AREA EFFICIENT PROGRAMMABLE READ ONLY MEMORY (PROM) ARRAY
    11.
    发明申请
    AREA EFFICIENT PROGRAMMABLE READ ONLY MEMORY (PROM) ARRAY 有权
    区域高效可编程只读存储器(PROM)阵列

    公开(公告)号:US20090080232A1

    公开(公告)日:2009-03-26

    申请号:US11861293

    申请日:2007-09-26

    IPC分类号: G11C17/00

    CPC分类号: G11C17/16 G11C17/18

    摘要: A programmable ROM (PROM) architecture includes cascode NMOS transistors with a fuse bit cell that is arrayed, with sleep transistors located in each column of the array that in a standby mode shut down the entire fuse array. A fuse redundancy scheme may be used to repair a defective fuse row.

    摘要翻译: 可编程ROM(PROM)架构包括具有排列的熔丝位单元的级联NMOS晶体管,其中位于阵列的每列中的休眠晶体管在待机模式下关闭整个熔丝阵列。 熔丝冗余方案可用于修复有缺陷的熔丝排。

    Programmable read only memory
    13.
    发明授权
    Programmable read only memory 有权
    可编程只读存储器

    公开(公告)号:US08411482B2

    公开(公告)日:2013-04-02

    申请号:US12229117

    申请日:2008-08-20

    CPC分类号: G11C17/16 G11C17/18

    摘要: A memory cell includes a fuse and at least one transistor. The transistor is used to control the programming or sensing of the fuse. A program voltage is applied to a stack of first and second conductive layers. A first portion of the stack couples the program voltage to a terminal of the transistor in a cell. A second portion of the stack couples the program voltage to a terminal of the transistor in another cell.

    摘要翻译: 存储单元包括熔丝和至少一个晶体管。 晶体管用于控制保险丝的编程或感测。 将编程电压施加到第一和第二导电层的堆叠。 堆叠的第一部分将编程电压耦合到单元中的晶体管的端子。 堆叠的第二部分将编程电压耦合到另一个单元中的晶体管的端子。

    Fuse cell having adjustable sensing margin
    14.
    发明申请
    Fuse cell having adjustable sensing margin 有权
    具有可调节传感距离的保险丝盒

    公开(公告)号:US20070217251A1

    公开(公告)日:2007-09-20

    申请号:US11377135

    申请日:2006-03-15

    IPC分类号: G11C11/00

    CPC分类号: G11C17/18 G11C17/16

    摘要: An apparatus, a method, and a system for fuse cells are disclosed herein. In various embodiments, a fuse cell may include circuitry to adjust a sensing margin.

    摘要翻译: 本文公开了一种用于熔丝电池的装置,方法和系统。 在各种实施例中,熔丝单元可以包括用于调整感测余量的电路。

    Flip-flop circuit with transmission-gate sampling
    16.
    发明授权
    Flip-flop circuit with transmission-gate sampling 失效
    具有传输门采样的触发电路

    公开(公告)号:US06509772B1

    公开(公告)日:2003-01-21

    申请号:US09694553

    申请日:2000-10-23

    IPC分类号: H03K3356

    CPC分类号: H03K3/037 H03K3/356156

    摘要: A flip-flop circuit comprising a first stage having a transmission gate to receive a data signal from an input node, and a second stage connected to the first stage, the second stage having another transmission gate to transfer the data signal to a memory unit, wherein the memory unit provides complementary output signals.

    摘要翻译: 一种触发器电路,包括具有传输门以从输入节点接收数据信号的第一级和连接到第一级的第二级,第二级具有用于将数据信号传送到存储器单元的另一传输门, 其中所述存储器单元提供互补的输出信号。

    NECKED INTERCONNECT FUSE STRUCTURE FOR INTEGRATED CIRCUITS
    17.
    发明申请
    NECKED INTERCONNECT FUSE STRUCTURE FOR INTEGRATED CIRCUITS 审中-公开
    集成电路的联合互连保险丝结构

    公开(公告)号:US20170018499A1

    公开(公告)日:2017-01-19

    申请号:US15124867

    申请日:2014-05-08

    摘要: Interconnect fuse structures including a fuse with a necked line segment, as well as methods of fabricating such structures. A current driven by an applied fuse programming voltage may open necked fuse segments to affect operation of an IC. In embodiments, the fuse structure includes a pair of neighboring interconnect lines equidistant from a center interconnect line. In further embodiments, the center interconnect line, and at least one of the neighboring interconnect lines, include line segments of lateral widths that differ by a same, and complementary amount. In further embodiments, the center interconnect line is interconnected at opposite ends of a necked line segment. In further embodiments, the necked line segment is fabricated with pitch-reducing spacer-based patterning process.

    摘要翻译: 互连保险丝结构,包括带有颈缩线段的保险丝,以及制造这种结构的方法。 由施加的保险丝编程电压驱动的电流可以打开颈部熔断器段以影响IC的工作。 在实施例中,熔丝结构包括与中心互连线等距的一对相邻的互连线。 在另外的实施例中,中心互连线以及相邻互连线中的至少一个包括横向宽度的线段,其相差相同且互补。 在另外的实施例中,中心互连线在颈缩线段的相对端互连。 在进一步的实施例中,颈缩线段由间距减小的基于间隔物的图案化工艺制成。

    Leakage control in integrated circuits
    20.
    发明授权
    Leakage control in integrated circuits 有权
    集成电路中的泄漏控制

    公开(公告)号:US07302652B2

    公开(公告)日:2007-11-27

    申请号:US10404937

    申请日:2003-03-31

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5045 G06F2217/08

    摘要: Although there are a number of techniques available to reduce leakage current, there is still considerable room for improvement. Accordingly, the present inventors devised, among other things, an exemplary method which entails defining first and second leakage-reduction vectors for respective first and second portions of an integrated circuit, such as a microprocessor. The leakage-reduction vectors, in some embodiments, set the first and second portion to minimum leakage states and thus promise to reduce leakage power and extend battery life in devices that incorporate this technology.

    摘要翻译: 虽然有许多技术可以减少泄漏电流,但仍有相当大的改进空间。 因此,本发明人设计了一种示例性方法,其需要为诸如微处理器的集成电路的各个第一和第二部分定义第一和第二泄漏减少向量。 在一些实施例中,泄漏减少矢量将第一部分和第二部分设置为最小的泄漏状态,并且因此有助于降低泄漏功率并延长结合该技术的设备中的电池寿命。