Laminated inductor and manufacturing method thereof
    22.
    发明授权
    Laminated inductor and manufacturing method thereof 有权
    层压电感及其制造方法

    公开(公告)号:US08558652B2

    公开(公告)日:2013-10-15

    申请号:US13352283

    申请日:2012-01-17

    摘要: Provided is a laminated inductor having a magnetic body, a conductor part covered in a manner directly contacting the magnetic body, and external terminals provided on the outside of the magnetic body and conducting to the conductor part; wherein the magnetic body is a laminate constituted by layers containing soft magnetic alloy grains, and the soft magnetic alloy grain contacting the conductor part is flattened on the conductor part side.

    摘要翻译: 提供一种层叠电感器,其具有磁性体,以与磁体直接接触的方式覆盖的导体部分和设置在磁体外部并导通到导体部分的外部端子; 其特征在于,所述磁性体是由含有软磁性合金粒子的层构成的层叠体,与导体部接触的软磁性合金粒子在导体部分侧平坦化。

    Non-contact tracing control apparatus
    28.
    发明授权
    Non-contact tracing control apparatus 失效
    非接触式跟踪控制装置

    公开(公告)号:US5243265A

    公开(公告)日:1993-09-07

    申请号:US720869

    申请日:1991-08-13

    CPC分类号: B23Q35/128 G05B2219/37425

    摘要: A non-contact tracing control apparatus is disclosed which traces the surface of a model by using at least two optical distance detectors for detecting the distances therefrom to the model. When a first light corresponding to a first of the optical distance detectors is detecting a distance, a second light of another, second optical distance detector is either dimmed or shut off. Interference between more than one light reflected from the model and errors from, i.e., the first light reflected from the model incident on a second position sensor of the second optical distance detector can be avoided. The distances to a plurality of measurement points thus can be detected without interference even though the measurement points on the surface of the model are relatively close to one another.

    摘要翻译: PCT No.PCT / JP90 / 01622 Sec。 371日期1991年8月13日 102(e)日期1991年8月13日PCT 1990年12月11日PCT PCT。 公开号WO91 / 08861 日期:1991年6月27日。公开了一种非接触跟踪控制装置,其通过使用至少两个光学距离检测器来跟踪模型的表面,以检测距离模型的距离。 当对应于第一光学距离检测器的第一光线正在检测距离时,另一个第二光学距离检测器的第二光被暗淡或切断。 可以避免从模型反射的多于一个的光和来自入射在第二光学距离检测器的第二位置传感器上的模型反射的第一光的误差之间的干扰。 即使模型表面上的测量点彼此相对接近,也可以无干扰地检测到多个测量点的距离。

    Method for contactless profiling normal to a surface
    29.
    发明授权
    Method for contactless profiling normal to a surface 失效
    用于将表面正态分布的方法

    公开(公告)号:US5071252A

    公开(公告)日:1991-12-10

    申请号:US343261

    申请日:1989-04-17

    申请人: Hitoshi Matsuura

    发明人: Hitoshi Matsuura

    IPC分类号: B23Q35/128 B23Q35/127

    摘要: The present invention provides a contactless profiling method for tracing a model surface (MDL) while performing attitude control in such a manner that an optic axis (OP1) of a contactless probe (PRB), which is capable of simultaneously measuring distances to three points on the model surface, is pointed along the direction of a line normal to the model surface at all times. In this contactless profiling method, model normal line direction N at a measurement point A is calculated first from an inclination angle increment in a probe feed direction (X direction), which is obtained using distances, L.sub.1, L.sub.2 to two points A, B in the probe feed direction measured every predetermined sampling time T.sub.s, and second from an inclination angle increment in a perpendicular direction (Y direction) obtained using two points A, C in the perpendicular direction. Next, total incremental quantities every sampling time T.sub.s along the three axes of the rectangular coordinate system and the two axes of probe rotation are calculated by using (i) incremental quantities found along three axes of a retangular coordinate system and two axes of probe rotation; (ii) incremental quantities found in the feed direction (X direction) and profiling direction (Z direction) determined from tracing velocity and inclination angle in the probe feed direction; and (iii) a Z-axis component of an error between the distance L.sub.1, which is measured by first distance measuring means (DM1) every sampling time T.sub.s, and a reference distance L.sub.0.

    摘要翻译: PCT No.PCT / JP88 / 00863 Sec。 371日期:1989年4月17日 102(e)日期1989年4月17日PCT提交1988年8月31日PCT公布。 出版物WO89 / 01845 日本特开1989年3月9日。本发明提供了一种用于跟踪模型表面(MDL)的非接触式仿形方法,同时执行姿态控制,使得非接触式探头(PRB)的光轴(OP1)能够 同时测量模型表面上三点的距离,始终沿着垂直于模型表面的线的方向指向。 在该非接触式轮廓方法中,首先从探头馈送方向(X方向)的倾斜角度增量计算出测量点A处的法线方向N,其中使用距离L1,L2至两点A,B 在每个预定采样时间Ts测量探针馈送方向,并且在垂直方向上使用两个点A,C获得的垂直方向(Y方向)上的倾斜角度增量进行测量。 接下来,通过使用(i)沿着三角坐标系的三个轴和两个探头旋转轴找到的增量来计算沿着直角坐标系的三个轴和探头旋转两个轴的每个采样时间Ts的总增量量Ts。 (ii)从探头进给方向的跟踪速度和倾斜角确定的进给方向(X方向)和轮廓方向(Z方向)上发现的增量; 和(iii)在每个采样时间Ts由第一距离测量装置(DM1)测量的距离L1与参考距离L0之间的误差的Z轴分量。

    Contour profiling machine
    30.
    发明授权
    Contour profiling machine 失效
    轮廓成型机

    公开(公告)号:US5015130A

    公开(公告)日:1991-05-14

    申请号:US309555

    申请日:1989-02-07

    IPC分类号: B23Q33/00 B23Q35/123

    CPC分类号: B23Q35/123 Y10T409/300896

    摘要: A contour profiling machine for the purposes of shortening the period of time for rough machining and forming a smooth machined surface in the execution of machining wherein the outer part or inner part of a workpiece is cut away along the contour of a model (MDL). The contour profiling machine according to the present invention includes a limit setting circuit for setting a limit as to one axis of a tracer head (TC), and for setting limits parallel to and limits orthogonal to a traveling direction within a movement plane which is determined by the first-mentioned limit. A polarity discrimination circuit discriminates the polarities of the limits set relative to the direction of movement of the tracer head (TC). A clamping ciruit clamps contour profiling within a range which is defined by the set limits.

    摘要翻译: PCT No.PCT / JP88 / 00608 Sec。 371日期1989年2月7日 102(e)日期1989年2月7日PCT Filed 1988年6月20日PCT Pub。 出版物WO88 / 10173 日期:1988年12月29日。一种轮廓轮廓机,用于缩短粗加工时间,并在加工中形成平滑的加工表面,其中工件的外部或内部部分沿着轮廓切除 的模型(MDL)。 根据本发明的轮廓廓形机包括用于设置跟踪头(TC)的一个轴的极限的限制设置电路,并且用于在确定的移动平面内与行进方向平行并限制正交的极限 按照上述限制。 极性鉴别电路鉴别相对于示踪器头(TC)的移动方向设定的极限的极性。 夹紧轮廓夹具在由设定限制定义的范围内的轮廓轮廓。