Abstract:
A burst mode control unit includes a burst period signal generation unit for generating a burst period signal which is enabled during a burst mode operation period, a burst pulse generation unit for generating a burst pulse, which is generated at every predetermined number of cycles during the enabled period of the burst period signal, in response to a read command and a write command, and a column access signal generation unit for receiving the burst signal and a clock signal and generating a column access signal which controls input and output of data during the burst mode operation period.
Abstract:
The semiconductor integrated circuit includes a command decoder, a shift register unit and a command address latch unit. The command decoder is responsive to an external command defining write and read modes and configured to provide a write command or a read command according to the external command using a rising or falling clock. The shift register unit is configured to shift an external address and the write command by a write latency in response to the write command. The column address latch unit is configured to latch and provide the external address as a column address in the read mode, and to latch a write address, which is provided from the shift register unit, and provide the write address as the column address in the write mode.
Abstract:
A semiconductor IC in which a least significant bit of an external address signal is fixed to a signal level, the semiconductor integrated circuit includes an address control circuit configured to produce a carry signal, when a test mode signal is activated, in response to a column command signal and output an address signal, which is sequentially increased from an initial internal address signal, by latching the external address signal as the initial internal address signal and combining the latched initial internal address signal and the carry signal.
Abstract:
A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a period measurement start signal generator configured to receive a self-refresh signal and an oscillation signal, to allow a self-refresh operation to be performed, and generate a period measurement start signal, to set the time that the oscillation signal is enabled, and a refresh period output unit configured to receive the period measurement start signal and the oscillation signal, and generate a refresh period output signal that is enabled for a period from the time that the period measurement start signal is enabled to a time that the oscillation signal is enabled.
Abstract:
The present invention provides a self-refresh period adaptable for testing cells that are weak against hot temperature stress. An apparatus for controlling a self-refresh operation in a semiconductor memory device includes a first period selector for generating one of a period-fixed pulse signal having a constant period and a period-variable pulse signal having a variable period based on a temperature of the semiconductor memory device in a test mode; and a self-refresh block for performing the self-refresh operation in response to an output of the first period selector.
Abstract:
The internal command generation circuit includes a burst pulse generation unit and a pulse shifting unit. The burst pulse generation unit is configured to receive a command for a read or write operation, and generate a first burst pulse. The pulse shifting unit is configured to shift the first burst pulse and generate an internal command.
Abstract:
A semiconductor IC in which a least significant bit of an external address signal is fixed to a signal level, the semiconductor integrated circuit includes an address control circuit configured to produce a carry signal, when a test mode signal is activated, in response to a column command signal and output an address signal, which is sequentially increased from an initial internal address signal, by latching the external address signal as the initial internal address signal and combining the latched initial internal address signal and the carry signal.
Abstract:
A burst mode control unit includes a burst period signal generation unit for generating a burst period signal which is enabled during a burst mode operation period, a burst pulse generation unit for generating a burst pulse, which is generated at every predetermined number of cycles during the enabled period of the burst period signal, in response to a read command and a write command, and a column access signal generation unit for receiving the burst signal and a clock signal and generating a column access signal which controls input and output of data during the burst mode operation period.
Abstract:
A semiconductor memory includes an address converting circuit which latches an address and a bank signal and generates a latch address for activating a data access path of a second bank group, and converts the latch address according to a level of the bank signal and generates a variable address for activating a data access path of a first bank group, a first column decoder which decodes the variable address and generates a first output enable signal for activating the data access path of the first bank group, and a second column decoder which decodes the latch address and generates a second output enable signal for activating the data access path of the second bank group.
Abstract:
The internal command generation circuit includes a burst pulse generation unit and a pulse shifting unit. The burst pulse generation unit is configured to receive a command for a read or write operation, and generate a first burst pulse. The pulse shifting unit is configured to shift the first burst pulse and generate an internal command.