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公开(公告)号：US10330705B2
公开(公告)日：2019-06-25
申请号：US15391637
申请日：2016-12-27
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman
Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
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公开(公告)号：US20180313870A1
公开(公告)日：2018-11-01
申请号：US16028236
申请日：2018-07-05
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
CPC classification number: G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US20170328932A1
公开(公告)日：2017-11-16
申请号：US15395416
申请日：2016-12-30
Applicant: TEKTRONIX, INC.
Inventor： Barton T. Hickman , John J. Pickerd , Pirooz Hojabri , Patrick Satarzadeh , Khadar Baba Shaik
CPC classification number: G01R13/0218 , G01R13/0272 , H03M1/0626 , H03M1/12
Abstract: Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduced by processing the signal. In some embodiments, the combination of filters may also provide for increased flexibility when de-embedding device under test (DUT) link attenuation at higher frequencies. Further, the filters are adjustable, via a controller, to obtain an increased signal to noise ratio (SNR) relative to a signal channel lacking the combination of filters. Additional embodiments may be disclosed and/or claimed herein.
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14.发明申请公开(公告)号：US20170176499A1
公开(公告)日：2017-06-22
申请号：US15391637
申请日：2016-12-27
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , Barton T. Hickman
CPC classification number: G01R13/0272 , G01R35/005 , H03M1/06 , H03M1/1009 , H03M1/121
Abstract: A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based on a measurement derived using a compensation oscillator. The measurement may include clock delay and clock skew. In some examples the test and measurement instrument may additionally adjust clock delay and/or clock skew in addition to selecting appropriate filter coefficients.
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15.发明公开公开(公告)号：US20230221352A1
公开(公告)日：2023-07-13
申请号：US18072551
申请日：2022-11-30
Applicant: Tektronix, Inc.
Inventor： Gary J. Waldo , Alan Edward Wolke , Barton T. Hickman
IPC: G01R13/02
CPC classification number: G01R13/029 , G06F3/0481
Abstract: A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface. Methods of automatically generating spectrograms based on user actions are also described.
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Patent Agency Ranking
公开(公告)号：US11249111B2
公开(公告)日：2022-02-15
申请号：US16028236
申请日：2018-07-05
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US20210088553A1
公开(公告)日：2021-03-25
申请号：US17114468
申请日：2020-12-07
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US10041975B2
公开(公告)日：2018-08-07
申请号：US14949562
申请日：2015-11-23
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US09651579B2
公开(公告)日：2017-05-16
申请号：US14724302
申请日：2015-05-28
Applicant: Tektronix, Inc.
Inventor： Barton T. Hickman , Jed H. Andrews , Jeffrey W. Mucha
CPC classification number: G01R13/32 , G01R13/0254 , H03L7/24
Abstract: A test and measurement system for synchronizing multiple oscilloscopes including a host oscilloscope and at least one client oscilloscope. The host oscilloscope includes a host timebase clock configured to output a clock signal, a host digitizer including a digitizer synchronization clock based on the clock signal, and a host acquisition controller includes a trigger synchronization clock based the clock signal and outputs a run signal to begin an acquisition of an input signal. Each client oscilloscope includes a client timebase clock configured to receive the clock signal from the host timebase clock and output the clock signal, a client digitizer including a digitizer synchronization clock based on the clock signal, and a client acquisition controller includes a trigger synchronization clock based on the clock signal and receives the run signal from the host acquisition controller and begins an acquisition of another input signal based on the run signal.
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公开(公告)号：US12228611B2
公开(公告)日：2025-02-18
申请号：US17000491
申请日：2020-08-24
Applicant: Tektronix, Inc.
Inventor： Barton T. Hickman
IPC: G01R31/3183 , G01K3/00 , G01K3/08 , G06F11/30
Abstract: A test and measurement instrument including a user interface configured to receive instructions to perform a signal path calibration for a user-specific setting from a user; a memory configured to store signal path calibration data; and one or more processors that can determine an actual signal path hardware setting for the user-specific setting, determine an adjustment to adjust the actual signal path hardware setting to the user-specific setting, adjust the actual signal path hardware setting by the adjustment to accurately represent the user-specific setting, and store the user-specific setting and the adjusted signal path hardware setting in the signal path calibration data.
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