摘要:
During various processing operations, ions from process plasma may be transfer to a deep n-well (DNW) formed under devices structures. A reverse-biased diode may be connected to the signal line to protect a gate dielectric formed outside the DNW and is connected to the drain of the transistor formed inside the DNW.
摘要:
A semiconductor structure includes a first strap cell, a first read port, and a first VSS terminal. The first strap cell has a first strap cell VSS region. The first read port has a first read port VSS region, a first read port read bit line region, and a first read port poly region. The first VSS terminal is configured to electrically couple the first strap cell VSS region and the first read port VSS region.
摘要:
A circuit includes a fuse circuit and a control circuit. The fuse circuit has an electrical fuse. The control circuit is configured to receive an input signal having an input pulse, and, based on a feedback signal from the fuse circuit, generates a read pulse smaller than the input pulse for use in reading the data stored in the electrical fuse.
摘要:
A layout structure includes a substrate, a well, a first dopant area, a second dopant area, a first poly region, a third dopant area, a fourth dopant area, and a second poly region. The well is in the substrate. The first poly region is in between the first dopant area and the second dopant area. The second poly region is in between the third dopant area and the fourth dopant area. The first dopant area, the second dopant area, the third dopant area, and the fourth dopant area are in the well. The first dopant area is configured to serve as a source of a transistor and to receive a first voltage value from a first power supply source. The well is configured to serve as a bulk of the transistor and to receive a second voltage value from a second power supply source.
摘要:
An amplifying circuit comprises a bias circuit, a reference circuit, a first circuit, and an amplifying sub-circuit. The bias circuit is configured to provide a bias current. The reference circuit is configured to provide a first differential input based on a reference resistive device and a reference current derived from the bias current. The first circuit is configured to provide a second differential input based on a first current and a first resistance. The amplifying sub-circuit is configured to receive the first differential input and the second differential input and to generate a sense amplifying output indicative of a resistance relationship between the first resistance and a resistance of the reference resistive device.
摘要:
A system and a method is disclosed for allowing bandgap circuitry to function on a low supply voltage integrated circuit, and for using the reference voltage (Vbg) generated by the bandgap circuitry to enable a reference voltage to control system voltage. An illustrative embodiment comprises a charge pump to raise a supply voltage to a system voltage, and an open loop controller, which provides a first signal to activate the charge pump, enabling a bandgap circuit, which outputs a bandgap voltage reference. Further, the system comprises a closed loop controller, which regulates the system voltage by comparing the system voltage to the bandgap reference voltage. Upon the system voltage falling below a target voltage, the closed loop controller provides a second signal to activate the charge pump. Additionally the system comprises a switch controller, which selects the closed loop controller upon sensing the bandgap circuit is active.
摘要:
An architecture, circuit and method for providing a high speed operation DRAM memory with reduced cell disturb. A DRAM global bit line select circuit couples a pair of local bit lines and the associated sense amplifier to the global bit lines using a circuit optimized for high speed operation. The select circuit and method also reduces or eliminates the bit line disturb effect of the prior art. The circuit and architecture of the DRAM incorporating the select circuit is particularly useful for embedding DRAM memory with other logic in an integrated circuit. For a read operation the select circuit discharges the appropriate global bit line directly to ground thus speeding the read cycles. For a write operation, a dedicated control line is used to couple write data to from the global bit lines to the selected local bit lines. Methods for operating the DRAM and the select circuits are disclosed.
摘要:
A method includes, by a first circuit, converting a plurality of bits in a first format to a second format. The plurality of bits in the second format is used, by a second circuit, to program a plurality of memory cells corresponding to the plurality of bits. The first format is a parallel format. The second format is a serial format. The first circuit and the second circuit are electrically coupled together in a chip. In some embodiments, the plurality of bits includes address information, cell data information, and program information of a memory cell that has an error. In some embodiments, the plurality of bits includes word data information of a word and error code and correction information corresponding to the word data information of the word.
摘要:
A mechanism of reconfiguring an eFuse memory array to have two or more neighboring eFuse bit cells placed side by and side and sharing a program bit line. By allowing two or more neighboring eFuse bit cells to share a program bit line, the length of the program bit line is shortened, which results in lower resistivity of the program bit line. The width of the program bit line may also be increased to further reduce the resistivity of program bit line. Program bit lines with low resistance and high current are needed for advanced eFuse memory arrays using low-resistivity eFuses.
摘要:
This description relates to a circuit including a bit line. The circuit further includes at least one memory bank. The at least one memory bank includes at least one memory cell, a first device configured to provide a current path between the bit line and the at least one memory cell when the at least one memory cell is activated, and a second device configured to reduce current leakage between the bit line and the at least one memory cell when the at least one memory cell is deactivated. The circuit further includes a tracking device configured to receive a mirror current substantially equal to a current along the current path, the tracking device configured to have a resistance substantially equal to a cumulative resistance of all memory cells of the at least one memory cell.