摘要:
A pattern generator generates a pattern signal which represents a test signal to be supplied to a DUT. A driver generates a test signal having a level that corresponds to the pattern signal, and outputs the test signal thus generated to the DUT. A voltage modulator changes, in a predetermined voltage range, the voltage level of the test signal output from the driver DR.
摘要:
Provided is a jitter injection circuit that generates a jittery signal including jitter, including a plurality of delay circuits that receive a supplied reference signal in parallel and that each delay the received reference signal by a preset delay amount and a signal generating section that generates each edge of the jittery signal according to a timing of the signal output by each delay circuit. In the jitter injection circuit the delay amount of at least one delay circuit is set to be a value different from an integer multiple of an average period of the jittery signal.
摘要:
There is provided a deterministic component model identifying apparatus for determining a type of a deterministic component contained in a probability density function supplied thereto. The deterministic component model identifying apparatus includes a spectrum calculating section that calculates a spectrum of the probability density function on an axis of a predetermined variable, a null value detecting section that detects a null value on the axis of the predetermined variable in the calculated spectrum, a theoretical value calculating section that calculates a theoretical value of a spectrum of the deterministic component in association with each of a plurality of predetermined deterministic component types, based on the null value detected by the null value detecting section, and a model determining section that determines, as the type of the deterministic component contained in the probability density function, a deterministic component type associated with a logarithmic magnitude spectrum difference most similar to a logarithmic magnitude spectrum of a Gaussian distribution, where the logarithmic magnitude spectrum difference is produced by subtracting the theoretical value of the spectrum of the deterministic component calculated in association with each of the plurality of predetermined deterministic component types from the spectrum calculated by the spectrum calculating section.
摘要:
There is provided a jitter measurement apparatus for measuring a jitter of a data signal having a substantially constant data rate. The jitter measurement apparatus includes therein a signal converting section that converts the data signal into a clock signal, where the clock signal retains timings of data transition edges of the data signal at which a data value of the data signal transits and has edges whose cycle is substantially equal to the data rate, an analytic signal generating section that converts the clock signal into an analytic signal of a complex number, and a jitter measuring section that measures the jitter of the data signal based on the analytic signal.
摘要:
There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.
摘要:
A jitter measurement apparatus for measuring an intrinsic jitter of a circuit to be tested including a phase detector which outputs a signal according to a phase difference between a supplied first input signal and a supplied second input signal, includes: an input unit for supplying an identical signal to the phase detector as the first input signal and as the second input signal; and a jitter measurement unit for measuring the intrinsic jitter of the circuit to be tested by measuring a jitter of a signal which is generated in an inside of the circuit to be tested according to an signal output from the phase detector.
摘要:
Provided is a measurement circuit that measures a signal under measurement input thereto, comprising a level comparing section that outputs a logic value according to a comparison result between a signal level of the signal under measurement and a set threshold level; a logic comparing section that acquires the logic value output by the level comparing section at a comparison timing input thereto; and a timing adjusting section that adjusts relative phases of a signal output by the level comparing section and the comparison timing, based on the expected value pattern of the signal under measurement and the threshold level.
摘要:
A pattern generator generates a pattern signal which represents a test signal to be supplied to a DUT. A driver generates a test signal having a level that corresponds to the pattern signal, and outputs the test signal thus generated to the DUT. A voltage modulator changes, in a predetermined voltage range, the voltage level of the test signal output from the driver DR.
摘要:
Provided is a digital modulator, including a carrier wave output section that outputs a carrier wave, a variable delay section that delays the carrier wave, and a delay amount setting section that sets a delay amount by which the variable delay section delays the carrier wave based on transmission data being transmitted by the carrier wave. The variable delay section may include a multi-stage delay buffer circuit in which delay buffers that delay an input signal by a unit shift amount are connected in a cascade connection, the multi-stage delay buffer circuit may receive the carrier wave at a first-stage delay buffer as input, and the delay amount setting section may include a multiplexer that selects either an output from the carrier wave output section or an output from each stage of the multi-stage delay buffer circuit.
摘要:
Provided is a jitter measurement apparatus, including a sampling section that samples a signal under measurement having a cycle T, a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values sampled by the sampling section, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform, and a statistical value calculating section that calculates a statistical value of the timing distribution. The sampling section may sample the signal under measurement having the cycle T a certain number of times N while the signal under measurement repeats for M cycles, where M and N are coprime.