摘要:
A method and apparatus for determining a pose of an elongate object and an absolute position of its tip while the tip is in contact with a plane surface having invariant features. The surface and features are illuminated with a probe radiation and a scattered portion, e.g., the back-scattered portion, of the probe radiation returning from the plane surface and the feature to the elongate object at an angle τ with respect to an axis of the object is detected. The pose is derived from a response of the scattered portion to the surface and the features and the absolute position of the tip on the surface is obtained from the pose and knowledge about the feature. The probe radiation can be directed from the object to the surface at an angle σ to the axis of the object in the form of a scan beam. The scan beam can be made to follow a scan pattern with the aid of a scanning arrangement with one or more arms and one or more uniaxial or biaxial scanners. Angle τ can also be varied, e.g., with the aid of a separate or the same scanning arrangement as used to direct probe radiation to the surface. The object can be a pointer, a robotic arm, a cane or a jotting implement such as a pen, and the features can be edges, micro-structure or macro-structure belonging to, deposited on or attached to the surface which the tip of the object is contacting.
摘要:
An apparatus and method for determining an inclination angle θ between an axis of an elongate object such as a cane, a pointer or a jotting implement such as a pen, pencil, stylus or the like and a normal to a plane surface at times when a tip of the elongate object is contacting that plane surface. The apparatus has an emitter mounted on the object for illuminating the plane surface with a probe radiation at an angle σ with respect to the axis of the object. The apparatus also has a detector mounted on the elongate object for detecting a radiation characteristic of a scattered portion of the probe radiation returning from the plane surface and a computing unit for deriving the inclination angle θ from the radiation characteristic. A scanning arrangement, such as a uniaxial or biaxial scanner, or a light guiding optic can be used for varying angle σ, and the probe radiation can be emitted in the form of a scan beam. Preferably, the emitter and detector of the scattered portion of the probe radiation are integrated and the scattered portion of the probe radiation whose characteristic is being measured is the back-scattered portion. The radiation characteristic detected by the detector can be the intensity, polarization, time-of-flight or any combination thereof.
摘要:
In accordance with the purpose(s) of the present disclosure, as embodied and broadly described herein, embodiments of the present disclosure, in one aspect, relate to Raman imaging devices (e.g., Raman endoscope probes) or systems, methods of using Raman agents, Raman imaging devices, and/or systems to image or detect a signal, and the like.
摘要:
An optical head for confocal microscopy that is especially advantageous for measurements on thick samples is provided. An interface between the optical head and the sample is index matched, to avoid beam aberration at this interface. The optical head includes a window having a convex surface facing away from the sample, so that light beams crossing this convex surface do so at or near normal incidence and are therefore not significantly aberrated. The window is rotationally symmetric about an axis perpendicular to the interface between the head and the sample. The head also includes at least two optical fibers, which can be used for input and/or output. Beams passing to and/or from the fibers are collimated by collimators. A single focusing element couples all the collimated beams to focused beams which pass through the window to intersect within a target region of the sample as confocal beams.
摘要:
An apparatus and a method are disclosed for optically determining a distance r to a feature from an origin or a center. The apparatus uses a beam generation unit for launching a reference beam on a reference path and a first beam on a first path. The center from which distance r is determined is selected such that it is along a line of the reference path and not along a line of the first path. Alternatively, the center can be chosen not to lie along a line of the reference path. A rotation mechanism rotates the reference path and the first path about the center such that the reference beam moves over the feature at a reference time tr and the first beam moves over the feature at a first time t1. A determination unit determines distance r between the center and the feature from an angular velocity ω of the reference beam over the feature and from times tr, t1.
摘要:
A solid catadioptric lens with a single viewpoint has a spherical refractive surface with a center C on an optical axis of the lens. An ellipsoidal reflective surface of the lens faces the spherical refractive surface such that a first focus F1 of the ellipsoidal reflective surface is coincident with the center C of the spherical refractive surface. Furthermore, the lens has a shaping surface facing the ellipsoidal reflective surface for shaping a light that passes the single viewpoint. The shaping surface can be refractive, reflective or semi-transparent and its shape can be ellipsoidal with its first focus F1′ coincident with the second focus F2 of the ellipsoidal reflective surface. The single viewpoint of the lens is at the center C of the spherical reflective surface and is enforced with an aperture that can be positioned at various points inside, on a surface or even outside the lens, depending on the type of shaping surface chosen.