Abstract:
Provided is a method of managing memory in a multiprocessor system on chip (MPSoC). According to an aspect of the present invention, locality of memory can be reflected and restricted memory resources can be efficiently used by determining a storage location of a variable or a function which corresponds to a symbol with reference to a symbol table based on memory access frequency of the variable or the function, comparing the determined storage location and a previous storage location, and copying the variable or the function stored in the previous storage location to the determined storage location if the determined storage location is different from the previous storage location.
Abstract:
Provided is a method of managing memory in a multiprocessor system on chip (MPSoC). According to an aspect of the present invention, locality of memory can be reflected and restricted memory resources can be efficiently used by determining a storage location of a variable or a function which corresponds to a symbol with reference to a symbol table based on memory access frequency of the variable or the function, comparing the determined storage location and a previous storage location, and copying the variable or the function stored in the previous storage location to the determined storage location if the determined storage location is different from the previous storage location.
Abstract:
Provided is a method of managing memory in a multiprocessor system on chip (MPSoC). According to an aspect of the present invention, locality of memory can be reflected and restricted memory resources can be efficiently used by determining a storage location of a variable or a function which corresponds to a symbol with reference to a symbol table based on memory access frequency of the variable or the function, comparing the determined storage location and a previous storage location, and copying the variable or the function stored in the previous storage location to the determined storage location if the determined storage location is different from the previous storage location.
Abstract:
A method and apparatus for detecting errors in an application software of an embedded system are provided. The method of detecting errors in an application software includes determining a development language of the application software and an operating system on which the application software is executed; replacing an error detection syntax inserted in order to examine an error in a predetermined function of the application software, with an error detection syntax according to the result of the determination; and performing exception handling for an error occurring in the function according to the result of the replacement, and logging error information according to the exception handling. According to the method and apparatus, an error can be automatically detected and logged irrespective of a development language and an operating system.
Abstract:
A method and apparatus transmitting and receiving in a real-time system are disclosed. The method of transmitting in a real-time system includes scheduling a task included in a socket based on a predetermined transmission option designated to the socket, and transmitting a packet generated by the scheduled task based on the predetermined transmission option, so that real-time communications of a network communication can be secured and resources of the system can be efficiently used, thereby, transmitting and receiving data according to the required characteristics of transmission and reception.
Abstract:
A semiconductor chip includes a plurality of chip pads and a plurality of bumps formed on respective chip pads, each bumps including a bump main body and a conductive particle disposed on the bump main body and exposed to the air, the conductive particle including an elastic portion made of an elastic material and a conductive layer enclosing the elastic portion.
Abstract:
A temperature detector, a temperature detecting method, and a semiconductor device having the temperature detector, in which the temperature detector includes a voltage generator, a selection circuit, and a comparator. The voltage generator generates first and second voltages that are inversely proportional to temperature. The selection circuit outputs the first voltage during a normal operation, and the second voltage during a self-test operation, wherein the second voltage is lower than the first voltage. The comparator compares a reference voltage with one of the first and second voltages output from the selection circuit, and generates a detection signal according to the comparison result. The temperature detecting method is performed by the temperature detector. The semiconductor device includes a reset signal generator that generates a reset signal for resetting a central processing unit (CPU) in response to a detection signal output from the temperature detector.
Abstract:
A portable computer includes a computer main body, a display, a hinge part having a main body bracket coupled to the computer main body, a display bracket coupled to the display, and a hinge shaft tiltably coupled to one of the main body bracket and the display bracket, and a locking part having a separating unit which moves between a coupling position in which the locking unit connects the one of the main body bracket and the display bracket not coupled with to the hinge shaft with the hinge shaft to connect the main body bracket and the display bracket via the hinge shaft and to allow the display to tilt with respect to the computer main body, and a separating position in which the locking part separates the one of the main body bracket and the display bracket not coupled to the hinge shaft from the hinge shaft to allow the display to be separated from the computer main body. Accordingly, the display is easily separated from and coupled to the computer main body.
Abstract:
Methods and apparatuses for changing capacitance are provided. The apparatus may adjust a current supplied to a load capacitor according to the frequency of an input clock signal. When operating at a lower frequency, a capacitance may be increased such that noise immunity may be increased. When operating at a higher frequency, a capacitance may be decreased such that current consumption may be reduced.