公开(公告)号：US09182758B1

公开(公告)日：2015-11-10

申请号：US14634636

申请日：2015-02-27

申请人： Michael H S Dunlop

发明人： Michael H S Dunlop

IPC分类号： G05B19/418

CPC分类号： G05B19/41875 ,  G01B21/30 ,  G05B19/418 ,  G05B2219/32212 ,  G05B2219/32218 ,  G05B2219/32368 ,  Y02P90/02 ,  Y02P90/04 ,  Y02P90/18 ,  Y02P90/22

摘要： A computer-implemented system and method for capability zone-based manufacturing quality control are provided. A specification for manufacturing a part feature is obtained, the specification including a nominal and a tolerance. A plurality of measurements for the feature are obtained. A difference is determined between the nominal and each of the measurements. The difference for each of the measurements is compared to the tolerance. Each of the measurements is assigned into one of a plurality of capability zones of measurements based on the comparison. Visual representations of the capability zones into which the measurements were assigned are displayed.

摘要翻译： 提供了一种基于能力区域制造质量控制的计算机实现的系统和方法。 获得用于制造零件特征的规范，该规范包括标称和公差。 获得该特征的多个测量。 在标称值和每个测量值之间确定差异。 将每个测量值的差异与公差进行比较。 基于比较将每个测量值分配到多个测量能力区域中的一个。 显示分配了测量值的能力区域的视觉表示。

公开(公告)号：US20080004742A1

公开(公告)日：2008-01-03

申请号：US11892583

申请日：2007-08-24

申请人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

发明人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

IPC分类号： G06F19/00

CPC分类号： G05B19/41875 ,  G05B2219/32218 ,  Y02P90/22

摘要： The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

摘要翻译： 本发明提出了一种系统，当ADC处理不能通过一个ADC不能跟踪ADR而不能执行但对具有高优先级的ADR使用ADC时，中断与具有低优先级的ADC相关联的处理的系统。 为了优先执行具有高优先级的ADR / ADC，本发明采用一种用于从ADR / ADC中的处理能力较高（按DPH单元的表达式中的较大数值的数量级）的顺序选择ADR / ADC的算法， 优先级最低，无论ADR / DC是否在执行中。

公开(公告)号：US07239970B2

公开(公告)日：2007-07-03

申请号：US11112190

申请日：2005-04-22

申请人： David Treves ,  Thomas A. O'Dell

发明人： David Treves ,  Thomas A. O'Dell

IPC分类号： B07C5/344

CPC分类号： G05B19/41875 ,  G01N21/9506 ,  G05B2219/32218 ,  Y02P90/22 ,  Y02P90/28

摘要： A manufacturing cell for inspecting workpieces such as magnetic disk substrates comprises an input conveyor for providing workpieces to be tested, one or more testers for inspecting the workpieces, and three or more output receptacles for receiving tested workpieces. One or more robotic arms move the workpieces from the input conveyor to the tester and from the tester to one of the output receptacles depending upon the results of the test performed by the tester. The output receptacles include a pass receptacle, a reject receptacle, and at least an additional receptacle for workpieces that are to be re-worked or studied further. If the additional receptacle is full, workpieces that would otherwise be provided to the additional bin are placed in the reject receptacle. The reject receptacle is very large, so that it is rarely filled to capacity.

摘要翻译： 用于检查诸如磁盘基板的工件的制造单元包括用于提供待测试的工件的输入输送机，用于检查工件的一个或多个测试器以及用于接收测试的工件的三个或更多个输出插座。 根据测试仪进行的测试结果，一个或多个机器人手臂将工件从输入输送机移动到测试仪，并从测试仪移动到输出容器之一。 输出插座包括通孔插座，拒收容器，以及用于进一步重新加工或研究的工件的至少一个附加插座。 如果附加的容器已满，则否则将提供给附加箱的工件放置在废品容器中。 废品容器非常大，因此很少装满容量。

公开(公告)号：US06223098B1

公开(公告)日：2001-04-24

申请号：US09517445

申请日：2000-03-02

申请人： Kwang Yung Cheong ,  Ann Seong Lee ,  Jae Young Kim

发明人： Kwang Yung Cheong ,  Ann Seong Lee ,  Jae Young Kim

IPC分类号： B07C1700

CPC分类号： B07C5/344 ,  G01R31/2894 ,  G05B2219/32218 ,  Y02P90/22

摘要： A test control system for controlling overall test procedures which processes test data generated from the final test process and analyzes bin category results. The control system uses testers for testing electrical characteristics of IC devices, a host computer for processing data transmitted from the testers and for creating a number of database structures, and distributed computers for monitoring the test progress and analyzing the test results using the database structures stored in the host computer. A control method using the control system includes the steps of: performing a final test as a lot; monitoring the status of the final test progress while storing test data during the final test; determining if the final test is completed; performing a lot decision after the final test is completed based on bin category limits; and displaying the lot decision result and storing the test data. The lot decision is based upon any bin category having a bin capacity exceeding its bin category limit by greater than a certain predetermined value even though the lot meets the yield requirement. As a result, the control system can detect an abnormal lot more easily than a system in which the lot decision is based only on yield.

