公开(公告)号：US20160036568A1

公开(公告)日：2016-02-04

申请号：US14552265

申请日：2014-11-24

Applicant: Tektronix, Inc.

Inventor： Mark L. Guenther ,  Kan Tan

IPC: H04L1/20

CPC classification number: H04L1/205 ,  G01R13/0272 ,  G01R13/029 ,  G01R29/26 ,  G01R31/31709 ,  G01R31/3171 ,  G01R31/31711

Abstract: A method for determining jitter and noise of an input signal. The method includes acquiring one or more uncorrelated waveform records by an acquisition unit of a test and measurement instrument, determining a correlated waveform from the acquired waveform(s), dividing the correlated waveform into unit intervals, dividing an uncorrelated waveform into unit intervals, measuring a timing displacement (t1) between the correlated waveform and the uncorrelated waveform for each unit interval to form an apparent-jitter array ([t1]), measuring a voltage displacement (V1) between the correlated waveform and the uncorrelated waveform for reach unit interval to form an apparent-noise array ([V1]), calculating a horizontal shift (ts) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated edge time array ([ts]), and calculating a vertical shift (Vs) between the correlated waveform and the uncorrelated waveform for each unit interval to form a compensated amplitude voltage array ([Vs]).

Abstract translation: 一种用于确定输入信号的抖动和噪声的方法。 该方法包括由测试和测量仪器的获取单元获取一个或多个不相关的波形记录，从获取的波形确定相关波形，将相关波形划分为单位间隔，将不相关波形划分为单位间隔，测量 相关波形和每个单位间隔的不相关波形之间的定时位移（t1），以形成视在抖动阵列（[t1]），测量相关波形与达不到单位间隔的不相关波形之间的电压位移（V1） 为了形成视差噪声阵列（[V1]），计算每个单位间隔的相关波形和不相关波形之间的水平偏移（ts），以形成补偿边缘时间阵列（[ts]），并计算垂直偏移 （Vs），以形成补偿振幅电压阵列（[Vs]）。

公开(公告)号：US20130332101A1

公开(公告)日：2013-12-12

申请号：US13758614

申请日：2013-02-04

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Kalev Sepp ,  Sarah R. Boen

IPC: G06F11/30

CPC classification number: G06F11/30 ,  G06F17/5022 ,  H04B3/46 ,  H04L25/03057

Abstract: A serial data link measurement and simulation system for use on a test and measurement instrument presents on a display device a main menu having elements representing a measurement circuit, a simulation circuit and a transmitter. The main menu includes processing flow lines pointing from the measurement circuit to the transmitter and from the transmitter to the simulation circuit. The main menu includes a source input to the measurement circuit and one or more test points from which waveforms may be obtained. The simulation circuit includes a receiver. The measurement and simulation circuits are defined by a user, and the transmitter is common to both circuits so all aspects of the serial data link system are tied together.

Abstract translation: 用于测试和测量仪器的串行数据链路测量和仿真系统在显示设备上呈现具有表示测量电路，仿真电路和发射机的元件的主菜单。 主菜单包括处理从测量电路指向发射器和从发射机到仿真电路的流线。 主菜单包括测量电路的源输入和可获得波形的一个或多个测试点。 仿真电路包括接收器。 测量和仿真电路由用户定义，并且发射机对于两个电路是共同的，因此串行数据链路系统的所有方面都被捆绑在一起。

公开(公告)号：US20250004015A1

公开(公告)日：2025-01-02

申请号：US18746902

申请日：2024-06-18

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  John J. Pickerd ,  Kan Tan ,  Justin E. Patterson

IPC: G01R13/02

Abstract: A test and measurement system includes a first test and measurement instrument having an input to allow the test and measurement instrument to receive signals from one or more devices under test (DUT), and one or more digitizers to convert the signals from the one or more DUTs to digital waveforms, a machine learning network, and one or more processors to: perform one or more measurements of the digital waveforms, send the one or more measurements of the digital waveforms to the machine learning network as an input, use the machine learning network to translate the one or more measurements to measurements made by a reference instrument to produce one or more translated measurements, the reference instrument being more accurate than the first test and measurement instrument, and determine whether the DUT meets a performance requirement based upon the one or more translated measurements.

公开(公告)号：US20240393918A1

公开(公告)日：2024-11-28

申请号：US18665258

申请日：2024-05-15

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan ,  Wenzheng Sun

IPC: G06F3/0482 ,  G06F3/0484

Abstract: A test and measurement instrument includes one or more ports to allow the test and measurement instrument to receive data from a device under test (DUT), a connection to a machine learning network, a display configured to display a user interface, one or more controls to allow the test and measurement instrument to receive inputs from a user, and one or more processors configured to execute code that causes the one or more processors to: render a menu on the display that displays different types of tensors, receive, from the one or more controls, a user selection that identifies a selected type of tensor, and build the selected type of tensor from the data from the DUT and send the selected type of tensor to the machine learning network. A method of providing a user interface is also disclosed.

