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    Automatic probe ground connection checking techniques
    11.
    发明授权
    Automatic probe ground connection checking techniques 有权

    公开(公告)号：US10041975B2

    公开(公告)日：2018-08-07

    申请号：US14949562

    申请日：2015-11-23

    Applicant: Tektronix, Inc.

    Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

    IPC: G01R1/067 ,  G01R31/02

    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

    TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT
    12.
    发明申请
    TEST AND MEASUREMENT PROBE WITH ADJUSTABLE TEST POINT CONTACT 审中-公开
    测试和测量探头具有可调节的测试点接触

    公开(公告)号：US20170052216A1

    公开(公告)日：2017-02-23

    申请号：US14830339

    申请日：2015-08-19

    Applicant: Tektronix, Inc.

    Inventor： Julie A. Campbell ,  William A. Hagerup ,  Ira G. Pollock

    IPC: G01R1/067

    CPC classification number: G01R1/06705 ,  G01R1/06722 ,  G01R1/06738 ,  G01R1/06772 ,  G01R1/06788 ,  H01R2201/20

    Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.

    Abstract translation: 用于与被测设备的测试点进行电接触的探针包括主体，能够相对于主体线性地行进的刚性构件;柔性臂，其在一端具有测试点接触并且紧固到刚性构件 另一端，以及固定到主体和柔性臂的柔性连杆。 柔性连杆构造成使得柔性臂响应于刚性构件在一个方向上的移动而弯曲，并且响应于刚性构件沿另一方向的行进而使柔性臂解开弯曲。 可以包括第二柔性臂，两个臂打开和关闭以改变测试点触点之间的距离。 光源可以设置在柔性连接件的同时铰接以自动跟踪测试点接触的取向的部分上。

    HIGH IMPEDANCE COMPLIANT PROBE TIP
    15.
    发明申请
    HIGH IMPEDANCE COMPLIANT PROBE TIP 审中-公开
    高阻抗合规探头

    公开(公告)号：US20160291054A1

    公开(公告)日：2016-10-06

    申请号：US14676703

    申请日：2015-04-01

    Applicant: Tektronix, Inc.

    Inventor： William A. Hagerup ,  Julie A. Campbell ,  Ira G. Pollock ,  James E. Spinar ,  Kathleen F.M. Ullom ,  Charles M. Hartmann ,  Daniel J. Ayres ,  Christina D. Enns

    IPC: G01R1/067

    CPC classification number: G01R1/06722 ,  G01R1/06733 ,  G01R1/06788

    Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.

    Abstract translation: 测试探针尖端可以包括顺应性构件或力偏转组件和尖端部件。 柔性构件或力偏转组件可以包括柱塞部件和容纳柱塞部件的筒部件，其中柱塞部件构造成在筒部件内部轴向滑动。 测试探针尖端还可以包括在筒部件内作用在柱塞部件上的弹簧机构，以及在一端与柱塞部件耦合的电阻/阻抗元件，并且在相对端与尖端部件耦合，电阻/阻抗元件 包括至少一个具有半圆柱形状的杆和位于其上的电阻材料。

    HIGH IMPEDANCE COMPLIANT PROBE TIP
    16.
    发明申请
    HIGH IMPEDANCE COMPLIANT PROBE TIP 有权
    高阻抗合规探头

    公开(公告)号：US20160187382A1

    公开(公告)日：2016-06-30

    申请号：US14587703

    申请日：2014-12-31

    Applicant: Tektronix, Inc.

    Inventor： Julie A. Campbell ,  Ira G. Pollock ,  William A. Hagerup ,  Christina D. Enns

    IPC: G01R1/067

    CPC classification number: G01R1/06772 ,  G01R1/06722 ,  G01R1/06766 ,  G01R1/073 ,  G05G1/00 ,  H01L21/00 ,  H01R13/2421 ,  H01R2101/00 ,  H01R2201/20 ,  H03F1/00

    Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.

    Abstract translation: 测试探针尖端可以包括顺应性构件或力偏转组件和尖端部件。 柔性构件或力偏转组件可以包括柱塞部件和容纳柱塞部件的筒部件，其中柱塞部件构造成在筒部件内部轴向滑动。 测试探针尖端还可以包括在筒部件内作用于柱塞部件上的弹簧机构，以及阻塞/阻抗元件，例如圆棒电阻器，其一端与柱塞部件耦合，并且在尖端部件处于 对面

    AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
    17.
    发明申请
    AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES 审中-公开
    自动探头接地检查技术

    公开(公告)号：US20160077128A1

    公开(公告)日：2016-03-17

    申请号：US14949562

    申请日：2015-11-23

    Applicant: Tektronix, Inc.

    Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

    IPC: G01R1/067 ,  G01R31/02

    CPC classification number: G01R1/06788 ,  G01R1/06766 ,  G01R1/06794 ,  G01R31/024 ,  G01R31/026

    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

    Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。

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