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    Detector apparatus
    1.
    发明授权
    Detector apparatus 有权
    检测仪

    公开(公告)号：US09450118B2

    公开(公告)日：2016-09-20

    申请号：US14238849

    申请日：2012-08-15

    申请人： Bernd Widzgowski ,  Volker Seyfried ,  Holger Birk ,  Frank Schreiber

    发明人： Bernd Widzgowski ,  Volker Seyfried ,  Holger Birk ,  Frank Schreiber

    IPC分类号： H01J40/16 ,  H01L31/024 ,  H01J40/02 ,  H01J43/02 ,  H01J43/28

    CPC分类号： H01L31/024 ,  H01J40/02 ,  H01J40/16 ,  H01J43/02 ,  H01J43/28

    摘要： A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected.

    摘要翻译： 体现为接收光并产生电信号的检测器装置具有设置在壳体中的壳体和检测器。 检测器包括被实现为接收光并释放电子的光传感器。 光传感器处于比壳体更低的电位电平; 并且检测器经由电绝缘的中间布置与壳体导热接触，壳体内部的热传导方向与待检测光的光传播方向相反。

    DETECTOR APPARATUS
    4.
    发明申请
    DETECTOR APPARATUS 有权
    检测仪器

    公开(公告)号：US20140306098A1

    公开(公告)日：2014-10-16

    申请号：US14238849

    申请日：2012-08-15

    申请人： Bernd Widzgowski ,  Volker Seyfried ,  Holger Birk ,  Frank Schreiber

    发明人： Bernd Widzgowski ,  Volker Seyfried ,  Holger Birk ,  Frank Schreiber

    IPC分类号： H01L31/024 ,  H01J40/02

    CPC分类号： H01L31/024 ,  H01J40/02 ,  H01J40/16 ,  H01J43/02 ,  H01J43/28

    摘要： A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected.

    摘要翻译： 体现为接收光并产生电信号的检测器装置具有设置在壳体中的壳体和检测器。 检测器包括被实现为接收光并释放电子的光传感器。 光传感器处于比壳体更低的电位电平; 并且检测器经由电绝缘的中间布置与壳体导热接触，壳体内部的热传导方向与待检测光的光传播方向相反。

    Apparatus for the detection of light in a scanning microscope
    5.
    发明授权
    Apparatus for the detection of light in a scanning microscope 有权
    用于在扫描显微镜中检测光的装置

    公开(公告)号：US08503076B2

    公开(公告)日：2013-08-06

    申请号：US12600646

    申请日：2008-05-06

    申请人： Holger Birk ,  Volker Seyfried

    发明人： Holger Birk ,  Volker Seyfried

    IPC分类号： G02B21/00

    CPC分类号： G01J1/44 ,  G01J1/46 ,  G01J3/2803 ,  G02B21/0032 ,  G02B21/0096 ,  H01L31/107

    摘要： A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time.

    摘要翻译： 描述在线扫描显微镜中使用的光检测器和包括这种光检测器的显微镜。 光检测器包括雪崩半导体检测器的线阵列; 以及电子触发电路，其适于以具有内部电荷放大和线性模式的Geiger模式中的至少一个来操作雪崩半导体检测器。 触发电路还包括并行计数器，其被设计为平行地读出由雪崩半导体检测器检测到的光脉冲。 并行计数器适于在预设的计数时间内积累由雪崩半导体检测器检测的光脉冲。

    System and Method for Computer-Controlled Execution of at Least One Test in a Scanning Microscope
    6.
    发明申请
    System and Method for Computer-Controlled Execution of at Least One Test in a Scanning Microscope 有权
    在扫描显微镜中进行最少一次测试的计算机控制执行系统和方法

    公开(公告)号：US20120130670A1

    公开(公告)日：2012-05-24

    申请号：US13302025

    申请日：2011-11-22

    申请人： Holger Birk ,  Volker Seyfried ,  Roland Moschel ,  Derek Webster ,  Harald Brueggemann ,  Mario Belzer

    发明人： Holger Birk ,  Volker Seyfried ,  Roland Moschel ,  Derek Webster ,  Harald Brueggemann ,  Mario Belzer

    IPC分类号： G06F19/00

    CPC分类号： G02B21/008 ,  G02B21/365

    摘要： The invention relates to a method and a system for central computer controlled execution of at least one test run in a scanning microscope, particularly a confocal microscope, wherein at least one first software module of an application software is tested. The invention achieves the aim by a network made of individual scanning microscope clients and a central server. The clients can be contacted via a network interface and are administered in a central directory in the server. The application software for the individual components of a scanning microscope is made of individual software modules, each associated with a potential test. In order to be able to perform the various tests, the scanning microscope clients have been equipped on the hardware side with additional sensors and components that allow various operating parameters to be determined.

