Method for visualizing process information during manufacturing of sheet metal workpieces

    公开(公告)号:US12013689B2

    公开(公告)日:2024-06-18

    申请号:US17231059

    申请日:2021-04-15

    IPC分类号: G05B19/418 B26D5/00

    摘要: A method visualizes manufacturing process information during manufacturing of workpieces with a flatbed machine tool. The workpieces are output as cut material on a pallet of the flatbed machine tool, a sorting table, or a conveyor belt. Workpiece image data is provided in a control system. The image data is associated with a workpiece and is for display on a display unit. Workpiece-specific manufacturing process information is provided in the manufacturing control system, and is acquired during manufacturing of the workpieces and includes features of cutting processes. A database of illustration options is provided in the manufacturing control system, the options are associated with a specific manufacturing feature and are applicable to the workpiece image data to cause an illustration of the respective workpiece image data on the display unit. The workpiece image data is displayed on the display unit, while taking into account illustration options in the workpiece-specific manner.

    Defect review and classification system
    3.
    发明授权
    Defect review and classification system 有权
    缺陷审查和分类制度

    公开(公告)号:US07925367B2

    公开(公告)日:2011-04-12

    申请号:US12573463

    申请日:2009-10-05

    IPC分类号: G06F19/00

    摘要: The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

    摘要翻译: 本发明提出了一种系统,当ADC处理不能通过一个ADC不能跟踪ADR而不能执行但对具有高优先级的ADR使用ADC时,中断与具有低优先级的ADC相关联的处理的系统。 为了优先执行具有高优先级的ADR / ADC,本发明采用一种用于从ADR / ADC中的处理能力较高(按DPH单元的表达式中的较大数值的数量级)的顺序选择ADR / ADC的算法, 优先级最低,无论ADR / DC是否在执行中。

    ALLOCATING MANUFACTURED DEVICES ACCORDING TO CUSTOMER SPECIFICATIONS
    4.
    发明申请
    ALLOCATING MANUFACTURED DEVICES ACCORDING TO CUSTOMER SPECIFICATIONS 失效
    根据客户规格分配制造的设备

    公开(公告)号:US20060246610A1

    公开(公告)日:2006-11-02

    申请号:US10908135

    申请日:2005-04-28

    IPC分类号: G06F19/00

    摘要: A method and system sorts manufactured integrated circuit devices by evaluating performance characteristics of the manufactured integrated circuit devices. All of the integrated circuit devices are manufactured using an identical design, and differences in the performance characteristics among the integrated circuit devices occurs because of variations including manufacturing line variations. The integrated circuit devices are sorted into groups according to the performance characteristics and are utilized in different computing devices depending upon individual performance requirements of the computing devices.

    摘要翻译: 一种方法和系统通过评估所制造的集成电路器件的性能特征来对制造的集成电路器件进行排序。 所有的集成电路器件都是使用相同的设计制造的,并且集成电路器件中的性能特性的差异是由于包括制造线变化的变化而发生的。 集成电路设备根据性能特征被分类成组,并且根据计算设备的各个性能要求在不同的计算设备中使用。

    Automatic defect review and classification system
    6.
    发明授权
    Automatic defect review and classification system 有权
    自动缺陷审查和分类系统

    公开(公告)号:US07664562B2

    公开(公告)日:2010-02-16

    申请号:US11451330

    申请日:2006-06-13

    IPC分类号: G06F19/00

    摘要: The invention proposes a system that interrupts a processing associated with an ADC having low priority when an ADC processing cannot catch up with ADR by an ADC alone that is not under execution but uses an ADC for an ADR having high priority. To preferentially execute ADR/ADC having high priority, the invention employs an algorithm for serially selecting ADR/ADC in the order of higher processing capacity (in the order of greater numerical values in the expression by a DPH unit) from among ADR/ADCs that have the lowest priority, no matter whether the ADR/DC is now under execution or not.

    摘要翻译: 本发明提出了一种系统,当ADC处理不能通过一个ADC不能跟踪ADR而不能执行但对具有高优先级的ADR使用ADC时,中断与具有低优先级的ADC相关联的处理的系统。 为了优先执行具有高优先级的ADR / ADC,本发明采用一种用于从ADR / ADC中的处理能力较高(按DPH单元的表达式中的较大数值的数量级)的顺序选择ADR / ADC的算法, 优先级最低,无论ADR / DC是否在执行中。

    System for inspection and separation of defective RFID tags in batch conversion of RFID tag to RFID label
    7.
    发明申请
    System for inspection and separation of defective RFID tags in batch conversion of RFID tag to RFID label 审中-公开
    将RFID标签批量转换为RFID标签的有缺陷的RFID标签的检查和分离系统

    公开(公告)号:US20080189059A1

    公开(公告)日:2008-08-07

    申请号:US11702880

    申请日:2007-02-06

    IPC分类号: G01R15/00

    摘要: A RFID detection and separation device for a RFID Conversion system incorporating a microcontroller, a liner unwinding station, a RFID reel unwinding station, a RFID feeding station, a liner feeding station. The microcontroller controls the movement of an inlay reel of RFID tags from the RFID reel unwinding station into the RFID feeding station, said microcontroller also controlling the movement of a reel of liner mounted on a Liner Unwinding station, through a liner feeding station, for the separation of the RFID tags from the inlay reel for embedding onto the liner to produce RFID labels.In its separation mode, a RFID tag is inspected and if found good, the RFID tag is separated by the RFID detection and separation device and dispensed onto a liner to form a RFID label. Upon detection of a defective RFID tag, the RFID detection and separation device goes into a non-separation mode, whereby the defective RFID tag goes past the RFID detection and separation device without separation from the inlay reel. As a result only good RFID labels are produced.

