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    METHOD AND APPARATUS FOR ANALYZING IMAGERY DATA
    11.
    发明申请
    METHOD AND APPARATUS FOR ANALYZING IMAGERY DATA 审中-公开
    用于分析图像数据的方法和装置

    公开(公告)号：US20100177942A1

    公开(公告)日：2010-07-15

    申请号：US12687169

    申请日：2010-01-14

    Applicant: Tsafrir KOLATT ,  Elior Shenhav

    Inventor： Tsafrir KOLATT ,  Elior Shenhav

    IPC: G06K9/00

    CPC classification number: G06K9/0014 ,  G06T7/0012 ,  G06T7/90 ,  G06T11/001 ,  G06T2207/10024 ,  G06T2207/10056 ,  G06T2207/30024

    Abstract: According to an aspect of some embodiments of the present invention there is provided a method of analyzing imagery data pertaining to a biological sample. the method comprises: identifying structures of biological elements in the imagery data based on achromatic intensity values of the imagery data, and displaying the imagery data as a color-coded image.

    Abstract translation: 根据本发明的一些实施例的一个方面，提供了一种分析与生物样品有关的图像数据的方法。 该方法包括：基于图像数据的消色差强度值来识别图像数据中生物元素的结构，并将图像数据显示为彩色图像。

    Method, apparatus and system for characterizing pathological specimen
    12.
    发明申请
    Method, apparatus and system for characterizing pathological specimen 审中-公开
    用于表征病理标本的方法，装置和系统

    公开(公告)号：US20070135999A1

    公开(公告)日：2007-06-14

    申请号：US11480480

    申请日：2006-07-05

    Applicant: Tsafrir Kolatt

    Inventor： Tsafrir Kolatt

    IPC: C12Q1/00 ,  G06F19/00

    CPC classification number: G01N33/5082 ,  G01N15/1475 ,  G01N21/31 ,  G06K9/0014 ,  G06T7/0012 ,  G06T2207/30072

    Abstract: A method for characterizing a stained pathological specimen is disclosed. The method comprises obtaining an image of the specimen, classifying the picture-elements of the image into classification groups, and using the classification groups to define at least one set of picture-elements corresponding to at least one tissue region of the pathological specimen. The method further comprises applying, on each set of picture-elements, at least one set-operator so as to characterize the tissue regions according to image data and spatial characteristics of the set.

    Abstract translation: 公开了一种染色病理样本的表征方法。 该方法包括获得样本的图像，将图像的图像元素分类为分类组，以及使用分类组来定义与病理标本的至少一个组织区域对应的至少一组图像元素。 该方法还包括在每组图像元素上应用至少一个集合算子，以便根据该组的图像数据和空间特征来表征组织区域。

    Optical device with entrance and exit paths that are stationary under device rotation
    14.
    发明授权
    Optical device with entrance and exit paths that are stationary under device rotation 失效
    具有在设备旋转下静止的入口和出口路径的光学设备

    公开(公告)号：US6075599A

    公开(公告)日：2000-06-13

    申请号：US12412

    申请日：1998-01-23

    Applicant: Uri Milman ,  Dario Cabib

    Inventor： Uri Milman ,  Dario Cabib

    IPC: C12Q1/68 ,  G01J3/02 ,  G01J3/12 ,  G01J3/26 ,  G01J3/28 ,  G01J3/44 ,  G01J3/453 ,  G01N21/64 ,  G06K9/00 ,  G06K9/76 ,  G01B9/02

    CPC classification number: G06K9/76 ,  C12Q1/6841 ,  C12Q1/6883 ,  G01J3/12 ,  G01J3/1256 ,  G01J3/26 ,  G01J3/4406 ,  G01J3/453 ,  G06K9/00127 ,  G01J2003/2866 ,  G01J3/02

    Abstract: An rotating optical device in which the angular relationship of the exit beam to the incident beam is independent of the degree of rotation of the device. Two optical elements are defined by planes that intersect at a 45.degree. angle. A third optical element is defined by a plane that bisects the 45.degree. angle. The device is rotated about the line included by all three planes. In an embodiment of the device configured as a Sagnac interferometer, the first two optical elements are reflectors and the third element is a beamsplitter. Preferably, up to eight such interferometers are mounted on the same rotating platform and with the same rotational axis, for extended spectral bandwidth. The scope of the invention also includes spectral imaging devices based on such interferometers.

    Abstract translation: 一种旋转光学装置，其中出射光束与入射光束的角度关系与装置的旋转度无关。 两个光学元件由与45度角相交的平面限定。 第三个光学元件由平分45°角的平面限定。 该装置围绕所有三个平面所包括的线旋转。 在配置为Sagnac干涉仪的装置的实施例中，前两个光学元件是反射器，第三元件是分束器。 优选地，多达八个这样的干涉仪安装在相同的旋转平台上并具有相同的旋转轴线，用于扩展的光谱带宽。 本发明的范围还包括基于这种干涉仪的光谱成像装置。

    Method for remote sensing analysis be decorrelation statistical analysis and hardware therefor
    16.
    发明授权
    Method for remote sensing analysis be decorrelation statistical analysis and hardware therefor 失效
    遥感分析方法是去相关统计分析及其硬件