公开(公告)号：US20240243779A1

公开(公告)日：2024-07-18

申请号：US18412151

申请日：2024-01-12

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  Keith R. Tinsley ,  John J. Pickerd

IPC: H04B7/04 ,  H04B7/0413

CPC classification number: H04B7/04013 ,  H04B7/0413

Abstract: A method of characterizing a communication channel includes receiving a first signal from a set of transmitters reflected along a reflected channel from each element of a reconfigurable intelligent surface (RIS) set at a nominal angle, receiving a second signal reflected in the reflected channel from each element of the RIS set at an adjusted angle, using the first and second signals to determine a transfer function for a combined channel comprised of a reflected channel and a direct channel, and using the transfer function as an input to a machine learning network to determine optimized settings for the elements of the RIS. A communications system includes a set of transmitters, a reconfigurable intelligent surface (RIS), one or more receivers positioned to receive signals reflected by the RIS from the set of transmitters, and a machine learning system configured to produce optimized angles for elements of the RIS.

公开(公告)号：US20240169210A1

公开(公告)日：2024-05-23

申请号：US18510234

申请日：2023-11-15

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G06N3/09

CPC classification number: G06N3/09

Abstract: A test and measurement instrument includes a port to connect to a device under test (DUT) to receive waveform data, a connection to a machine learning network, and one or more processors configured to: receive one or more inputs about a three-dimensional (3D) tensor image; scale the waveform data to fit within the 3D tensor image; build the 3D tensor image; send the 3D tensor image to the machine learning network; and receive a predictive result from the machine learning network. A method includes receiving waveform data from one or more device under test (DUT), receiving one or more inputs about a three-dimensional (3D) tensor image, scaling the waveform data to fit within the 3D tensor image, building the 3D tensor image, sending the 3D tensor image to a pre-trained machine learning network, and receiving a predictive result from the machine learning network.

公开(公告)号：US20230408558A1

公开(公告)日：2023-12-21

申请号：US18210583

申请日：2023-06-15

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G01R19/25 ,  G06N3/0442 ,  G06N3/045 ,  G06N3/08

CPC classification number: G01R19/2506 ,  G06N3/0442 ,  G06N3/045 ,  G06N3/08

Abstract: A test and measurement instrument has one or more ports configured to receive a signal one or more devices under test (DUT), and one or more processors configured to execute code that causes the one or more processors to: acquire a waveform from the signal, derive a pattern waveform from the waveform, perform linear response extraction on the pattern waveform, present one or more data representations including a data representation of the extracted linear response to a machine learning system, and receive a prediction for a measurement from the machine learning system. A method of performing a measurement on a waveform includes acquiring the waveform at a test and measurement device, deriving a pattern waveform from the waveform, performing linear response extraction on the pattern waveform, presenting one or more data representations including a data representation of the extracted linear response to a machine learning system, and receiving a prediction of the measurement from the machine learning system.

公开(公告)号：US11789051B2

公开(公告)日：2023-10-17

申请号：US17182056

申请日：2021-02-22

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01R23/02 ,  G01R13/02 ,  G01R23/16

CPC classification number: G01R23/02 ,  G01R13/0218 ,  G01R23/16

Abstract: A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.

公开(公告)号：US20230070298A1

公开(公告)日：2023-03-09

申请号：US17894927

申请日：2022-08-24

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01R13/02 ,  G01R23/02

Abstract: A test and measurement device has an input port configured to receive a signal from a device under test, the signal having a symbol rate, one or more analog-to-digital converters to convert the signal to waveform samples at a sampling rate, and one or more processors configured to execute code that, when aliasing is present in the waveform samples, causes the one or more processors to: up-sample the waveform samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the waveform samples using the recovered clock to produce a non-aliased waveform. A method of acquiring a waveform in a test and measurement device includes receiving a signal from a device under test, the signal having a symbol rate, converting the signal to waveform samples at a sampling rate of the test and measurement device, when aliasing is present in the waveform samples, up-sampling the waveform samples to produce up-sampled samples, using the up-sampled samples to produce a real-time waveform, performing clock recovery on the real-time waveform to produce a recovered clock, and resampling the waveform samples using the recovered clock to produce a non-aliased waveform.

公开(公告)号：US20220357237A1

公开(公告)日：2022-11-10

申请号：US17735025

申请日：2022-05-02

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: G01M11/00 ,  G01R27/06

Abstract: A test and measurement device includes one or more ports configured to connect to a device under test (DUT), a time domain reflectometry (TDR) source configured receive a source control signal and to produce an incident signal to be applied to the DUT, one or more analog-to-digital converters (ADC) configured to receive a sample clock and sample the incident signal from the TDR source and a time domain reflection (TDR) signal or a time domain transmission (TDT) signal from the DUT to produce an incident waveform and a TDR/TDT waveform, one or more processors configured to execute code to cause the one or more processors to: control a clock synthesizer to produce the sample clock and the source control signal, and use a period of the TDR source, a period of the sample clock, and the number of samples to determine time locations for samples in the incident waveform and the TDR/TDT waveform, and a display configured to display the incident waveform and the TDR/TDT waveform. A method of sampling a waveform using a real-equivalent-time oscilloscope having a time domain reflectometry source, comprising: controlling a clock synthesizer to produce a sample clock and a source control signal; using a time domain reflectometry (TDR) source to receive the source control signal and to produce an incident signal to be applied to a device under test (DUT); receiving the sample clock at one or more analog-to-digital converters (ADC) and sampling the incident signal from the TDR source and a TDR/TDT signal from the DUT to produce an incident waveform and a TDR/TDT waveform; determining time locations for samples in the incident waveform and the TDR/TDT waveform, using a period of the TDR source, a period of the sample clock, and a number of samples; and displaying the incident waveform and the TDR/TDT waveform.