    摘要翻译: 一种用于RFID转换系统的RFID检测和分离装置,其包括微控制器,衬垫退绕站,RFID卷轴退绕站,RFID馈送站,衬管馈送站。 微控制器控制RFID标签的嵌入卷轴从RFID卷轴展开站移动到RFID馈送站中,所述微控制器还通过衬管馈送站来控制安装在衬管放卷站上的卷轴的运动,用于 RFID标签与嵌入式卷轴的分离,用于嵌入到衬垫上以产生RFID标签。 在其分离模式中,检查RFID标签,如果发现良好,RFID标签由RFID检测和分离装置分离并分配到衬垫上以形成RFID标签。 在检测到有缺陷的RFID标签时,RFID检测和分离装置进入非分离模式,由此有缺陷的RFID标签经过RFID检测和分离装置,而不会与嵌入卷轴分离。 因此,仅产生良好的RFID标签。

    Product quality tracking system and method
    8.
    发明申请
    Product quality tracking system and method 审中-公开
    产品质量跟踪系统及方法

    公开(公告)号:US20070203604A1

    公开(公告)日:2007-08-30

    申请号:US11363673

    申请日:2006-02-27

    申请人: Chaucer Chiu Kitty Ji

    发明人: Chaucer Chiu Kitty Ji

    IPC分类号: G06F19/00

    摘要: A product quality tracking and method system is provided. The system includes a database having at least an identification code field for storing identification codes of a plurality of products, a reference numeral field for storing reference numerals of the products, and a quality message field; a reading device for reading the identification codes and the reference numerals of the products being tested; a recording module for recording quality test results of the products in the quality message field of the database corresponding to the identification codes and the reference numerals; and a statistic module for analyzing quality messages of a plurality of products having identical identification codes, and gathering statistics of quality problems of products in at least a model corresponding to at least one of the identification codes.

    摘要翻译: 提供产品质量跟踪和方法系统。 该系统包括具有用于存储多个产品的识别码的标识码字段的数据库,用于存储产品的附图标记的参考数字字段和质量消息字段; 用于读取正在测试的产品的识别码和参考标号的读取装置; 用于在数据库的质量信息字段中记录产品的质量测试结果对应于识别码和参考数字的记录模块; 以及用于分析具有相同识别码的多个产品的质量信息的统计模块,以及在与至少一个识别码对应的至少一个模型中收集产品的质量问题的统计。

    ALLOCATING MANUFACTURED DEVICES ACCORDING TO CUSTOMER SPECIFICATIONS
    9.
    发明申请
    ALLOCATING MANUFACTURED DEVICES ACCORDING TO CUSTOMER SPECIFICATIONS 失效
    根据客户规格分配制造的设备

    公开(公告)号:US20070129835A1

    公开(公告)日:2007-06-07

    申请号:US11548388

    申请日:2006-10-11

    IPC分类号: G06F19/00

    摘要: A method and system sorts manufactured integrated circuit devices by evaluating performance characteristics of the manufactured integrated circuit devices. All of the integrated circuit devices are manufactured using an identical design, and differences in the performance characteristics among the integrated circuit devices occurs because of variations including manufacturing line variations. The integrated circuit devices are sorted into groups according to the performance characteristics and are utilized in different computing devices depending upon individual performance requirements of the computing devices.

    摘要翻译: 一种方法和系统通过评估所制造的集成电路器件的性能特征来对制造的集成电路器件进行排序。 所有的集成电路器件都是使用相同的设计制造的,并且集成电路器件的性能特性之间的差异是由于包括生产线变化在内的变化而发生的。 集成电路设备根据性能特征被分类成组,并且根据计算设备的各个性能要求在不同的计算设备中使用。

    Computer-Implemented System And Method For Attribute-Based Manufacturing Quality Control
    10.
    发明申请
    Computer-Implemented System And Method For Attribute-Based Manufacturing Quality Control 审中-公开
    基于属性的制造质量控制的计算机实现系统和方法

    公开(公告)号:US20160109879A1

    公开(公告)日:2016-04-21

    申请号:US14923252

    申请日:2015-10-26

    IPC分类号: G05B19/418

    摘要: A computer-implemented system and method for attribute-based manufacturing quality control is provided. A specification for manufacturing a part feature is maintained in a database, the specification including a nominal. Also maintained in the database are one or more measurements for the feature on a plurality of parts manufactured in accordance with the specification, each of the measurements associated with one or more attributes, each of the attributes identifying at least one of a circumstance relating to how that measurement was made and how the feature was manufactured. A user selection of one or more of the attributes is received. Each of the measurements that is associated with all of the selected attributes is identified. A score indicative of how close the identified measurements are to the nominal is calculated and displayed.

    摘要翻译: 提供了一种用于基于属性的制造质量控制的计算机实现的系统和方法。 用于制造零件特征的规范被保存在数据库中,该规范包括标称值。 还保存在数据库中的是对于根据说明书制造的多个部件上的特征的一个或多个测量,每个测量与一个或多个属性相关联,每个属性标识与如何相关的情况中的至少一个 进行了测量,以及该功能的制造。 接收到一个或多个属性的用户选择。 识别与所有所选属性相关联的每个测量。 计算并显示指示所识别的测量值与标称接近程度的得分。