摘要:
A semiconductor memory device includes a select signal generator, a wordline voltage generator, and a switch circuit. During a test operation mode, the device determine whether a wordline voltage has required level. The select signal generator activates one of select signals each corresponding to the other wordline voltages responsive to external select code signals. The external select code signals appoint an external instruction signal representative and appoint other wordline voltages used in the memory device. The wordline voltage generator generates a wordline voltage corresponding to the activated select signal out. The switch circuit transfers the wordline voltage outputted from the wordline voltage generator to a pad connected to an external pin.
摘要:
Provided is a vacuum mold having a reverse solid pattern, which enables an insert sheet to be vacuum-formed, and a solid pattern to be transferred to the insert sheet. The vacuum mold having the reverse solid pattern includes: a lower mold; and a solid pattern disposed on the surface of the lower mold. The insert sheet disposed above the lower mold is adsorbed to the surface of the lower mold by vacuum pressure in order to transfer a pattern of the solid pattern to the insert sheet.
摘要:
Multiple bits are programmed in a NAND flash memory device by programming a memory cell with an LSB; storing the LSB into a cache register from the memory cell; programming the memory cell with an MSB that is stored in a main register; storing a data bit into the main register from the memory cell during a first verifying operation; storing a data bit into the cache register from the memory cell during a second verifying operation; and transferring the data bit to the main register from the cache register.
摘要:
A nonvolatile memory device includes an array of memory cells arranged in rows and columns, the array of memory cells having wordlines associated therewith. A wordline voltage controller determines the levels of wordline voltages to be supplied to the respective wordlines and a wordline voltage generator generates the wordline voltages at the determined levels. Related methods are also provided.
摘要:
A memory device includes a main memory cell array and a redundant memory cell array configured to store a first parity code for data stored in the main memory cell array. The device further includes a parity generator configured to generate a second parity code responsive to reading of the stored data from the main memory cell array, and a comparator configured to compare the first and second parity codes. In some embodiments, the parity generator configured to generate the second parity code during a copyback operation.
摘要:
Multiple bits are programmed in a NAND flash memory device by programming a memory cell with an LSB; storing the LSB into a cache register from the memory cell; programming the memory cell with an MSB that is stored in a main register; storing a data bit into the main register from the memory cell during a first verifying operation; storing a data bit into the cache register from the memory cell during a second verifying operation; and transferring the data bit to the main register from the cache register.
摘要:
A NAND flash memory device according to some embodiments includes a cell array, a page buffer configured to copyback read the data in the cell array, and an error detector for detecting errors that occur during the copyback reading and for generating a detection signal. Detecting errors is performed concurrently with a copyback program operation and completes before finishing a copyback program verify operation. The data stored in the page buffer may be copyback programmed when the detection signal is a pass signal. The copyback operation may end without executing the copyback program operation when the detection signal is a fail signal. Since the copyback program operation and the error detection operation are performed concurrently, the errors occurring during the copyback operation may be detected without additional time delay. Additionally, occurrence of two-bit error may be prevented because the copyback program is not executed when the fail signal is generated.
摘要:
The present invention relates to an electric radiating pipe capable of enhancing a heating efficiency in such a manner that a mixture of a porous operation medium and a volatile operation fluid is filled in a radiation pipe, and a porous operation medium is fast heated based on a viscosity difference, and a densely filled operation fluid is phase-changed to a high temperature vapor or a high temperature liquid based on a heated operation medium. In a radiating pipe that includes a certain shaped pipe body, and a heat wire passing through to the interior of the pipe body wherein both ends of the pipe body are sealed by a plugging cap, there is provided an electric radiating pipe that includes a porous non-flammable operation medium and volatile operation fluid being mixed and being filled into the interior of the pipe body.
摘要:
A NAND flash memory device performing an error detecting and data reloading operation during a copy back program operation is provided. The device includes a cell array having a plurality of planes and a parity cell array having a plurality of parity planes. Each of the parity planes stores a parity of each of the planes. Additionally, the device includes a parity generating and parity column selecting circuit generating a new parity about reloaded data from an outside during a copy back program operation, and storing the new parity on a parity plane corresponding to a plane on which the reloaded data is stored.
摘要:
A memory device includes a main memory cell array and a redundant memory cell array configured to store a first parity code for data stored in the main memory cell array. The device further includes a parity generator configured to generate a second parity code responsive to reading of the stored data from the main memory cell array, and a comparator configured to compare the first and second parity codes. The parity generator may be configured to generate the second parity code during a copyback operation.