    摘要翻译： 本发明涉及一种用于中央计算机控制执行扫描显微镜，特别是共焦显微镜中的至少一个测试运行的方法和系统，其中测试应用软件的至少一个第一软件模块。 本发明通过由单独的扫描显微镜客户端和中央服务器构成的网络实现了目的。 可以通过网络接口联系客户端，并在服务器的中央目录中进行管理。 扫描显微镜的各个组件的应用软件由单独的软件模块组成，每个软件模块都与潜在测试相关联。 为了能够进行各种测试，扫描显微镜客户端已经在硬件方面配备了额外的传感器和组件，可以确定各种操作参数。

    Scanning microscope comprising a confocal slit scanner for imaging an object
    8.
    发明授权
    Scanning microscope comprising a confocal slit scanner for imaging an object 有权
    扫描显微镜，包括用于成像物体的共焦狭缝扫描器

    公开(公告)号：US07477380B2

    公开(公告)日：2009-01-13

    申请号：US10537335

    申请日：2003-09-23

    申请人： Werner Knebel ,  Holger Birk ,  Rafael Storz

    发明人： Werner Knebel ,  Holger Birk ,  Rafael Storz

    IPC分类号： G01J3/28

    CPC分类号： G02B21/0032 ,  G02B21/0076 ,  G02B21/0084

    摘要： A scanning microscope for imaging an object includes a light source and a spectrally selective detection device. An illumination beam path extends from the light source to the object. A detection beam path extends from the object to the detection device. A spectrally selective element useable to select light from the light source is provided. The spectrally selective element is useable to mask out of the detection beam path the selected light from the light source reflected or scattered on the object. An illumination slit diaphragm is disposed in the illumination beam path and configured to generate a linear illumination pattern in a region of the object. A detection slit diaphragm is disposed in the detection beam path and configured to detect the light coming from the linear illumination region from a focal plane so as to provide a confocal slit scanner.

    摘要翻译： 用于对物体成像的扫描显微镜包括光源和光谱选择性检测装置。 照明光束路径从光源延伸到物体。 检测光束路径从物体延伸到检测装置。 提供了可用于选择来自光源的光的光谱选择性元件。 光谱选择元件可用于从反射或散射在物体上的光源的光源遮掩出检测光束路径。 照明狭缝光阑设置在照明光束路径中并且被配置为在物体的区域中产生线性照明图案。 检测狭缝光阑设置在检测光束路径中，并被配置为从焦平面检测来自线性照明区域的光，以提供共焦狭缝扫描器。

    Scanning microscope
    9.
    发明申请
    Scanning microscope 审中-公开
    扫描显微镜

    公开(公告)号：US20070252499A1

    公开(公告)日：2007-11-01

    申请号：US11252965

    申请日：2005-10-18

    申请人： Holger Birk ,  Rafael Storz ,  Dirk-Oliver Fehrer ,  Claus Kress

    发明人： Holger Birk ,  Rafael Storz ,  Dirk-Oliver Fehrer ,  Claus Kress

    IPC分类号： G02B21/28

    CPC分类号： G02B21/0028

    摘要： A scanning microscope, in particular a confocal scanning microscope, having: a scanning device (1), a detection device (2), an electronic system (3) for operating the scanning microscope, and a cooling device (4) for at least one component of the scanning microscope, is configured and refined, in the interest of efficient cooling, in such a way that the cooling device (4) is operable with a liquid cooling medium.

    摘要翻译： 扫描显微镜，特别是共焦扫描显微镜，具有：扫描装置（1），检测装置（2），用于操作扫描显微镜的电子系统（3）和用于至少一个 扫描显微镜的组件被配置和精制，以便有效地冷却，使得冷却装置（4）可用液体冷却介质操作。