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    SAMPLE TESTING APPARATUS
    11.
    发明申请
    SAMPLE TESTING APPARATUS 有权
    样品测试仪

    公开(公告)号：US20100332191A1

    公开(公告)日：2010-12-30

    申请号：US12823833

    申请日：2010-06-25

    申请人： Yuichi Hamada ,  Masaharu Shibata ,  Daigo Fukuma

    发明人： Yuichi Hamada ,  Masaharu Shibata ,  Daigo Fukuma

    IPC分类号： G06F17/40 ,  G06F15/00

    CPC分类号： G06F19/366 ,  G06F19/00 ,  G16H10/40

    摘要： A sample testing apparatus comprising: a first storing section for storing identification information of an operator in association with first or second attribute information; an identification information receiving section for receiving an input of the identification information of the operator; a testing section for obtaining a test result by testing a sample; a second storing section for storing the test result of the sample so as to be linked with the received identification information; an operation end instruction receiving section for receiving an operation end instruction by the operator; and a deleting section for deleting from the second storing section the test result which is stored so as to be linked with the identification information received by the identification information receiving section in the case in which the received identification information is associated with the second attribute information when the operation end instruction is received.

    摘要翻译： 一种样本测试装置，包括：第一存储部分，用于存储与第一或第二属性信息相关联的操作者的识别信息; 识别信息接收部分，用于接收操作员的识别信息的输入; 用于通过测试样品获得测试结果的测试部分; 第二存储部分，用于存储样本的测试结果以便与所接收的识别信息相关联; 操作结束指令接收部分，用于接收操作者的操作结束指令; 以及删除部，从所述第二存储部删除与所述识别信息接收部接收到的识别信息相关联地存储的测试结果，所述检测结果在所接收的识别信息与所述第二属性信息相关联的情况下， 接收到操作结束指令。

    ANALYZER, SAMPLE TRANSPORTATION METHOD, AND COMPUTER PROGRAM PRODUCT
    13.
    发明申请
    ANALYZER, SAMPLE TRANSPORTATION METHOD, AND COMPUTER PROGRAM PRODUCT 有权
    分析仪，样品运输方法和计算机程序产品

    公开(公告)号：US20090227033A1

    公开(公告)日：2009-09-10

    申请号：US12399461

    申请日：2009-03-06

    申请人： Yuichi Hamada ,  Daigo Fukuma ,  Masaharu Shibata

    发明人： Yuichi Hamada ,  Daigo Fukuma ,  Masaharu Shibata

    IPC分类号： G01N35/02 ,  B01J19/00 ,  C12M1/34

    CPC分类号： G01N35/0092 ,  Y10T436/114165

    摘要： An analyzer comprising: a first measurement unit for measuring samples; a second measurement unit for measuring samples; a transportation device for transporting samples to the first measurement unit and the second measurement unit; prior sample measurement instructor for instructing to measure a predetermined sample prior to the other samples; and a transportation controller for controlling the transportation device to reserve the transportation of the other samples to the second measurement unit and to perform the other transportation operation, when the prior sample measurement instructor has instructed to measure the predetermined sample by the second measurement unit prior to the other samples, is disclosed. A sample transportation method and a computer program product are also disclosed.

    摘要翻译： 一种分析器，包括：用于测量样品的第一测量单元; 用于测量样品的第二测量单元; 用于将样品运送到第一测量单元和第二测量单元的运送装置; 用于指示在其他样品之前测量预定样品的先前样品测量指导者; 以及运送控制器，用于控制所述运送装置，以将所述其他样品运送到所述第二测量单元并执行所述其他运输操作，当所述现有样品测量指导者已经指示在所述第二测量单元之前测量所述预定样品时， 披露了其他样品。 还公开了一种样品运送方法和计算机程序产品。

    Sample analyzer and calibration method of sample analyzer
    15.
    发明授权
    Sample analyzer and calibration method of sample analyzer 有权
    样品分析仪和样品分析仪的校准方法