    公开(公告)号：US6018587A

    公开(公告)日：2000-01-25

    申请号：US886293

    申请日：1997-07-01

    Applicant: Dario Cabib

    Inventor： Dario Cabib

    IPC: G01J3/28 ,  C12Q1/68 ,  G01J3/02 ,  G01J3/12 ,  G01J3/26 ,  G01J3/44 ,  G01J3/453 ,  G01N21/64 ,  G01N33/50 ,  G01N33/569 ,  G01N33/58 ,  G06K9/00 ,  G06K9/76 ,  G06T1/00 ,  G06K9/62

    CPC classification number: G01J3/12 ,  G01J3/1256 ,  G01J3/26 ,  G01J3/2823 ,  G01J3/4406 ,  G01J3/453 ,  G01N21/6428 ,  G01N21/6458 ,  G01N33/5005 ,  G01N33/56966 ,  G01N33/582 ,  G06K9/00127 ,  G06K9/00201 ,  G06K9/0063 ,  G06K9/76 ,  G01J2003/2866 ,  G01J3/02

    Abstract: A method for remote scenes classification comprising the steps of (a) preparing a reference template for classification of the remote scenes via (i) classifying a set of reference scenes via a conventional classification technique for obtaining a set of preclassified reference scenes; (ii) using a first spectral imager for measuring a spectral cube of the preclassified reference scenes; (iii) employing a principal component analysis for extracting the spectral cube for decorrelated spectral data characterizing the reference scenes; and (vi) using at least a part of the decorrelated spectral data for the preparation of the reference template for remote scenes classification; (b) using a second spectral imager for measuring a spectral cube of analyzed remote scenes, such that a spectrum of each pixel in the remote scenes is obtained; (c) employing a decorrelation statistical method for extracting decorrelated spectral data characterizing the pixels; and (d) comparing at least a part of the decorrelated spectral data extracted from the pixels of the remote scenes with the reference template.

    Abstract translation: 一种用于远程场景分类的方法，包括以下步骤：（a）通过（i）通过用于获得一组预分类参考场景的常规分类技术对一组参考场景进行分类，准备用于远程场景分类的参考模板; （ii）使用第一光谱成像仪来测量预分类参考场景的光谱立方体; （iii）采用主成分分析来提取表征参考场景的去相关光谱数据的光谱立方体; 和（vi）使用去相关光谱数据的至少一部分来准备用于远程场景分类的参考模板; （b）使用第二光谱成像仪来测量分析的远程场景的光谱立方体，使得获得远程场景中每个像素的光谱; （c）采用解相关统计方法来提取表征像素的去相关光谱数据; 和（d）将从远程场景的像素提取的去相关光谱数据的至少一部分与参考模板进行比较。

    Film thickness mapping using interferometric spectral imaging
    18.
    发明授权
    Film thickness mapping using interferometric spectral imaging 失效
    使用干涉光谱成像的膜厚度测绘

    公开(公告)号：US5856871A

    公开(公告)日：1999-01-05

    申请号：US776063

    申请日：1997-01-21

    Applicant: Dario Cabib ,  Robert A. Buckwald ,  Michael E. Adel

    Inventor： Dario Cabib ,  Robert A. Buckwald ,  Michael E. Adel

    IPC: C12Q1/68 ,  G01B11/06 ,  G01J3/02 ,  G01J3/26 ,  G01J3/28 ,  G01J3/453 ,  G01N21/64 ,  G01N33/50 ,  G01N33/569 ,  G06K9/00 ,  G06K9/76 ,  G01B9/02

    CPC classification number: G06K9/76 ,  C12Q1/6841 ,  C12Q1/6883 ,  G01B11/0675 ,  G01J3/2823 ,  G01J3/453 ,  G01N33/5005 ,  G01N33/56966 ,  G06K9/00127 ,  G01J2003/2866 ,  G01J3/02 ,  G01J3/26

    Abstract: A method of determining the thickness map of a film (14) overlying a substrate (14). This method includes illuminating (10) the film simultaneously from different angles and analyzing spectral intensity of the radiation reflected by each point on the film (14). The analysis is effected by collecting reflected radiation from the film (14), passing the radiation through an interferometer (16) which outputs modulated radiation corresponding to a predetermined set of linear combinations of the spectral intensity of the radiation emitted from each pixel, simultaneously and separately scanning optical path differences generated in the interferometer (16) for each pixel, focusing the radiation outputted from the interferometer (16) on a detector array, and processing the output of the detector array to determine the spectral intensity of each pixel thereof to obtain a spectral intensity distribution. Finally, the method includes further processing the spectral intensity distribution to determine the spatial distribution of the thickness of the film (16).

    Abstract translation: PCT No.PCT / US95 / 08708 Sec。 371日期1997年1月21日 102（e）日期1997年1月21日PCT提交1995年7月12日PCT公布。 公开号WO96 / 03615 日期1996年2月8日一种确定覆盖衬底（14）的膜（14）的厚度图的方法。 该方法包括从不同角度同时照射（10）胶片并分析由胶片（14）上的每个点反射的辐射的光谱强度。 分析是通过收集来自胶片（14）的反射辐射，使辐射通过干涉仪（16），干涉仪（16）同时输出对应于从每个像素发射的辐射的光谱强度的预定的一组线性组合的调制辐射， 分别扫描针对每个像素的干涉仪（16）中产生的光程差，将从干涉仪（16）输出的辐射聚焦在检测器阵列上，并且处理检测器阵列的输出以确定其每个像素获得的光谱强度 光谱强度分布。 最后，该方法包括进一步处理光谱强度分布以确定薄膜（16）的厚度的空间分布。

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