Polymerizable compound, polymer, positive-resist composition, and patterning process using the same
    25.
    发明授权
    Polymerizable compound, polymer, positive-resist composition, and patterning process using the same 有权
    可聚合化合物,聚合物,正性抗蚀剂组合物和使用其的图案化工艺

    公开(公告)号:US07332616B2

    公开(公告)日:2008-02-19

    申请号:US11672917

    申请日:2007-02-08

    摘要: The present invention provides a polymer which has at least one or more of a repeating unit represented by a following general formula (1a), a repeating unit represented by a following general formula (2a) and a repeating unit represented by a following general formula (3b), and a repeating unit represented by a following general formula (1c), and a positive resist composition which contains as a base resin the polymer. Thereby, there can be provided a positive-resist composition having high sensitivity and high resolution in exposure with a high energy beam, wherein line edge roughness is small since swelling at the time of development is suppressed, and the residue after development is few.

    摘要翻译: 本发明提供一种聚合物,其具有以下通式(1a)表示的重复单元,下述通式(2a)表示的重复单元和下述通式( 3b)和由以下通式(1c)表示的重复单元和含有聚合物作为基础树脂的正性抗蚀剂组合物。 因此,可以提供一种在高能量束曝光时具有高灵敏度和高分辨率的正光刻胶组合物,其中线边缘粗糙度小,因为在显影时的膨胀被抑制,并且显影后的残留物很少。

    Resist composition and patterning process using the same
    26.
    发明申请
    Resist composition and patterning process using the same 有权
    抗蚀剂组成和图案化工艺使用相同

    公开(公告)号:US20070231738A1

    公开(公告)日:2007-10-04

    申请号:US11730289

    申请日:2007-03-30

    IPC分类号: G03C1/00

    摘要: There is disclosed a resist composition comprising, at least, a polymer including repeating units represented by the following general formula (1). There can-be provided a resist composition that has a good barrier property against water, prevents resist components from leaching to water, has high receding contact angle against water, does not require a protective film, has an excellent process applicability, suitable for the liquid immersion lithography and makes it possible to form micropatterns with high precision.

    摘要翻译: 公开了一种抗蚀剂组合物,其至少包含由以下通式(1)表示的重复单元的聚合物。 可以提供对水具有良好的阻隔性的抗蚀剂组合物,防止抗蚀剂成分浸出到水中,对水具有高后退接触角,不需要保护膜,具有优异的工艺适用性,适用于液体 浸没式光刻技术,可以高精度地形成微图案。

    Polymerizable ester compounds
    27.
    发明授权
    Polymerizable ester compounds 有权
    可聚合的酯化合物

    公开(公告)号:US07276623B2

    公开(公告)日:2007-10-02

    申请号:US11440107

    申请日:2006-05-25

    IPC分类号: C07C69/00 G03C1/00

    CPC分类号: G03F7/0397 G03F7/0046

    摘要: Ester compounds having formula (1) wherein R1 is fluorine or C1-C10 fluoroalkyl, R2 is C1-C10 alkylene or fluoroalkylene, and R3 is an acid labile group are novel. They can be polymerized into polymers which are used to formulate resist compositions, which are processed by the lithography involving ArF exposure, offering many advantages including improved resolution and transparency, minimal line edge roughness, improved etch resistance, and especially minimal surface roughness after etching.

    摘要翻译: 式(1)其中R 1是氟或C 1 -C 10氟烷基的酯化合物,其中R 1是氢或C 1 -C 10 - 是C 1 -C 10亚烷基或氟代亚烷基,R 3是酸不稳定基团是新的。 它们可以聚合成用于配制抗蚀剂组合物的聚合物,其通过涉及ArF曝光的光刻加工,提供许多优点,包括改进的分辨率和透明度,最小的线边缘粗糙度,改善的耐蚀刻性,以及蚀刻后特别是最小的表面粗糙度。

    Novel polymerizable ester compounds
    29.
    发明申请
    Novel polymerizable ester compounds 有权
    新型可聚合酯化合物

    公开(公告)号:US20060269870A1

    公开(公告)日:2006-11-30

    申请号:US11440107

    申请日:2006-05-25

    IPC分类号: G03C1/00

    CPC分类号: G03F7/0397 G03F7/0046

    摘要: Ester compounds having formula (1) wherein R1 is fluorine or C1-C10 fluoroalkyl, R2 is C1-C10 alkylene or fluoroalkylene, and R3 is an acid labile group are novel. They can be polymerized into polymers which are used to formulate resist compositions, which are processed by the lithography involving ArF exposure, offering many advantages including improved resolution and transparency, minimal line edge roughness, improved etch resistance, and especially minimal surface roughness after etching.

    摘要翻译: 式(1)其中R 1是氟或C 1 -C 10氟烷基的酯化合物,其中R 1是氢或C 1 -C 10 - 是C 1 -C 10亚烷基或氟代亚烷基,R 3是酸不稳定基团是新的。 它们可以聚合成用于配制抗蚀剂组合物的聚合物,其通过涉及ArF曝光的光刻加工,提供许多优点,包括改进的分辨率和透明度,最小的线边缘粗糙度,改善的耐蚀刻性,以及蚀刻后特别是最小的表面粗糙度。