    公开(公告)号：US08252593B2

    公开(公告)日：2012-08-28

    申请号：US12589863

    申请日：2009-10-28

    申请人： Daigo Fukuma ,  Masaharu Shibata

    发明人： Daigo Fukuma ,  Masaharu Shibata

    IPC分类号： G01N31/00 ,  G01N33/00

    CPC分类号： G01N35/00693 ,  G01N35/026 ,  Y10T436/10 ,  Y10T436/11 ,  Y10T436/113332

    摘要： A sample analyzer is disclosed that includes a first measurement unit for measuring a sample, a second measurement unit for measuring a sample, and an information processing unit for acquiring a first analysis result based on a result of the measurement by the first measurement unit and a second analysis result based on a result of the measurement by the second measurement unit. The information processing unit is configured to correct the first analysis result based on a first correction value, correct the second analysis result based on a second correction value, update the first correction value, and update the second correction value. A calibration method of a sample analyzer is also disclosed.

    摘要翻译： 公开了一种样本分析器，其包括用于测量样本的第一测量单元，用于测量样本的第二测量单元，以及用于基于第一测量单元的测量结果获取第一分析结果的信息处理单元，以及 基于第二测量单元的测量结果的第二分析结果。 信息处理单元被配置为基于第一校正值来校正第一分析结果，基于第二校正值校正第二分析结果，更新第一校正值，并更新第二校正值。 还公开了一种样品分析仪的校准方法。

    Sample analyzer and calibration method of sample analyzer
    16.
    发明申请
    Sample analyzer and calibration method of sample analyzer 有权
    样品分析仪和样品分析仪的校准方法

    公开(公告)号：US20100105142A1

    公开(公告)日：2010-04-29

    申请号：US12589863

    申请日：2009-10-28

    申请人： Daigo Fukuma ,  Masaharu Shibata

    发明人： Daigo Fukuma ,  Masaharu Shibata

    IPC分类号： G01N31/00 ,  G01N33/00

    CPC分类号： G01N35/00693 ,  G01N35/026 ,  Y10T436/10 ,  Y10T436/11 ,  Y10T436/113332

    摘要： A sample analyzer is disclosed that comprises: a first measurement unit for measuring a sample; a second measurement unit for measuring a sample; and an information processing unit for acquiring a first analysis result based on a result of the measurement by the first measurement unit and a second analysis result based on a result of the measurement by the second measurement unit, wherein the information processing unit is configured to: correct the first analysis result based on a first correction value, correct the second analysis result based on a second correction value, update the first correction value, and update the second correction value. A calibration method of a sample analyzer is also disclosed.

    摘要翻译： 公开了一种样品分析仪，其包括：用于测量样品的第一测量单元; 用于测量样品的第二测量单元; 以及信息处理单元，用于基于第一测量单元的测量结果获取第一分析结果和基于第二测量单元的测量结果的第二分析结果，其中所述信息处理单元被配置为： 基于第一校正值校正第一分析结果，基于第二校正值校正第二分析结果，更新第一校正值，并更新第二校正值。 还公开了一种样品分析仪的校准方法。

    SPECIMEN PROCESSING DEVICE AND SPECIMEN PROCESSING METHOD
    18.
    发明申请
    SPECIMEN PROCESSING DEVICE AND SPECIMEN PROCESSING METHOD 有权
    样本处理设备和样本处理方法

    公开(公告)号：US20100282003A1

    公开(公告)日：2010-11-11

    申请号：US12775866

    申请日：2010-05-07

    申请人： Yuichi Hamada ,  Takaaki Nagai ,  Masaharu Shibata

    发明人： Yuichi Hamada ,  Takaaki Nagai ,  Masaharu Shibata

    IPC分类号： G01N1/00 ,  G01N33/00

    CPC分类号： G01N35/00722 ,  G01N35/0092 ,  G01N35/0095 ,  G01N2035/00742 ,  G01N2035/00851 ,  G01N2035/0415

    摘要： A specimen processing device comprising: first and second units for processing specimens; a conveyance unit for conveying a specimen rack in a first direction from a first position where the specimen is retrieved by the first unit to a second position where the specimen is retrieved by the second unit, and a second direction opposite to the first position; a detector common to the first and second units for executing a detection process with respect to the sample containers; and a conveyance controller controlling the conveyance unit to convey some sample containers of the detected sample containers executed with the detection process to the first position, and to convey the other sample containers of the detected sample containers to the second position, the some sample containers and the other sample containers being held by a common rack, is disclosed. A specimen processing method is also disclosed.

