摘要:
Embodiments of the invention contemplate the formation of a high efficiency solar cell using a novel plasma oxidation process to form a passivation film stack on a surface of a solar cell substrate. In one embodiment, the methods include providing a substrate having a first type of doping atom on a back surface of the substrate and a second type of doping atom on a front surface of the substrate, plasma oxidizing the back surface of the substrate to form an oxidation layer thereon, and forming a silicon nitride layer on the oxidation layer.
摘要:
A method of manufacturing a solar cell is provided. One surface of a semiconductor substrate is doped with a n-type dopant. The substrate is then subjected to a thermal oxidation process to form an oxide layer on one or both surfaces of the substrate. The thermal process also diffuses the dopant into the substrate, smoothing the concentration profile. The smoothed concentration gradient enables the oxide layer to act as a passivating layer. Anti-reflective coatings may be applied over the oxide layers, and a reflective layer may be applied on the surface opposite the doped surface to complete the solar cell.
摘要:
A method for fabricating point contacts to the rear surface of a silicon solar cell by coating the rear surface with a masking layer and a laser absorptive layer and directing laser radiation to the rear surface to form openings therein after which doping material is applied through the openings and contacts are applied. The doping is preferably performed by plasma immersion ion implantation.
摘要:
Critical Dimension (CD) of features on a semiconductor substrate may be indicated utilizing the site-specific binding properties of organic or biological molecules. In accordance with one embodiment of the present invention, a fluorescent tagged organic molecule is fabricated having a length corresponding to the desired CD. The semiconductor substrate is exposed to a solution containing the organic molecule. The solution is then removed and the structure analyzed for the presence of the fluorescent tag, indicating a feature having the desired CD. Fluorescent tagged biological molecules of known size such as peptides or proteins, or nucleic acids such as DNA or RNA, may also be employed for CD measurement. Alternatively, a CD marker molecule may be designed to exhibit preferential binding, such that it fails to bind to the substrate in instances of incomplete resist development or etching.
摘要:
A structure having a number of traces passing through a region is evaluated by using a beam of electromagnetic radiation to illuminate the region, and generating an electrical signal that indicates an attribute of a portion (also called “reflected portion”) of the beam reflected from the region. The just-described acts of “illuminating” and “generating” are repeated in another region, followed by a comparison of the generated signals to identify variation of a property between the two regions. Such measurements can identify variations in material properties (or dimensions) between different regions in a single semiconductor wafer of the type used in fabrication of integrated circuit dice, or even between multiple such wafers. In one embodiment, the traces are each substantially parallel to and adjacent to the other, and the beam has wavelength greater than or equal to a pitch between at least two of the traces. In one implementation the beam is polarized, and can be used in several ways, including, e.g., orienting the beam so that the beam is polarized in a direction parallel to, perpendicular to, or at 45° to the traces. Energy polarized parallel to the traces is reflected by the traces, whereas energy polarized perpendicular to the traces passes between the traces and is reflected from underneath the traces. Measurements of the reflected light provide an indication of changes in properties of a wafer during a fabrication process.
摘要:
A coefficient of a function that relates a measurement from a wafer to a parameter used in making the measurement (such as the power of a beam used in the measurement) is determined. The coefficient is used to evaluate the wafer (e.g. to accept or reject the wafer for further processing), and/or to control fabrication of another wafer. In one embodiment, the coefficient is used to control operation of a wafer processing unit (that may include, e.g. an ion implanter), or a heat treatment unit (such as a rapid thermal annealer).
摘要:
A particle sensor which employs the principle that a particle passing through an intense laser beam will scatter light to a photodetector which then generates a measurable signal is provided. The particle sensor uses prisms and a cylindrical lens to compress the laser beam to make it very thin along the axis of particle motion but very wide in the plane perpendicular to particle motion, thereby simultaneously providing high beam intensity for enhanced sensitivity and a large detection area. The optical components of the sensor are mounted on separate sections which allows the optical components to be separately aligned and changed so that the sensor may be easily adapted to various applications.
摘要:
A housing for a laser based particle monitor comprising a pair of pipes for directing particle flow through a chamber. In one embodiment, elbows are disposed on the piping such that the interior of the chamber cannot be viewed from a point outside the housing.
摘要:
A real-time particle sensor is provided which can monitor particles near the surface of a disk in a computer disk drive system and in the region between disks in a multiple disk stack. A laser and lens are housed in a compact cartridge which is mounted on an actuator arm of a disk. Photocells which are also mounted on the actuator arm detect light scattered by particles passing through the laser beam, and so generate an electrical signal used to count the detected particles. The sensor's small size allows a separate sensor to fit in each of the regions between adjacent disks in a stack of disks, or near the surface of a single disk.
摘要:
A variable hue task lamp with novel hue selection component is disclosed herein. The color and intensity of a task lamp is adjusted using a wireless connection from a device such as a smart phone, tablet, or computing device based upon an optimization method using a sample text or scene. The user first optimizes hue by adjusting the background color of the sample text or picture on the device. The optimum hue is then communicated to the task light, which sets light emitting diode intensities to match the optimum choice. Presets further localize choices in color space, and a comparison to white verifies the benefits of the chosen hue.