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    IMAGE PROCESSING APPARATUS AND METHOD THEREFOR
    21.
    发明申请
    IMAGE PROCESSING APPARATUS AND METHOD THEREFOR 失效
    图像处理装置及其方法

    公开(公告)号：US20070024880A1

    公开(公告)日：2007-02-01

    申请号：US11459552

    申请日：2006-07-24

    申请人： Yoko Sato ,  Shinichi Kato ,  Tsutomu Sakaue ,  Ritsuko Otake ,  Yoichi Kashibuchi

    发明人： Yoko Sato ,  Shinichi Kato ,  Tsutomu Sakaue ,  Ritsuko Otake ,  Yoichi Kashibuchi

    IPC分类号： H04N1/60

    CPC分类号： H04N1/54

    摘要： There is known a technique of inputting the contents of image data and the use purpose of a print material and automatically selecting a combination of color materials appropriate for them. However, it cannot be confirmed before printing whether improvement of image quality commensurate with the cost and labor to input contents information can be obtained. To solve this problem, the ratio of the amount of the color material of a spot color used to that of the color materials of process colors used in input image data is calculated. The recommendation grade of printing using the spot color is determined on the basis of the ratio. Further, display of the recommendation grade is controlled.

    摘要翻译： 已知一种输入图像数据的内容和打印材料的使用目的的技术，并且自动选择适合它们的颜色材料的组合。 然而，在打印之前不能确认是否可以获得与输入内容信息的成本和劳动相对应的图像质量的改善。 为了解决这个问题，计算出与输入图像数据中使用的处理颜色的颜色材料的颜色材料的颜色量的比率。 基于该比例确定使用专色的打印推荐等级。 此外，控制推荐等级的显示。

    Operating circuit with voltage regular circuit having at least a partially depleted soi field effect transistor
    23.
    发明授权
    Operating circuit with voltage regular circuit having at least a partially depleted soi field effect transistor 有权
    具有电压常规电路的工作电路至少具有部分耗尽的场效应晶体管

    公开(公告)号：US06603175B2

    公开(公告)日：2003-08-05

    申请号：US09855693

    申请日：2001-05-16

    申请人： Tadao Kadowaki ,  Akihiko Ebina ,  Masayuki Yamaguchi ,  Yoko Sato

    发明人： Tadao Kadowaki ,  Akihiko Ebina ,  Masayuki Yamaguchi ,  Yoko Sato

    IPC分类号： H01L2701

    CPC分类号： G04G19/06 ,  H01L27/1203 ,  H01L29/7841 ,  H01L2924/0002 ,  H03K19/00384 ,  H01L2924/00

    摘要： A semiconductor integrated circuit comprising: a first power line which supplies a first voltage potential; a second power line which supplies a second voltage potential that is lower than the first voltage potential; a voltage regulator circuit connected electrically to the first and second power lines; a third power line which supplies a constant voltage generated by a voltage regulator circuit, with reference to the first voltage potential; and an operating circuit connected electrically to the first and third power lines. At least one transistor configuring the voltage regulator circuit is a partially-depleted SOI field-effect transistor in which a body region and a source region are connected electrically. At least one transistor configuring the operating circuit is a partially-depleted SOI field-effect transistor in which a body region is in an electrically floating state.

    摘要翻译： 一种半导体集成电路，包括：提供第一电压电位的第一电力线; 第二电源线，其提供低于所述第一电压电位的第二电压电位; 电压调节器电路，其电连接到所述第一和第二电力线; 第三电源线，其相对于所述第一电压电位提供由电压调节器电路产生的恒定电压; 以及与第一和第三电力线电连接的操作电路。 配置电压调节器电路的至少一个晶体管是部分耗尽的SOI场效应晶体管，其中主体区域和源极区域电连接。 构成操作电路的至少一个晶体管是其中体区处于电浮动状态的部分耗尽的SOI场效应晶体管。

    Probing device and system for testing an integrated circuit
    29.
    发明授权
    Probing device and system for testing an integrated circuit 失效
    用于测试集成电路的探测装置和系统

    公开(公告)号：US5331275A

    公开(公告)日：1994-07-19

    申请号：US987959

    申请日：1992-12-09

    申请人： Kazuyuki Ozaki ,  Shinichi Wakana ,  Yoshiro Goto ,  Akio Ito ,  Kazuo Okubo ,  Soichi Hama ,  Akira Fujii ,  Yoko Sato

    发明人： Kazuyuki Ozaki ,  Shinichi Wakana ,  Yoshiro Goto ,  Akio Ito ,  Kazuo Okubo ,  Soichi Hama ,  Akira Fujii ,  Yoko Sato

    IPC分类号： G01R1/067 ,  G01R31/26 ,  G01R1/073 ,  G01R31/02

    CPC分类号： G01Q20/04 ,  B82Y35/00 ,  G01Q60/30 ,  G01R1/067 ,  G01R1/06705 ,  G01R1/06711 ,  G01R1/06727 ,  Y10S977/852

    摘要： A probing device includes a minute probe in which at least an end portion is formed by conductive material, a cantilever having one end to which the probe is attached, and another end fixed to a moving member movable relatively to a sample in each direction of X, Y and Z, a unit for moving the moving member relatively to the sample, a transducing unit for generating information of voltage or current by means of light, a connecting unit having a low electric resistance, for connecting the transducing unit and the end portion of the probe, a detecting unit for detecting a change in a physical amount occurring in the cantilever by a force caused between the probe and the sample by a relative proximity of the moving member to the sample, and a voltage measuring unit for measuring a voltage at a measurement point on the sample, which is determined based on an output of the detecting unit, by way of the transducing unit when the probe is contacted with the measurement point. By the constitution, it is possible to realize a voltage measurement with both an enhanced space resolution and an enhanced time resolution. Also, by using the probing device in an integrated circuit testing apparatus or system, it is possible to realize a stable probing to a minute wiring without increasing an electrical load with respect to the minute wiring and thus contribute to an improvement in the precision of a voltage measurement.

    摘要翻译： 探测装置包括微小探针，其中至少一个端部由导电材料形成，悬臂具有一个连接有探针的端部，另一端固定在可沿着X方向移动相对于样品的移动部件 ，Y和Z，用于相对于样品移动移动部件的单元，用于通过光产生电压或电流的信息的转换单元，具有低电阻的连接单元，用于连接换能单元和端部 的检测单元，用于通过所述移动构件与所述样本的相对接近来检测由所述探针和所述样本之间产生的力而在所述悬臂中产生的物理量的变化的检测单元，以及用于测量所述电极的电压的电压测量单元 在探针与测量点接触时，通过换能单元，基于检测单元的输出确定样本上的测量点。 通过该结构，可以实现具有增强的空间分辨率和增强的时间分辨率的电压测量。 此外，通过在集成电路检测装置或系统中使用探测装置，可以在不增加相对于微小布线的电负载的情况下实现对微小布线的稳定探测，并且因此有助于提高 电压测量。