Memory system
    12.
    发明授权

    公开(公告)号:US10180796B2

    公开(公告)日:2019-01-15

    申请号:US15294119

    申请日:2016-10-14

    Applicant: SK hynix Inc.

    Abstract: A memory system includes: a plurality of first memory devices directly or indirectly coupled to one another, each first memory device including a first memory and a first memory controller suitable for controlling the first memory to store data; a second memory device including a second memory and a second memory controller suitable for controlling the second memory to store data; and a multi-processor including a plurality of processors, each processor executing an operating system (OS) and an application to access a data storage memory through the first and second memory devices.

    Test apparatus, test system and operating method of test apparatus

    公开(公告)号:US09831001B2

    公开(公告)日:2017-11-28

    申请号:US14732281

    申请日:2015-06-05

    Applicant: SK hynix Inc.

    Inventor: Yong-Woo Lee

    CPC classification number: G11C29/18 G11C29/56004 G11C29/56008

    Abstract: A test system may include: a vector storage unit suitable for storing a first test vector corresponding to a first test operation; a test target suitable for performing a test operation corresponding to the test vector stored in a vector storage unit; a comparison unit suitable for comparing a first test result to an expected value to output a first test result value, wherein the first test result is transferred from the test target as a result of the first test operation based on the first test vector; and a vector control unit suitable for modifying the first test vector to generate a second test vector corresponding to a second test operation.

Patent Agency Ranking