公开(公告)号：US11676883B2

公开(公告)日：2023-06-13

申请号：US16355596

申请日：2019-03-15

Applicant: Intel Corporation

Inventor： Javed Shaikh ,  Je-Young Chang ,  Kelly Lofgreen ,  Weihua Tang ,  Aastha Uppal

IPC: H01L23/38 ,  H01L35/10 ,  H01L35/30 ,  H01L35/18 ,  H01L35/16

CPC classification number: H01L23/38 ,  H01L35/10 ,  H01L35/16 ,  H01L35/18 ,  H01L35/30

Abstract: An Integrated Circuit (IC) assembly, comprising an IC package coupled to a substrate, and a subassembly comprising a thermal interface layer. The thermal interface layer comprises a phase change material (PCM) over the IC package. At least one thermoelectric cooling (TEC) apparatus is thermally coupled to the thermal interface layer.

公开(公告)号：US20210249326A1

公开(公告)日：2021-08-12

申请号：US16789322

申请日：2020-02-12

Applicant: Intel Corporation

Inventor： Aastha Uppal ,  Je-Young Chang

IPC: H01L23/367 ,  H01L21/48 ,  H01L23/00

Abstract: An integrated circuit assembly may be formed comprising at least one integrated circuit device, a heat dissipation device having a thermal contact surface with at least one containment structure extending into or from the heat dissipation device at the thermal contact surface, and a thermal interface material between the at least one integrated circuit device and the heat dissipation device, wherein the thermal interface material contacts the at least one containment structure of the heat dissipation device.

公开(公告)号：US20200273772A1

公开(公告)日：2020-08-27

申请号：US16287116

申请日：2019-02-27

Applicant: Intel Corporation

Inventor： Aastha Uppal ,  Omkar Karhade ,  Ram Viswanath ,  Je-Young Chang ,  Weihua Tang ,  Nitin Deshpande ,  Mitul Modi ,  Edvin Cetegen ,  Sanka Ganesan ,  Yiqun Bai ,  Jan Krajniak ,  Kumar Singh

IPC: H01L23/367 ,  H01L23/373 ,  H01L23/427 ,  H01L25/18 ,  H01L21/56

Abstract: An apparatus is provided which comprises: a package substrate, an integrated circuit device coupled to a surface of the package substrate, a first material on the surface of the package substrate, the first material contacting one or more lateral sides of the integrated circuit device, the first material extending at least to a surface of the integrated circuit device opposite the package substrate, two or more separate fins over a surface of the integrated circuit device, the two or more fins comprising a second material having a different composition than the first material, and a third material having a different composition than the second material, the third material over the surface of the integrated circuit device and between the two or more fins. Other embodiments are also disclosed and claimed.

公开(公告)号：US20200219790A1

公开(公告)日：2020-07-09

申请号：US16241158

申请日：2019-01-07

Applicant: INTEL CORPORATION

Inventor： Aastha Uppal ,  Je-Young Chang ,  Weihua Tang ,  Minseok Ha

IPC: H01L23/427 ,  H01L23/00 ,  H01L23/552 ,  H01L23/31 ,  H01L21/48 ,  H01L21/56

Abstract: An integrated circuit assembly may be formed using a phase change material as an electromagnetic shield and as a heat dissipation mechanism for the integrated circuit assembly. In one embodiment, the integrated circuit assembly may comprise an integrated circuit package including a first substrate having a first surface and an opposing second surface, and at least one integrated circuit device having a first surface and an opposing second surface, wherein the at least one integrated circuit device is electrically attached by the first surface thereof to the first surface of the first substrate; and a phase change material formed on the integrated circuit package.

公开(公告)号：US20190067135A1

公开(公告)日：2019-02-28

申请号：US15685772

申请日：2017-08-24

Applicant: Intel Corporation

Inventor： Aastha Uppal ,  Je-Young Chang ,  Shankar Devasenathipathy ,  Joseph B. Petrini

IPC: H01L21/66 ,  G01K7/22 ,  H01L23/498

Abstract: Embodiments of the present disclosure provide techniques and configurations for inspection of a package assembly with a thermal solution, in accordance with some embodiments. In embodiments, an apparatus for inspection of a package assembly with a thermal solution may include a first fixture to house the package assembly on the apparatus, and a second fixture to house at least a portion of a thermal solution that is to be disposed on top of the package assembly. The apparatus may further include a load actuator, to apply a load to a die of the package assembly, via the thermal solution, and a plurality of sensors disposed around the thermal solution and the package assembly, to perform in situ thermal and/or mechanical measurements associated with the application of the load to the die of the package assembly. Other embodiments may be described and/or claimed.