摘要翻译： 一种用于控制整体测试程序的测试控制系统，用于处理从最终测试过程产生的测试数据并分析箱类别结果。 控制系统使用测试仪测试IC设备的电气特性，用于处理从测试人员发送的数据并创建多个数据库结构的主机，以及用于监视测试进度的分布式计算机，并使用存储的数据库结构分析测试结果 在主机上。 使用该控制系统的控制方法包括以下步骤：进行最终测试; 在最终测试期间存储测试数据时监控最终测试进度的状态; 确定最终测试是否完成; 在最终测试完成后根据箱类别限制进行很多决定; 并显示批次决定结果并存储测试数据。 批次决定是基于具有超过其仓类别限制的箱体容量大于某一预定值的任何箱类型，即使批量满足产量要求。 因此，控制系统可以比批量决策仅基于产量的系统更容易地检测异常批次。

公开(公告)号：US20170131706A1

公开(公告)日：2017-05-11

申请号：US15406579

申请日：2017-01-13

申请人： Net-Inspect, LLC.

发明人： Michael H. S. Dunlop

IPC分类号： G05B19/418 ,  G01B21/30

CPC分类号： G05B19/41875 ,  G01B21/30 ,  G05B19/418 ,  G05B2219/32212 ,  G05B2219/32218 ,  G05B2219/32368 ,  Y02P90/02 ,  Y02P90/04 ,  Y02P90/18 ,  Y02P90/22

摘要： A computer-implemented system and method for part surface manufacturing quality control are provided. A specification for manufacturing a part surface is maintained in a storage, the specification comprising a target value for a profile characteristic of the surface. Measurements of the profile characteristic of the surface produced during multiple manufacturing runs are maintained in the storage, wherein the surface produced during each of the manufacturing runs is associated with two or more of the measurements made at different points of the surface. A score for each of the measurements is calculated based on how the close that measurement is to the target value. For the surface produced during one or more of the manufacturing runs, the scores for at least some of the measurements made for that surface during that manufacturing run are displayed.

公开(公告)号：US20100021047A1

公开(公告)日：2010-01-28

申请号：US12573463

申请日：2009-10-05

申请人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

发明人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

IPC分类号： G06K9/00

CPC分类号： G05B19/41875 ,  G05B2219/32218 ,  Y02P90/22

摘要： The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

摘要翻译： 本发明提出了一种系统，当ADC处理不能通过一个ADC不能跟踪ADR而不能执行但对具有高优先级的ADR使用ADC时，中断与具有低优先级的ADC相关联的处理的系统。 为了优先执行具有高优先级的ADR / ADC，本发明采用一种用于从ADR / ADC中的处理能力较高（按DPH单元的表达式中的较大数值的数量级）的顺序选择ADR / ADC的算法， 优先级最低，无论ADR / DC是否在执行中。

公开(公告)号：US07584012B2

公开(公告)日：2009-09-01

申请号：US11892583

申请日：2007-08-24

申请人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

发明人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

IPC分类号： G06F19/00 ,  G06K9/00

CPC分类号： G05B19/41875 ,  G05B2219/32218 ,  Y02P90/22

摘要： An automatic defect review and classification system including at least one automatic defect review apparatus for specifically observing defect portions of a sample and at least one automatic defect classification apparatus for automatically classifying the defects, the system further comprising a device which outputs a status for combination of the automatic review apparatus and the automatic defect classification apparatus.

