METHOD DEVICE AND ELECTRONIC DEVICE INCLUDING THE SAME

    公开(公告)号:US20230397432A1

    公开(公告)日:2023-12-07

    申请号:US18329197

    申请日:2023-06-05

    CPC classification number: H10B53/20 H10B53/10 G11C16/0483 H10B51/10 H10B51/20

    Abstract: A memory device includes a plurality of gate electrodes spaced apart from each other in a first direction, a memory layer comprising a plurality of memory regions that protrude and extend in a second direction perpendicular to the first direction to face the plurality of gate electrodes, respectively, a plurality of first insulating layers extended to spaces between the plurality of memory regions between the plurality of gate electrodes, a channel layer disposed between the memory layer and the plurality of gate electrodes, the channel layer having a shape including a plurality of first regions surrounding the plurality of memory regions and a second region that connects the plurality of first regions to each other in the first direction, and a gate insulating layer arranged between the channel layer and the plurality of gate electrodes.

    FERROELECTRIC FIELD EFFECT TRANSISTOR, MEMORY DEVICE, AND NEURAL NETWORK APPARATUS INCLUDING GATE-INTERPOSED LAYER

    公开(公告)号:US20250056844A1

    公开(公告)日:2025-02-13

    申请号:US18761631

    申请日:2024-07-02

    Abstract: Provided is a ferroelectric field effect transistor including a source region, a drain region, a channel provided between the source region and the drain region, a ferroelectric layer provided on the channel and including a ferroelectric material including an oxide of a first element, a gate-interposed layer provided on the ferroelectric layer and including a paraelectric material including an oxide of a second element different from the first element, and a gate electrode provided on the gate-interposed layer, wherein the gate-interposed layer includes a first interposed layer adjacent to the ferroelectric layer, and a second interposed layer adjacent to the gate electrode, the first interposed layer includes a mixture of the first element and the second element, and a ratio of the first element in the first interposed layer may be greater than a ratio of the first element in the ferroelectric layer.

Patent Agency Ranking