Abstract:
The invention concerns an amplifier (1), capable of being controlled by an activation signal, for reading storage cells of a crossbar network comprising, for each column, a direct bit line (BLdi) and a reference bit line (BLri), the amplifier being common to two columns and producing an OR-Exclusive type combination of the states of the cells read in said two columns.
Abstract:
There are many inventions described and illustrated herein. In a first aspect, the present invention is directed to a memory cell and technique of reading data from and writing data into that memory cell. In this regard, in one embodiment of this aspect of the invention, the memory cell includes two transistors which store complementary data states. That is, the two-transistor memory cell includes a first transistor that maintains a complementary state relative to the second transistor. As such, when programmed, one of the transistors of the memory cell stores a logic low (a binary “0”) and the other transistor of the memory cell stores a logic high (a binary “1”). The data state of the two-transistor complementary memory cell may be read and/or determined by sampling, sensing measuring and/or detecting the polarity of the logic states stored in each transistor of complementary memory cell. That is, the two-transistor complementary memory cell is read by sampling, sensing measuring and/or detecting the difference in signals (current or voltage) stored in the two transistors.
Abstract:
The present invention relates to an amplifier having a fan-out which varies according to the time spent between an edge of a propagation signal and an edge of a logic input signal, the amplifier including several identical blocks, each block having an output stage connected between a data input and a data output, the data input and output being respectively connected to the data inputs and outputs of the other blocks; a delay element, the delay elements of all blocks being connected in series, the delay element of the first block receiving the synchronization signal; an edge detector, the input of which is connected to the input of the output stage; and means for inhibiting the propagation of the synchronization signal through the delay element when the signal generated by the edge detector of the preceding block is active and for activating the output stage and the edge detector when the signal generated by the delay element of the preceding block is active.
Abstract:
An electronic circuit with digital output including an auto-stable assembly of latches (1), a control assembly (2), a blowable assembly (3), a logic gate (4) including a first input connected to a common point (14) between the auto-stable assembly (1) and the blowable assembly (3), and a second input connected to the control input (20) of the electronic circuit. A breaker (5) is controlled by the output of the logic gate (4) and arranged between the auto-stable assembly (1) and ground, and an associated process.
Abstract:
An integrated circuit memory including an array of memory cells divided into several sections, and several rows of column decoding amplifiers, the respective outputs of which are interconnected, by column, by means of a decoded bit line, each decoded bit line including two perpendicular sections, one of which is in the row direction to directly connect each decoded bit line to an input of an input-output stage of the memory arranged at one end of the rows.
Abstract:
The invention relates to a flash memory cell having a FET transistor with a floating gate on a semiconductor-on-insulator (SOI) substrate composed of a thin film of semiconductor material separated from a base substrate by an insulating buried oxide (BOX) layer, The transistor has in the thin film, a channel, with two control gates, a front control gate located above the floating gate and separated from it by an inter-gate dielectric, and a back control gate located within the base substrate directly under the insulating (BOX) layer and separated from the channel by only the insulating (BOX) layer. The two control gates are designed to be used in combination to perform a cell programming operation. The invention also relates to a memory array made up of a plurality of memory cells according to the first aspect of the invention, which can be in an array of rows and columns, and a method of fabricating such memory cells and memory arrays.
Abstract:
A sense amplifier for a series of cells of a memory, including a writing stage comprising a CMOS inverter, the input of which is directly or indirectly connected to an input terminal of the sense amplifier, and the output of which is connected to an output terminal of the sense amplifier intended to be connected to a local bitline addressing the cells of the series, and a reading stage that includes a sense transistor, the gate of which is connected to the output of the inverter and the drain of which is connected to the input of the inverter.
Abstract:
A semiconductor memory having bit lines and wordlines crossing each other, a memory cell array formed by memory cells arranged in rows and columns on crossover points of the bit lines and wordlines, and sense amplifier banks arranged on opposite sides of the memory cell array. Each sense amplifier bank has staggered sense amplifiers connected to a bit line according to an interleaved arrangement whereby bit lines alternate in the direction of the wordlines between bit lines coupled to different sense amplifiers. This results in interconnect spaces parallel to the bit lines. Also, each sense amplifier bank includes a local column decoder for selecting a sense amplifier and which is staggered with the sense amplifiers and coupled to the sense amplifier by an output line running in an available interconnect space parallel to the bit lines.
Abstract:
A data bus including a plurality of logic blocks coupled in series, each logic block including at least one buffer for buffering at least one data bit transmitted via the data bus and at least one of the logic blocks further including circuitry coupled in parallel with the at least one buffer and arranged to determine a first bit of error correction code associated with the at least one data bit.
Abstract:
A sense amplifier for a series of cells of a memory, including a writing stage comprising a CMOS inverter, the input of which is directly or indirectly connected to an input terminal of the sense amplifier, and the output of which is connected to an output terminal of the sense amplifier intended to be connected to a local bitline addressing the cells of the series, and a reading stage that includes a sense transistor, the gate of which is connected to the output of the inverter and the drain of which is connected to the input of the inverter.