摘要翻译： 一种自动缺陷检查和分类系统，包括至少一个用于特异性地观察样本的缺陷部分的自动缺陷检查装置和用于自动分类缺陷的至少一个自动缺陷分类装置，所述系统还包括输出状态用于组合的装置 自动检查装置和自动缺陷分类装置。

公开(公告)号：US20060282190A1

公开(公告)日：2006-12-14

申请号：US11451330

申请日：2006-06-13

申请人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

发明人： Takehiro Hirai ,  Kazuo Aoki ,  Kenji Obara

IPC分类号： G06F19/00

CPC分类号： G05B19/41875 ,  G05B2219/32218 ,  Y02P90/22

摘要： The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

摘要翻译： 本发明提出了一种系统，当ADC处理不能通过一个ADC不能跟踪ADR而不能执行但对具有高优先级的ADR使用ADC时，中断与具有低优先级的ADC相关联的处理的系统。 为了优先执行具有高优先级的ADR / ADC，本发明采用一种用于从ADR / ADC中的处理能力较高（按DPH单元的表达式中的较大数值的数量级）的顺序选择ADR / ADC的算法， 优先级最低，无论ADR / DC是否在执行中。

公开(公告)号：US07139630B1

公开(公告)日：2006-11-21

申请号：US10908135

申请日：2005-04-28

申请人： Frances S. Clougherty ,  Benjamin R. Bayat

发明人： Frances S. Clougherty ,  Benjamin R. Bayat

IPC分类号： G06F19/00 ,  G01R31/26 ,  H01L21/66

CPC分类号： G05B19/4183 ,  G05B2219/31292 ,  G05B2219/32218 ,  G05B2219/45026 ,  Y02P80/30 ,  Y02P90/10 ,  Y02P90/22

摘要： A method and system sorts manufactured integrated circuit devices by evaluating performance characteristics of the manufactured integrated circuit devices. All of the integrated circuit devices are manufactured using an identical design, and differences in the performance characteristics among the integrated circuit devices occurs because of variations including manufacturing line variations. The integrated circuit devices are sorted into groups according to the performance characteristics and are utilized in different computing devices depending upon individual performance requirements of the computing devices.

摘要翻译： 一种方法和系统通过评估所制造的集成电路器件的性能特征来对制造的集成电路器件进行排序。 所有的集成电路器件都是使用相同的设计制造的，并且集成电路器件的性能特性之间的差异是由于包括生产线变化在内的变化而发生的。 集成电路设备根据性能特征被分类成组，并且根据计算设备的各个性能要求在不同的计算设备中使用。

公开(公告)号：US6055463A

公开(公告)日：2000-04-25

申请号：US80192

申请日：1998-05-18

申请人： Kwang Yung Cheong ,  Ann Seong Lee ,  Jae Young Kim

发明人： Kwang Yung Cheong ,  Ann Seong Lee ,  Jae Young Kim

IPC分类号： G01D21/00 ,  B07C5/344 ,  G01R31/26 ,  G01R31/28 ,  G06F17/00 ,  G07F7/00 ,  H01L21/02 ,  H01L21/66 ,  H01L49/00 ,  B07C17/00

CPC分类号： B07C5/344 ,  G01R31/2894 ,  G05B2219/32218 ,  Y02P90/22

摘要： A test control system for controlling overall test procedures which processes test data generated from the final test process and analyzes bin category results. The control system uses testers for testing electrical characteristics of IC devices, a host computer for processing data transmitted from the testers and for creating a number of database structures, and distributed computers for monitoring the test progress and analyzing the test results using the database structures stored in the host computer. A control method using the control system includes the steps of: performing a final test as a lot; monitoring the status of the final test progress while storing test data during the final test; determining if the final test is completed; performing a lot decision after the final test is completed based on bin category limits; and displaying the lot decision result and storing the test data. The lot decision is based upon any bin category having a bin capacity exceeding its bin category limit by greater than a certain predetermined value even though the lot meets the yield requirement. As a result, the control system can detect an abnormal lot more easily than a system in which the lot decision is based only on yield.

摘要翻译： 一种用于控制整体测试程序的测试控制系统，用于处理从最终测试过程产生的测试数据并分析箱类别结果。 控制系统使用测试仪测试IC设备的电气特性，用于处理从测试人员发送的数据并创建多个数据库结构的主机，以及用于监视测试进度的分布式计算机，并使用存储的数据库结构分析测试结果 在主机上。 使用该控制系统的控制方法包括以下步骤：进行最终测试; 在最终测试期间存储测试数据时监控最终测试进度的状态; 确定最终测试是否完成; 在最终测试完成后根据箱类别限制进行很多决定; 并显示批次决定结果并存储测试数据。 批次决定是基于具有超过其仓类别限制的箱体容量大于某一预定值的任何箱类型，即使批量满足产量要求。 因此，控制系统可以比批量决策仅基于产量的系统更容易地检测异常批次。