公开(公告)号：US09625482B2

公开(公告)日：2017-04-18

申请号：US14134735

申请日：2013-12-19

Applicant: Sysmex Corporation

Inventor： Miyuki Yamada ,  Shuji Kawaguchi ,  Hiroshi Kurono

IPC: G01N35/10

CPC classification number: G01N35/1079 ,  G01N35/0099 ,  G01N35/025 ,  G01N35/1002 ,  G01N35/1011 ,  G01N2035/0444 ,  G01N2035/1025

Abstract: A sample analyzer comprises a container setting part on which a liquid container is to be set, a liquid supplying part configured to supply a liquid to the liquid container, an aspiration tube configured to aspirate a sample or a reagent, a movement mechanism configured to move the aspiration tube, a liquid surface sensor configured to detect contact of the aspiration tube with a liquid surface, and a controller configured to execute an aspiration tube adjustment operation. The aspiration tube adjustment operation comprises supplying the liquid to the liquid container by the liquid supplying part, lowering the aspiration tube by the movement mechanism toward the liquid container set on the container setting part, and obtaining information regarding a position in a height direction of the aspiration tube at a time when the aspiration tube has come into contact with the liquid surface.

公开(公告)号：US09213037B2

公开(公告)日：2015-12-15

申请号：US14038260

申请日：2013-09-26

Applicant: SYSMEX CORPORATION

Inventor： Hiroshi Kurono ,  Yasuhiro Takeuchi

IPC: G01N33/86 ,  G01N35/02 ,  G01N35/00 ,  G01N33/48

CPC classification number: G01N33/86 ,  G01N33/48 ,  G01N35/00613 ,  G01N35/00732 ,  Y10T436/113332

Abstract: Disclosed is a sample analyzer including a transporting part configured to transport a sample rack holding one or more samples, a measuring part configured to perform a measurement on the sample of the transported sample rack and a controller. The controller is programmed to perform an analysis of a predetermined item that requires at least first and second measurement results derived respectively from first and second samples obtained from the same subject and preprocessed in different ways, and if a measurement of the predetermined item is requested and a set of first and second samples obtained from the same subject and preprocessed in different ways are transported to the measuring part, the controller controls the measuring part to perform measurements on both of the first and second samples to derive the first and second measurement results and processes them to generate an analysis result of the predetermined item.

Abstract translation: 公开了一种样本分析器，包括：运送部，其构造成输送保持一个以上的样本的样架;测量部，被配置为对所运送的样架的样本进行测量;以及控制器。 控制器被编程为执行预定项目的分析，该预定项目至少需要分别从相同对象获得的第一和第二样本导出并且以不同方式预处理的第一和第二测量结果，并且如果要求预定项目的测量， 从同一受试者获得并以不同方式预处理的一组第一和第二样本被传送到测量部分，控制器控制测量部分对第一和第二样本两者进行测量，以得出第一和第二测量结果， 处理它们以生成预定项目的分析结果。

公开(公告)号：US11933797B2

公开(公告)日：2024-03-19

申请号：US16574740

申请日：2019-09-18

Applicant: SYSMEX CORPORATION

Inventor： Kazuma Moriura ,  Hiroshi Kurono

IPC: G01N35/00

CPC classification number: G01N35/00693 ,  G01N2035/00702 ,  G01N2035/00891

Abstract: Disclosed is a calibration curve creation method performed by an analyzer, the calibration curve creation method including: preparing a plurality of calibrators at different dilution rates by dispensing a calibrator in a container into one or more different containers; obtaining a plurality of measurement values by measuring each of the prepared plurality of calibrators; creating a calibration curve by use of the plurality of measurement values; selecting a first measurement value to be re-measured, among the plurality of measurement values used for the calibration curve; preparing another calibrator at a dilution rate corresponding to a calibrator from which the selected first measurement value is obtained; obtaining a second measurement value by measuring the prepared another calibrator; and creating a new calibration curve by replacing the first measurement value, among the plurality of measurement values, with the second measurement value.

公开(公告)号：US11604201B2

公开(公告)日：2023-03-14

申请号：US16697423

申请日：2019-11-27

Applicant: SYSMEX CORPORATION

Inventor： Hiroshi Kurono

IPC: G01N35/00 ,  G01D3/00 ,  G01N33/49

Abstract: Disclosed is a specimen analyzer configured to perform analysis on a specimen for a plurality of measurement items, the specimen analyzer including a measurement section configured to perform a specimen measurement for measuring a measurement sample prepared from a specimen and a reagent corresponding to a measurement item, and configured to perform a quality control measurement for measuring a measurement sample prepared from a quality control substance and a reagent corresponding to a measurement item; and a controller programmed to set a quality control for each measurement item, from a quality control group that includes at least two types of quality controls selected from a first quality control in which the quality control measurement is performed at a predetermined time, a second quality control in which the quality control measurement is performed every time the specimen measurement is performed a predetermined number of times of measurement, and a third quality control in which the quality control measurement is performed every predetermined time interval, the controller being programmed to control the measurement section in accordance with the set quality control.