    摘要翻译： 一种试样处理装置，包括：第一和第二单元，用于处理样品; 用于将样品从第一单元取回的第一位置沿第一方向输送到第二位置的第二位置，以及与第一位置相反的第二方向的传送单元; 用于执行关于样本容器的检测过程的第一和第二单元共同的检测器; 以及输送控制器，其控制所述输送单元将检测到的检测样品容器的一些样本容器输送到所述第一位置，并将检测到的样本容器的其他样本容器输送到第二位置，所述一些样本容器和 披露了另一个样本容器被公共机架保持。 还公开了一种样品处理方法。

    ANALYSIS APPARATUS AND ANALYSIS METHOD
    19.
    发明申请
    ANALYSIS APPARATUS AND ANALYSIS METHOD 有权
    分析装置和分析方法

    公开(公告)号：US20100330609A1

    公开(公告)日：2010-12-30

    申请号：US12875913

    申请日：2010-09-03

    申请人： Takaaki Nagai ,  Yuichi Hamada ,  Masaharu Shibata

    发明人： Takaaki Nagai ,  Yuichi Hamada ,  Masaharu Shibata

    IPC分类号： C12Q1/02 ,  C12M1/34

    CPC分类号： G01N35/026 ,  G01N35/0092 ,  G01N35/0095 ,  G01N2035/00326 ,  G01N2035/0412 ,  G01N2035/0484 ,  Y10T436/114165

    摘要： This analysis apparatus includes a transporter transporting the specimens to the first measurement unit and the second measurement unit, and a control portion so controlling the transporter as to transport a first specimen container, stored in the rack, storing a first specimen to the first measurement unit and as to transport a second specimen container, stored in the rack along with the first specimen container, storing a second specimen to the second measurement unit.

    摘要翻译： 这种分析装置包括将样本运送到第一测量单元和第二测量单元的运送器，以及控制部分，其控制运送器运送存储在架子中的第一样本容器，将第一样本存储到第一测量单元 以及与第一样本容器一起运送存储在架子中的第二样本容器，将第二样本存储到第二测量单元。

    Specimen processing device and specimen processing method
    20.
    发明授权
    Specimen processing device and specimen processing method 有权
    样品处理装置和样品处理方法

    公开(公告)号：US08347743B2

    公开(公告)日：2013-01-08

    申请号：US12775866

    申请日：2010-05-07

    申请人： Yuichi Hamada ,  Takaaki Nagai ,  Masaharu Shibata

    发明人： Yuichi Hamada ,  Takaaki Nagai ,  Masaharu Shibata

    IPC分类号： B01L3/02

    CPC分类号： G01N35/00722 ,  G01N35/0092 ,  G01N35/0095 ,  G01N2035/00742 ,  G01N2035/00851 ,  G01N2035/0415

    摘要： A specimen processing device comprising: first and second units for processing specimens; a conveyance unit for conveying a specimen rack in a first direction from a first position where the specimen is retrieved by the first unit to a second position where the specimen is retrieved by the second unit, and a second direction opposite to the first position; a detector common to the first and second units for executing a detection process with respect to the sample containers; and a conveyance controller controlling the conveyance unit to convey some sample containers of the detected sample containers executed with the detection process to the first position, and to convey the other sample containers of the detected sample containers to the second position, the some sample containers and the other sample containers being held by a common rack, is disclosed. A specimen processing method is also disclosed.

    摘要翻译： 一种试样处理装置，包括：第一和第二单元，用于处理样品; 用于将样品从第一单元取回的第一位置沿第一方向输送到第二位置的第二位置，以及与第一位置相反的第二方向的传送单元; 用于执行关于样本容器的检测过程的第一和第二单元共同的检测器; 以及输送控制器，其控制所述输送单元将检测到的检测样品容器的一些样本容器输送到所述第一位置，并将检测到的样本容器的其他样本容器输送到第二位置，所述一些样本容器和 披露了另一个样本容器被公共机架保持。 还公开了一种样品处理方法。