Display device, module, and electronic device

    公开(公告)号:US10558092B2

    公开(公告)日:2020-02-11

    申请号:US15455244

    申请日:2017-03-10

    Abstract: A high-definition liquid crystal display device is provided. A liquid crystal display device with a high aperture ratio is provided. A liquid crystal display device with a high contrast ratio and display quality is provided. A liquid crystal display device capable of being driven at a low voltage is provided. The display device includes, between a pair of substrates, a pixel electrode, a first common electrode, a second common electrode, and a liquid crystal layer. The pixel electrode and the first common electrode are positioned between the liquid crystal layer and one of the substrates. The second common electrode is positioned between the liquid crystal layer and the other substrate. The same potential is supplied to the first common electrode and the second common electrode. The first common electrode includes a portion overlapping with the second common electrode between the display regions of two adjacent subpixels that exhibit different colors. At least one of the pixel electrode and the first common electrode includes a portion that does not overlap with the second common electrode in the display region of the subpixel.

    Manufacturing method and test method of semiconductor device
    15.
    发明授权
    Manufacturing method and test method of semiconductor device 有权
    半导体器件的制造方法和测试方法

    公开(公告)号:US09136188B2

    公开(公告)日:2015-09-15

    申请号:US14557888

    申请日:2014-12-02

    Abstract: Provided is a test method by which a transistor whose reliability is low can be detected with low stress and high accuracy in a shorter period of time than a BT test. Provided is to detect a transistor whose reliability is high in a shorter period of time than a BT test and manufacture an electronic device with high reliability efficiently. Hysteresis characteristics revealed in the result of the Vg-Id measurement with light irradiation to the transistor correlate with the result of a BT test; whether the reliability of the transistor is Good or Not-Good can be judged. Accordingly, the test method by which a transistor whose reliability is low can be detected with low stress and high accuracy in a shorter period of time than a BT test can be provided.

    Abstract translation: 提供了一种可以在比BT测试更短的时间内以低应力和高精度检测可靠性低的晶体管的测试方法。 提供了在BT测试中更短的时间内检测出可靠性高的晶体管,并有效地制造高可靠性的电子设备。 通过对晶体管的光照射的Vg-Id测量的结果中显示的滞后特性与BT测试的结果相关; 可以判断晶体管的可靠性是好还是不好。 因此,可以在比可以提供BT测试的更短的时间段内以低应力和高精度检测可靠性低的晶体管的测试方法。

Patent Agency Ranking