摘要:
A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.
摘要:
A scanning microscope, in particular a confocal scanning microscope, having: a scanning device (1), a detection device (2), an electronic system (3) for operating the scanning microscope, and a cooling device (4) for at least one component of the scanning microscope, is configured and refined, in the interest of efficient cooling, in such a way that the cooling device (4) is operable with a liquid cooling medium.
摘要:
A device for generating a light beam having several wavelengths includes a beam recombiner arrangement for recombining several laser light beams having different wavelengths. The beam recombiner arrangement includes several individual beam recombiners arranged in a row or in groups parallel to each other and each configured to couple in a respective laser light beam having a wavelength of a defined wavelength range.
摘要:
A microscope includes a light source that emits an illuminating light beam for illumination of a specimen, a beam splitter separating measuring light out of the illuminating light beam, and an apparatus for determining the light power level of the illuminating light beam. The apparatus for determining the light power level of the illuminating light beam receives the measuring light and includes an apparatus for simultaneous color-selective detection of the measuring light.
摘要:
A method for superimposing optical information in a scanning microscope includes determining a transformation matrix, and superimposing first optical information of a CCD image and second optical information of at least one piece of second image information using the transformation matrix.
摘要:
A device for generating a laser light beam includes a module. The module includes at least one laser light source, and a mechanical, an electrical and/or an optical interface defined towards an outside of the module.
摘要:
A microscope objective that comprises an objective housing and contains several lens elements, at least one lens element being arranged displaceably in motor-driven fashion within the objective housing, is disclosed. A microscope and a method for imaging a specimen are additionally disclosed.
摘要:
A device for generating a laser light beam includes a module. The module includes at least one laser light source, and a mechanical, an electrical and/or an optical interface defined towards an outside of the module.
摘要:
A method for separating detection channels is disclosed, a sample (15) being equipped with at least two different fluorescent dyes. Firstly the emission spectrum of at least two fluorescent dyes is ascertained. From the emission spectra, the separation points of the wavelength and of the individual detection channels are determined. Lastly, adjustment of the separation of the at least two channels is accomplished on that basis.
摘要:
The present invention concerns a method for setting the system parameters of a scanning microscope, preferably a confocal scanning microscope, acquisition of an image of the specimen performed with the scanning microscope being controlled by a control computer. After an image of the specimen is acquired at least one image quality feature is inputted by a user and is converted by the control computer into at least one system parameter of the scanning microscope.