a jitter measurement apparatus, including a sampling section that samples a signal under measurement having a cycle T, a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values sampled by the sampling section, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform, and a statistical value calculating section that calculates a statistical value of the timing distribution. The sampling section may sample the signal under measurement having the cycle T a certain number of times N while the signal under measurement repeats for M cycles, where M and N are coprime.
摘要:
An oscillator circuit that generates an oscillation signal is provided. The oscillator circuit includes: a voltage controlled oscillator that outputs the oscillation signal with a frequency corresponding to a provided control voltage; and a jitter demodulator that extracts a phase fluctuation component of the oscillation signal outputted by the voltage controlled oscillator and modulates the control voltage according to the phase fluctuation component. The oscillator circuit may further include a low pass filter that removes a frequency component larger than a predetermined cutoff frequency of the control frequency inputted to the voltage controlled oscillator and provides the same to the voltage controlled oscillator.
摘要:
There is provided a jitter amplifier circuit for amplifying jitter included in an input signal. The jitter amplifier circuit includes a distorting circuit that receives the input signal, and distorts a waveform of the input signal so as to generate a harmonic component of the input signal, and a filter that passes, out of the distorted signal output from the distorting circuit, a harmonic component of a certain order which is determined in accordance with an amplification ratio of amplifying the jitter.
摘要:
A jitter measuring apparatus for measuring timing jitter of a signal-under-test is provided, wherein the jitter measuring apparatus includes a pulse generator for outputting a pulse signal of a predetermined pulse width for an edge of the signal-under-test, whose timing jitter is under test; and a jitter measuring sub-unit for extracting the timing jitter on the basis of a duty ratio of each cycle of the signal output by the pulse generator.
摘要:
There is provided a jitter measurement apparatus to measure jitter of a signal under measurement. The jitter measurement apparatus includes a pulse generator that outputs a demodulated signal indicating the jitter of the signal under measurement, by outputting a pulse having a substantially constant pulse width in synchronization with each predetermined edge of the signal under measurement, a DC component detecting section that detects a DC component of the demodulated signal output from the pulse generator, and an adjusting section that adjusts the pulse width of the pulse output from the pulse generator, based on the DC component of the demodulated signal which is detected by the DC component detecting section.
摘要:
Provided is a deterministic component model determining apparatus that determines a type of a deterministic component included in a probability density function supplied thereto, comprising a standard deviation calculating section that calculates a standard deviation of the probability density function; a spectrum calculating section that calculates a spectrum of the probability density function; a null frequency detecting section that detects a null frequency of the spectrum; a theoretical value calculating section that calculates a theoretical value of a spectrum for each of a plurality of predetermined types of deterministic components, based on the null frequency; a measured value calculating section that calculates a measured value of the spectrum for the deterministic component included in the probability density function, based on the standard deviation and the spectrum; and a model determining section that determines the type of the deterministic component included in the probability density function to be the type of deterministic component corresponding to a theoretical value closest to the measured value, from among the theoretical values for the plurality of types of deterministic components.