摘要:
In a manufacturing method of a flash memory structure with a stress area, a better stress effect can be achieved by controlling the manufacturing process of a tunneling oxide layer formed in a gate structure and contacted with a silicon substrate, so that an L-shaped spacer (or a first stress area) and a contact etch stop layer (or a second stress area) of each L-shaped spacer are formed between two gate structures and aligned towards each other to enhance the carrier mobility of the gate structure, so as to achieve the effects of improving a read current, obtaining the required read current by using a lower read voltage, reducing the possibility of having a stress-induced leakage current, and enhancing the data preservation of the flash memory.
摘要:
An enhancing agent for increasing heat transfer efficiency is disclosed, which is an additive composed of a nano-scale powder and a micro-scale powder that is to be added into a heat-transfer fluid circulating in an heat exchange system or in a coolant circulating in a cooling system for enhancing the heat conductivity of the heat-transfer fluid or the coolant while helping the tank and the fluid passages used in those systems to maintain clean, and eventually enabling those systems to operate with improved heat dissipation effect. By adding the aforesaid enhancing agent into a cooling system of an internal-combustion engine, the heat shock inside the engine that is originated from the fuel burning in the engine can be reduced, resulting that not only the amount of green house gas emission is reduced, but also the chance of engine juddering that is generally originated from poor heat dissipation can be decreased.
摘要:
A positioning device and a positioning method thereof are provided. The positioning device can cooperate with a first satellite group and a second satellite group, and it comprises a storage, a receiver and a processor. The receiver is configured to receive a first satellite group signal from the first satellite group and a second satellite group signal from the second satellite group. The processor is electrically connected to the storage and the receiver, and configured to calculate a positioning offset value according to one of the first satellite group signal and the second satellite group signal. In addition, the processor is configured to calculate a positioning result according to the second satellite group signal and the positioning offset, and store the positioning result in the storage.
摘要:
A semiconductor structure includes a semiconductor substrate, and an NMOS device at a surface of the semiconductor substrate, wherein the NMOS device comprises a Schottky source/drain extension region. The semiconductor structure further includes a PMOS device at the surface of the semiconductor substrate, wherein the PMOS device comprises a source/drain extension region comprising only non-metal materials. Schottky source/drain extension regions may be formed for both PMOS and NMOS devices, wherein the Schottky barrier height of the PMOS device is reduced by forming the PMOS device over a semiconductor layer having a low valence band.
摘要:
A method for providing auto focus for camera module that is electrically tunable using liquid crystal optical element is provided. The liquid crystal optical element includes substrate layers, insulating layer, three electrodes, liquid crystal layer between the substrate layers, and voltages applied between electrodes to control the optical power of the liquid crystal layer. The liquid crystal layer is coupled onto a camera module for provide auto focus on object located between 10 cm to infinity, achieving a response time at most of about 600 milliseconds. Tuning for the predetermined focal length is provided for liquid crystal optical element when object is located between 10 cm to infinity.
摘要:
The invention discloses a testing circuit board for placing a device under test and further testing the device under test according to a plurality of testing signals generated by a tester. The testing circuit board includes a circuit board and a plurality of sets of sockets. The circuit board includes a plurality of connecting holes. The plurality of sets of sockets are located on a plurality of connecting holes and electrically connects to the device under test via a plurality of connecting interfaces for transferring the plurality of testing signals to test the device under test.
摘要:
A BiCMOS device with enhanced performance by mechanical uniaxial strain is provided. A first embodiment of the present invention includes an NMOS transistor, a PMOS transistor, and a bipolar transistor formed on different areas of the substrate. A first contact etch stop layer with tensile stress is formed over the NMOS transistor, and a second contact etch stop layer with compressive stress is formed over the PMOS transistor and the bipolar transistor, allowing for an enhancement of each device. Another embodiment has, in addition to the stressed contact etch stop layers, strained channel regions in the PMOS transistor and the NMOS transistor, and a strained base in the BJT.
摘要:
A rotary control switch includes a body member, a shaft member and a conducting member. The body member includes a main body having a receptacle and a perforation. Multiple recesses are disposed within the receptacle. The perforation is communicated with the receptacle. The shaft member includes a base and a rotating shaft. The base has a sustaining structure. A protrusion is extended from the rotating shaft. The conducting member is connected with the base of the shaft member. The protrusion is sustained against or engaged with the main body and the base is accommodated within the receptacle of the body member. The base of the shaft member is rotated with respect to the control panel and the body member upon rotation of the rotating shaft. When the sustaining structure is sustained against a specified one of the recesses, the conducting member is electrically connected with a corresponding contact pad of the control panel.
摘要:
The present invention discloses a circuit testing apparatus for testing a device under test. The circuit testing apparatus includes a signal transformation module, a meter, and a logic tester. The signal transformation module is coupled to the device under test and transforms an analog output signal generated by the device under test into a DC signal. The meter is coupled to the signal transformation module and measures the DC signal so as to generate a digital measuring result. The logic tester is coupled to the meter and determines a test result for the device under test according to the digital measuring result.
摘要:
A CMOS device is provided. A semiconductor device comprises a substrate, the substrate having a first region and a second region, the first region having a first crystal orientation represented by a family of Miller indices comprising {i,j,k}, the second region having a second crystal orientation represented a family of Miller indices comprising {l,m,n}, wherein l2+m2+n2>i2+j2+k2. Alternative embodiments further comprise an NMOSFET formed on the first region, and a PMOSFET formed on the second region. Embodiments further comprise a Schottky contact formed with at least one of a the NMOSFET or PMOSFET.