Spacer and manufacturing device for the same

    公开(公告)号:US09946154B2

    公开(公告)日:2018-04-17

    申请号:US14888418

    申请日:2015-09-25

    Abstract: A spacer manufacturing device is disclosed. The device includes a photo mask having a central light-transmitting region and a peripheral light-transmitting region disposed at a periphery of the central light-transmitting region; and an exposure device right opposite to the photo mask. Wherein, light emitted from the exposure device is irradiated to a negative photoresist material after passing through the photo mask, the light intensity passing through the peripheral light-transmitting region is less than the light intensity passing through the central light-transmitting region. A spacer is also disclosed. Only one exposure process is required to realize the spacer having a convex-shaped cross section. The process is simple and the manufacturing cost is low. At the same time, a flatness of the convex shoulder of the spacer having a convex-shaped cross section is adjustable, which can satisfy the requirement for manufacturing spacers having different specifications.

    ARRAY SUBSTRATE, LIQUID CRYSTAL DISPLAY PANEL, AND DETECTING METHOD OF LIQUID CRYSTAL DISPLAY PANEL
    26.
    发明申请
    ARRAY SUBSTRATE, LIQUID CRYSTAL DISPLAY PANEL, AND DETECTING METHOD OF LIQUID CRYSTAL DISPLAY PANEL 有权
    阵列基板,液晶显示面板和液晶显示面板的检测方法

    公开(公告)号:US20160180754A1

    公开(公告)日:2016-06-23

    申请号:US14417525

    申请日:2014-12-23

    Abstract: An array substrate is provided, The array substrate comprises a substrate, a common electrode, an insulating layer, a pixel transparent electrode, and a sharing capacitor transparent electrode, wherein a separating area is disposed between the pixel transparent electrode and the sharing capacitor transparent electrode; the common electrode extends to the separating area, and is exposed on the surface of the separating area by at least one groove which is on the insulating layer. Thereby a defectiveness of a product due to an ITO (indium tin oxide) remaining on the surface of the array substrate can easily detected.

    Abstract translation: 提供了阵列基板。阵列基板包括基板,公共电极,绝缘层,像素透明电极和共用电容器透明电极,其中分离区域设置在像素透明电极和共享电容器透明电极之间 ; 公共电极延伸到分离区域,并且通过位于绝缘层上的至少一个凹槽暴露在分离区域的表面上。 由此,能够容易地检测到残留在阵列基板的表面上的ITO(氧化铟锡)所引起的产品的缺陷。

Patent Agency Ranking