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Patent Agency Ranking
公开(公告)号：US09778166B2
公开(公告)日：2017-10-03
申请号：US15117536
申请日：2015-02-20
Inventor： Ichiro Ishimaru
CPC classification number: G01N15/1436 , B01L3/502 , B01L2200/0647 , B01L2300/0609 , B01L2300/0654 , B01L2300/0861 , B01L2300/168 , G01N15/1434 , G01N15/1459 , G01N21/253 , G01N21/645 , G01N21/65 , G01N2015/0073 , G01N2015/1006 , G01N2021/6421 , G01N2021/6463 , G01N2201/06113
Abstract: In a microparticle measurement device, a sample is passed through each channel in a multi-flow channel, and a predetermined linear area is illuminated with light. Measurement light originating from a microparticle in the sample, such as scattered or fluorescent light, is shaped into a parallel beam by an objective lens and passes through a first and second transmission portions. The beams transmitted through these two portions are converged as first and second measurement beams onto the same straight line by a cylindrical lens. The intensity of the interference light formed by these beams is detected with a detector. Meanwhile, the light emitted from the light source and passing through the multi-flow channel without hitting the microparticle falls through the objective lens onto a non-reflection portion and does not travel toward the cylindrical lens. Accordingly, only the interference light formed by the measurement beams is allowed to fall onto the detector.
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公开(公告)号：US12158417B1
公开(公告)日：2024-12-03
申请号：US18691179
申请日：2022-09-01
Inventor： Ichiro Ishimaru
IPC: G01N21/35
Abstract: A spectrometry device 1 includes: a collimating optical system 15 configured to collimate object light from a measurement point a on a sample S; a photodetector 21 having a light-receiving face in which a plurality of pixels are arrayed in a predetermined direction; a conjugate plane imaging optical system 11 provided between the sample and the collimating optical system to form a plane optically conjugate with respect to a surface of the sample; an amplitude-type diffraction grating 1 disposed on the conjugate surface and having a light incident face on which the object light is incident or a light emission face from which the object light is emitted, the light incident face or the light emission face being formed by a light-shielding member made of a material having a light shielding rate higher than that of silicon in a wavelength band of the object light and provided with a plurality of openings, an optical path length differentiating optical system 16 configured to divide collimated object light into a first light beam and a second light beam to provide an optical path length difference; and an interference optical system 17 configured to cause the first light beam and the second light beam provided with the optical path length difference to interfere with each other to form an interference image on the light-receiving face along the predetermined direction.
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公开(公告)号：US10545016B2
公开(公告)日：2020-01-28
申请号：US16322592
申请日：2017-08-07
Inventor： Takeshi Akagawa , Masahiro Kubo , Katsumi Abe , Kimiyasu Takoh , Ersin Altintas , Yuji Ohno , Tetsuri Ariyama , Ichiro Ishimaru
Abstract: A light measurement device that maintains high measurement precision. The light measurement device includes: light source that irradiates light upon measurement object; branch part that splits transmitted light or reflected light from measurement object; phase-changing unit that changes the phase of one beam of the branched light beams; phase-fixing unit that maintains the phase of the other beam of the branched light beams; adjustment mechanism, which is provided in phase-changing unit or phase-fixing unit, for adjusting the propagation direction of light; multiplexer that causes the light emitted by each of phase-changing unit and phase-fixing unit to interfere with each other; detection unit that detects light that is interfered with by multiplexer; and control unit that controls the adjustment mechanism on the basis of the luminance values of an interference image that is detected by detection unit and adjusts the propagation direction of light in phase-changing unit or phase-fixing unit.
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14.发明授权Spectroscopic measurement device having diffraction grating at conjugate plane of relay lens 有权在中继透镜的共轭平面处具有衍射光栅的光谱测量装置公开(公告)号：US09488524B2
公开(公告)日：2016-11-08
申请号：US14430658
申请日：2013-10-02
Inventor： Ichiro Ishimaru
CPC classification number: G01J3/45 , G01J3/0208 , G01J3/0237 , G01J3/0256 , G01J3/0291 , G01J3/2803 , G01J3/4531 , G01J3/4532 , G01N2021/3595
Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.
Abstract translation: 光谱测量装置包括：分割光学系统，用于将位于待测物体的测量区域内的多个测量点中的每一个发射的测量光束分成第一测量光束和第二测量光束; 成像光学系统; 光路长度差提供装置; 检测器，包括多个像素; 用于获取待测量对象的测量点的干涉图的处理器; 位于待测物体与分光光学系统之间的共轭平面成像光学系统; 以及位于共轭平面上的周期性提供装置。
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15.发明授权Spectroscopic measurement device having transmissive optical member with a sloped face 有权光谱测量装置具有带倾斜面的透射光学部件公开(公告)号：US09482576B2
公开(公告)日：2016-11-01
申请号：US14668106
申请日：2015-03-25
Inventor： Ichiro Ishimaru
IPC: G01J3/02 , G01J3/453 , A61B5/1455 , G01J3/28
CPC classification number: G01J3/0208 , A61B5/1455 , A61B2562/0233 , G01J3/021 , G01J3/2803 , G01J3/4531 , G01J3/4535
Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.
Abstract translation: 光谱测量装置包括：分割光学系统，用于将位于待测物体的测量区域内的多个测量点中的每一个发射的测量光束分成第一测量光束和第二测量光束; 成像光学系统; 光路长度差提供装置; 检测器，包括多个像素; 用于获取待测量对象的测量点的干涉图的处理器; 位于待测物体与分光光学系统之间的共轭平面成像光学系统; 以及位于共轭平面上的周期性提供装置。
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