Abstract:
CMOS circuitry used to multiplex between data inputs suffers from high sensitivity to power supply noise, resulting in delay variations. By utilizing current controlled inverters in a multiplexer structure, power supply insensitivity can be achieved with either of two multiplexing methods. The first method places switches on the data inputs while the second places the switches on the analog bias voltages inherent to a current controlled inverter.
Abstract:
A shadow mask assembly is formed such that a corner spring is attached to the side wall of a frame supporting a shadow mask. The corner spring has a supporting plate wherein a hole, into which a stud pin penetrates is formed at tile center; a pair of wings which extend in the direction of both sides of the supporting plate; and a welding plate which is formed by bending the supporting plate in a U-shape perpendicular to both wings. Minute space being formed between both wings and the side walls of the frame corresponding to the wings and facing and parallel to each other, and slots are inclined at an angle agreeing with a deflecting angle .beta. of an electron beam. Projections are combined with the slots, so that displacement by a thermal expansion of the frame is guided according to the deflecting angle.
Abstract:
PICA test methods are shown that includes forming semiconductor devices having proximal light emitting regions, such that the light emitting regions are grouped into distinct shapes separated by a distance governed by a target resolution size; forming logic circuits to control the semiconductor devices; activating the one or more semiconductor devices by providing an input signal; and suppressing light emissions from one or more of the activated semiconductor devices by providing one or more select signals to the logic circuits.
Abstract:
PICA test methods are shown that includes forming semiconductor devices having proximal light emitting regions, such that the light emitting regions are grouped into distinct shapes separated by a distance governed by a target resolution size; forming logic circuits to control the semiconductor devices; activating the one or more semiconductor devices by providing an input signal; and suppressing light emissions from one or more of the activated semiconductor devices by providing one or more select signals to the logic circuits.
Abstract:
A compact, low-power, asynchronous, resistor-based memory read circuit includes a memory cell having a plurality of consecutive memory states, each of said states corresponding to a respective output voltage. A sense amplifier reads the state of the memory cell. The sense amplifier includes a voltage divider configured to receive the output voltage of the memory cell and to output a settled voltage an amplifier having a voltage threshold between the settled voltages associated with two of said consecutive memory states, configured to discriminate between said two consecutive memory states.
Abstract:
A compact, low-power, asynchronous, resistor-based memory read circuit includes a memory cell having a plurality of consecutive memory states, each of said states corresponding to a respective output voltage. A sense amplifier reads the state of the memory cell. The sense amplifier includes a voltage divider configured to receive the output voltage of the memory cell and to output a settled voltage an amplifier having a voltage threshold between the settled voltages associated with two of said consecutive memory states, configured to discriminate between said two consecutive memory states.
Abstract:
Mechanisms are provided for either power gating or bypassing a voltage regulator. Responsive to receiving an asserted power gate signal to power gate the output voltage of the voltage regulator, at least one of first control circuitry power gates the output voltage of a first circuit or second control circuitry power gates the output voltage of a second circuit such that substantially no voltage to is output by the first circuit to a primary output node. Responsive to receiving an asserted bypass signal to bypass the output voltage of the voltage regulator, at least one of the first control circuitry bypasses the output voltage of the first circuit or the second control circuitry bypasses the output voltage of a second circuit such that substantially the voltage of a voltage source is output by the first circuit to the primary output node.
Abstract:
A high-density deep trench capacitor array with a plurality of leakage sensors and switch devices. Each capacitor array further comprises a plurality of sub-arrays, wherein the leakage in each sub-array is independently controlled by a sensor and switch unit. The leakage sensor comprises a current mirror, a transimpedance amplifier, a voltage comparator, and a timer. If excessive leakage current is detected, the switch unit will automatically disconnect the leaky capacitor module to reduce stand-by power and improve yield. An optional solid-state resistor can be formed on top of the deep trench capacitor array to increase the temperature and speed up the leakage screening process.
Abstract:
Self-synchronizing techniques for checking the accuracy of a pseudorandom bit sequence (PRBS) are provided. The PRBS being checked may be generated by a device (e.g., a device under test) in response to a PRBS received by the device (e.g., from a PRBS generator). In an aspect of the invention, a PRBS checking technique includes the following steps/operations. For a given clock cycle, the presence of an error bit in the PRBS generated by the device is detected. The error bit represents a mismatch between the PRBS input to the device and the PRBS output from the device. Then, propagation of the error bit is prohibited for subsequent clock cycles. The prohibition step/operation may serve to avoid multiple errors being counted for a single error occurrence and/or masking errors in the PRBS output by the device.
Abstract:
Self-synchronizing techniques for checking the accuracy of a pseudorandom bit sequence (PRBS) are provided. The PRBS being checked may be generated by a device (e.g., a device under test) in response to a PRBS received by the device (e.g., from a PRBS generator). In an aspect of the invention, a PRBS checking technique includes the following steps/operations. For a given clock cycle, the presence of an error bit in the PRBS generated by the device is detected. The error bit represents a mismatch between the PRBS input to the device and the PRBS output from the device. Then, propagation of the error bit is prohibited for subsequent clock cycles. The prohibition step/operation may serve to avoid multiple errors being counted for a single error occurrence and/or masking errors in the PRBS output by the device.