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11.发明申请SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE UNDER TEST 有权信号采集系统，具有减少的测试装置的探测负载公开(公告)号：US20130221985A1
公开(公告)日：2013-08-29
申请号：US13854566
申请日：2013-04-01
Applicant: TEKTRONIX, INC.
Inventor： Josiah A. Bartlett , Ira G. Pollock , Daniel G. Knierim , Lester L. Larson , Scott R. Jansen , Kenneth P. Dobyns , Michael Duane Stevens
IPC: G01R35/00
CPC classification number: G01R35/005 , G01R1/06766
Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.
Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统提供极零对，以保持信号采集系统频率带宽的平坦度。
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公开(公告)号：US20220018896A1
公开(公告)日：2022-01-20
申请号：US17379940
申请日：2021-07-19
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
Abstract: A new test system includes a programmed device having an input port for receiving a signal for testing or measuring on the programmed device, and a reprogrammable test accessory having an output coupled to the input port of the programmed device. The reprogrammable test accessory further includes a test port structured to accept one or more test signals from a Device Under Test (DUT), and a reprogrammable processor. The reprogrammable processor may further include reprogrammable standards and protocols, reprogrammable triggers and margin detection, reprogrammable link training, reprogrammable handshaking, and reprogrammable setup and control facilities for either or both of the DUT and the programmed device.
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公开(公告)号：US11041880B2
公开(公告)日：2021-06-22
申请号：US16162354
申请日：2018-10-16
Applicant: Tektronix, Inc.
Inventor： Josiah A. Bartlett
Abstract: A test and measurement probe coupler that may include a substrate, a first signal tap conductor, a first signal contact, a first ground tap conductor, and a first ground contact. The first signal tap conductor may extends a first length along the substrate. The first signal contact may be electrically coupled to the first signal tap conductor, and the first ground tap conductor may extend a second length along the substrate. The first ground tap conductor may be substantially parallel to the first signal tap conductor. The first ground tap conductor may be disposed in a first lateral direction away from the first signal tap conductor, and the first ground contact electrically may be coupled to the first ground tap conductor.
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公开(公告)号：US10962566B1
公开(公告)日：2021-03-30
申请号：US16241523
申请日：2019-01-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
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15.发明申请公开(公告)号：US20140058693A1
公开(公告)日：2014-02-27
申请号：US13773253
申请日：2013-02-21
Applicant: TEKTRONIX, INC.
Inventor： Laudie J. Doubrava , Josiah A. Bartlett
IPC: G01R35/00 , G01R31/319
CPC classification number: G01R35/005 , G01R27/28 , G01R31/3191
Abstract: System and methods may allow an operator of a signal measurement instrument to characterize and calibrate a network with unsupported connector types, e.g., not traceable to known standards. Adapters having supported and unsupported interfaces can be used to measure the system responses of networks in a system under test. These measurements can be mathematically cascaded to deduce virtual models that produce an accurate and fully calibrated total system response.
Abstract translation: 系统和方法可以允许信号测量仪器的操作者用不支持的连接器类型来表征和校准网络，例如不可追溯到已知的标准。 具有支持和不支持接口的适配器可用于测量被测系统中网络的系统响应。 这些测量可以在数学上级联以推导出产生精确和完全校准的总系统响应的虚拟模型。
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Patent Agency Ranking
公开(公告)号：US20240069094A1
公开(公告)日：2024-02-29
申请号：US18387810
申请日：2023-11-07
Applicant: Tektronix, Inc.
Inventor： Charles W. Case , Daniel G. Knierim , Joshua J. O'Brien , Josiah A. Bartlett , Julie A. Campbell
CPC classification number: G01R31/2886 , G01R29/26
Abstract: A test system includes a test and measurement device having an input port for receiving signals for testing or measuring, a reprogrammable test accessory having an output coupled to the input port of the test and measurement device. The reprogrammable test accessory includes a test port structured to accept one or more test signals from a Device Under Test (DUT), a processor, a reprogrammable data protocol analyzer for determining whether data carried by the one or more test signals from the DUT conform to a predetermined data protocol, and a reprogramming facility for modifying the reprogrammable data protocol analyzer from a first configuration to a second configuration. Methods of operation are also described.
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公开(公告)号：US20230417800A1
公开(公告)日：2023-12-28
申请号：US18454035
申请日：2023-08-22
Applicant: Tektronix, Inc.
Inventor： Josiah A. Bartlett , Daniel G. Knierim , David L. Knierim
CPC classification number: G01R15/181 , G01R15/146
Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a shunt configured to be placed in series with the current-carrying conductor, and a Rogowski coil including at least one conductor segment. The shunt and the Rogowski coil are coupled to produce an output signal representing the current in the current-carrying conductor.
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公开(公告)号：US20220099706A1
公开(公告)日：2022-03-31
申请号：US17478738
申请日：2021-09-17
Applicant: Tektronix, Inc.
Inventor： Josiah A. Bartlett
Abstract: A current sensor configured to measure current in a current-carrying conductor. The current sensor includes a Rogowski coil having plurality of conductor segments. The plurality of conductor segments are positionable to form a substantially complete loop. A first conductor segment of the plurality of conductor segments is electrically isolated from a second conductor segment of the plurality of conductor segments.
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公开(公告)号：US20210263074A1
公开(公告)日：2021-08-26
申请号：US17251179
申请日：2019-06-11
Applicant: Tektronix, Inc.
Inventor： Karl A. Rinder , David A. Sailor , Josiah A. Bartlett
IPC: G01R1/067 , G01R31/302 , G01R1/02 , G01R1/04
Abstract: A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.
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公开(公告)号：US20170115325A1
公开(公告)日：2017-04-27
申请号：US14923242
申请日：2015-10-26
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
CPC classification number: G01R1/06766 , G01R1/06794 , G01R1/073 , G01R35/005
Abstract: Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
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